Advancing Test and Measurement Instrumentation using New Transmission Line Technologies

Size: px
Start display at page:

Download "Advancing Test and Measurement Instrumentation using New Transmission Line Technologies"

Transcription

1 Advancing the High Speed Interconnect Ecosystem Advancing Test and Measurement Instrumentation using New Transmission Line Technologies ATE, Load Boards, Test Sockets, Device Interface, and Probes Jamal S. Izadian, Ph.D. RFCONNEXT, Inc., Patents Pending Materials 1

2 Outline Incremental PMTL/VMTL embedding into ATE A) Existing Test System B) Evolving Test System C) Overhaul of Current ATE Probes, Sockets, Cabling, Connectors N Port Network Analyzer Implications,Includeds Patents Pending Materials 2

3 ATE Systems Components ATE interface, POGO PINS bed/blindmate Load Cards Matching POGO PINS(or Blind Mate Connectors) contact array for ATE interface Device Interface for Test Sockets Probes Handlers/Trays/Mechatronics,Includeds Patents Pending Materials 3

4 Current ATE System Technology,Includeds Patents Pending Materials 4

5 Intermediate Solution,Includeds Patents Pending Materials 5

6 Interfacing to Existing ATE Footprint Using PMTL,Includeds Patents Pending Materials 6

7 Interface To Internal ATE Ports(Alternative to Probe Cards),Includeds Patents Pending Materials 7

8 Implementing Standardized PMTL 2D Connector Array,Includeds Patents Pending Materials 8

9 Standardized Connector Array with Footprint Mapping Allows all parts from ATE vendor, Device Interface (probes, Sockets) vendor, and spatial transformer vendors, all fit together perfectly Disengaged Engaged Third Party Connectorized Test Layers, i.e, embedded passives, active, interface mapped, etc,includeds Patents Pending Materials 9

10 Standardized Connector Array with Footprint Mapping, with uflex PMTL Engaged,Includeds Patents Pending Materials 10

11 Universal Test Socket For Quad Packs (UTS) With embedded PMTL

12 RFConnext s Reconfigurable Device Trying to Match Existing Socket Foot Print Oneto One (gray lines) Match the Boards Pad Foot Print Uses a Minimal Space Low Profile Modular Interface UTS,Includeds Patents Pending Materials 12

13 3D View, matching Foot print and Board Interface and Pad Pattern,Includeds Patents Pending Materials 13

14 Removing Layers, showing easily replaceable contactors,includeds Patents Pending Materials 14

15 Removing Next Layer, showing easily replaceable contactors,includeds Patents Pending Materials 15

16 The PMTL Connectivity, all replaceable parts DUT Individually or group Replaceable Contact mini Cards with patent pending PMTL,Includeds Patents Pending Materials 16

17 DUT removed,includeds Patents Pending Materials 17

18 In Quad Arrangement 1x4 array, shown with QFN DUT,Includeds Patents Pending Materials 18

19 3D View,Includeds Patents Pending Materials 19

20 Advantages of RFC Solution Because of patent pending PMTL, we can bring reference ground for Board pad to the DUT pins, reducing parasitic, and eliminating requirement for impedance re matching Impeccable single or differential signals with controlled impedance Special connector technology, distributes the contact energy to larger areas, thus helping to last longer,includeds Patents Pending Materials 20

21 Advantages of RFC Solution 2 Easy Access to Contactor and easy replacement from top, disposable No need to remove socket from Board for repair/replacement of contactor Ground Contact from side, and bottom, Heat Sinking are from Bottom Very low Foot Print, can increase DI density 64:1 for current performances board,includeds Patents Pending Materials 21

22 Advantages of RFC Solution 3 Modular construction can be very easy access Scaleable to various DUT, and Packages and types Reduces ATE down time We were limited by the Existing Footprint, if we are allowed to modify Performance Board Pad pattern, slightly, we could further improve utility of our GIGA LOW UTS,Includeds Patents Pending Materials 22

23 Increasing DUT Density 16:1 for a single Spot 64:1 for Quad Our Modular Technology allows Increasing Testing Parallelism On Exiting Load Cards

24 Comparing Present Foot Print with a Note that for the same Socket Foot Print, we can provide 4x4 interface or 16:1 For the quad board, this will be 64:1 Promises increased parallel testing 4x4 DI (QFN DUT),Includeds Patents Pending Materials 24

25 3D view of proposed 4x4 Socket Array,Includeds Patents Pending Materials 25

26 Close up of a single DUT,Includeds Patents Pending Materials 26

27 BGA/LGA test Universal Socket With MxN array with possible calibrated reference at DI, using SOLT, LRL, TRL, TOSR, and others Uniform Signaling, DC 65GHz, Power, control, Mixed Signal, High Speed, RF THE FUTURE OF MULTI PORT VNA,Includeds Patents Pending Materials 27

28 UTS with 2D Connection Array, of Single or Differential, or Hybrid of PMTL external to Test Head,Includeds Patents Pending Materials 28

29 Evolution of Integrated ATE and UTS Device Interface Outside ATE ATE Interface Connector Device Interface Inside ATE,Includeds Patents Pending Materials 29

30 The Future of ATE Standardized, Mapable INTERFACE 2D Connector of full bandwidth, TEM PMTL interface with uflex Printed PMTL Cables fan out/fan in,includeds Patents Pending Materials 30

31 The Benefits of New PMTL/VMTL Technologies for ATE s Standardized Footprint Multivendor, Multi user compatibility Controlled Impedance all the way to die pad Uniform Signaling contents, DC Control Digital RF Mixed Signals Single/ Diff Pairs Embedded Components(Third Party Products) L,C,R, Chips, Bias Tee s Superior Electrical Performance No or low cross talk No parasitic, PMTL /VMTL Confined Field Interconnect(CFI) Universal Test Probes Reconfigurable Footprint, Pitches 25u and up Variable force contact Reusable, replaceable, disposable, low cost Independent probes tips with + z Grouped in desired multiples Match a large families of die pad patterns,includeds Patents Pending Materials 31

32 The Benefits of New PMTL/VMTL Technologies for ATE s Flexible PMTL Fan out in, Complete mechanical decoupling, Provide fine and coarse Z movements Equal Delay, Minimum or no Skew Controlled Impedance, Excellent match Low Insertion loss Provides excellent phase linearity compared to traditional coaxial lines and connectors Standardized 2D PMTL Connection Array No more POGO pins Mapping any ATE to any Device footprint Cheaply Readily Cross Platform Utilization Wide bandwidth for the future PMTL /VMTL TEM transmission line technology provided DC 50GHz bandwidth and beyond at no significant cost More connectivity density per area,includeds Patents Pending Materials 32

33 Multi Port Vector Network Analysis Looking Beyond 12 Port Network Analysis to 65GHz The COST of ownership must come down, Only new technology can make this possible

34 Enabling Technologies Lower cost Full Bandwidth Printed uflex PMTL cabling Unmatched Phase Linearity under bending/twisting, Highly repeatable Use as internal VNA semi rigid routing Integrate on internal board signal routing Use as front end VNA test cable Use Low Cost Flat Printed PMTL End Connectors /Launcher(No precision machined needed),includeds Patents Pending Materials 34

35 Future Face of Full Bandwidth Network Analyzer(everything printed),includeds Patents Pending Materials 35

36 Enabling New Probe Technologies Increased Density, while increasing bandwidth and speed Contact Controllability and compliance designed in Re configurability Low cost disposability Field Repairable, all built in,includeds Patents Pending Materials 36

37 Handy Probes with Printed High Speed uflex,includeds Patents Pending Materials 37

38 Example of One to One Replacement for existing wafer Probes, and Any other(super Imposed for Comparison) DC 50GHz,Includeds Patents Pending Materials 38

39 Scalable, reconfigurable, printable matching any footprint, compliance,includeds Patents Pending Materials 39

40 Summary, Improving the ecosystem Testing is already expensive and complex Devices are becoming even more complex Testing must support a new high speed ecosystem Must do more, faster and cheaper over wider bandwidth at speed Must increase automation, parallelism, reduce TTM High Speed Interconnect is at the heart of it,includeds Patents Pending Materials 40

1.4 mm Pitch High Frequency Differential, Coaxial PCB Probe (40 GHz)

1.4 mm Pitch High Frequency Differential, Coaxial PCB Probe (40 GHz) D-COAX, Inc. Differential/Single-ended High Frequency Probe 1.4 mm Pitch High Frequency Differential, Coaxial PCB Probe (40 GHz) The DP1.4 Differential probe by D-COAX is used for high frequency PCB differential

More information

SKTM Socket Series Catalog High Speed Compression Mount

SKTM Socket Series Catalog High Speed Compression Mount SKTM Socket Series Catalog High Speed Compression Mount Ardent Design Support Sockets Overview Ardent Compliant Contact Technology Socket Types BGA/LGA QFN/QFP/MEMS Optical Plunge to Board Lid Types Ordering

More information

Products, Services & Capabilities

Products, Services & Capabilities Products, Services & Capabilities Toll Free: (800) 404-0204 U.S. Only Tel: (952) 229-8200 Fax: (952) 229-8201 email: info@ironwoodelectronics.com Overview Company Overview Founded 1986 Over 5,000 products

More information

RF Probing With Rohde & Schwarz ZNB VNA. PacketMicro, Inc Wyatt Drive, Suite 9, Santa Clara, CA

RF Probing With Rohde & Schwarz ZNB VNA. PacketMicro, Inc Wyatt Drive, Suite 9, Santa Clara, CA RF Probing With Rohde & Schwarz ZNB VNA PacketMicro, Inc. 1900 Wyatt Drive, Suite 9, Santa Clara, CA 95054 www.packetmicro.com Outline Why RF Probing Page 3 4 S-Probe Overview Page 5-8 RF Probing Tips

More information

Over 5,000 products High Performance Adapters and Sockets Many Custom Designs Engineering Electrical and Mechanical ISO9001:2008 Registration

Over 5,000 products High Performance Adapters and Sockets Many Custom Designs Engineering Electrical and Mechanical ISO9001:2008 Registration Overview Company Overview Over 5,000 products High Performance Adapters and Sockets Many Custom Designs Engineering Electrical and Mechanical ISO9001:2008 Registration Adapter Technology Overview Pluggable

More information

Adapter Technologies

Adapter Technologies Adapter Technologies Toll Free: (800) 404-0204 U.S. Only Tel: (952) 229-8200 Fax: (952) 229-8201 email: info@ironwoodelectronics.com Introduction Company Overview Over 5,000 products High Performance Adapters

More information

A simple method to characterize and accurately remove the effects of push-on connectors. O.J. Danzy Application Engineer

A simple method to characterize and accurately remove the effects of push-on connectors. O.J. Danzy Application Engineer A simple method to characterize and accurately remove the effects of push-on connectors. O.J. Danzy Application Engineer Original Authors Robert Schaefer, Keysight Technologies, Inc. Reiner Oppelt, Rosenberger

More information

Functional Testing of 0.3mm pitch Wafer Level Packages to Multi- GHz Speed made possible by Innovative Socket Technology

Functional Testing of 0.3mm pitch Wafer Level Packages to Multi- GHz Speed made possible by Innovative Socket Technology Functional Testing of 0.3mm pitch Wafer Level Packages to Multi- GHz Speed made possible by Innovative Socket Technology Ila Pal - Ironwood Electronics Introduction Today s electronic packages have high

More information

spinner Measurement & Calibration equipment for network analyzers

spinner Measurement & Calibration equipment for network analyzers spinner Measurement & Calibration equipment for network analyzers Edition B 2011 High Frequency Performance Worldwide www.spinner-group.com SPINNER test & calibration equipment for best measurement results

More information

DesignCon 2005 Track 5: Chip and Board Interconnect Design (5-TA2)

DesignCon 2005 Track 5: Chip and Board Interconnect Design (5-TA2) DesignCon 2005 Track 5: Chip and Board Interconnect Design (5-TA2) Connector-Less Probing: Electrical and Mechanical Advantages Authors/Presenters: Brock LaMeres, Agilent Technologies Brent Holcombe, Agilent

More information

Spring Probes and Probe Cards for Wafer-Level Test. Jim Brandes Multitest. A Comparison of Probe Solutions for an RF WLCSP Product

Spring Probes and Probe Cards for Wafer-Level Test. Jim Brandes Multitest. A Comparison of Probe Solutions for an RF WLCSP Product AND, AT THE WAFER LEVEL For many in the industry, performing final test at the wafer level is still a novel idea. While providing some much needed solutions, it also comes with its own set of challenges.

More information

STRADA WHISPER. Backplane Connector DATA COMMUNICATIONS /// STRADA WHISPER BACKPLANE CONNECTOR

STRADA WHISPER. Backplane Connector DATA COMMUNICATIONS /// STRADA WHISPER BACKPLANE CONNECTOR STRADA WHISPER Backplane Connector INTRODUCING STRADA Whisper Backplane Connector Blinding Speeds The STRADA Whisper backplane family was designed with your end customer s need for high-performing, high-bandwidth

More information

3.3 Integrate Reconfigurable Mass Interconnect Solutions. Evaluating Platforms for Performance and Reusability

3.3 Integrate Reconfigurable Mass Interconnect Solutions. Evaluating Platforms for Performance and Reusability 3.3 Integrate Reconfigurable Mass Interconnect Solutions Evaluating Platforms for Performance and Reusability 157 What is a MASS INTERCONNECT? Creates Order From Chaos 158 Mass Interconnect Standardize

More information

TTR500 Series Vector Network Analyzers Demonstration Guide

TTR500 Series Vector Network Analyzers Demonstration Guide xx ZZZ TTR500 Series Vector Network Analyzers Demonstration Guide *P071349301* 071-3493-01 xx ZZZ TTR500 Series Vector Network Analyzers Demonstration Guide Register now! Click the following link to protect

More information

PXI Tsunami in Semiconductor ATE Michael Dewey Geotest Marvin Test Systems Silicon Valley Test Conference

PXI Tsunami in Semiconductor ATE Michael Dewey Geotest Marvin Test Systems Silicon Valley Test Conference PXI Tsunami in Semiconductor ATE Michael Dewey Geotest Marvin Test Systems miked@geotestinc.com Silicon Valley Test Conference 2012 1 Agenda Geotest background Semiconductor market and trends PXI for semiconductor

More information

THE NEXT-GENERATION INTEROPERABILITY STANDARD

THE NEXT-GENERATION INTEROPERABILITY STANDARD THE NEXT-GENERATION INTEROPERABILITY STANDARD ABOUT OPEN VPX TM Open VPX TM is the next-generation interoperability standard for system-level defense and aerospace applications. It is ideal for rugged

More information

Direct Connection of OML Frequency Extenders to Keysight s PNA-C (E836xC) VNA for 1-Path 2-Port S-Parameter Measurements

Direct Connection of OML Frequency Extenders to Keysight s PNA-C (E836xC) VNA for 1-Path 2-Port S-Parameter Measurements Direct Connection of OML Frequency Extenders to Keysight s PNA-C (E836xC) VNA for 1-Path 2-Port S-Parameter Measurements Introduction For full two-port S-parameter measurements to extend PNA-C vector network

More information

Introduction to Wafer Level Burn-In. William R. Mann General Chairman Southwest Test Workshop

Introduction to Wafer Level Burn-In. William R. Mann General Chairman Southwest Test Workshop Introduction to Wafer Level Burn-In William R. Mann General Chairman Southwest Test Workshop Outline Conventional Burn In and Problems Wafer Level BI Driving Factors Initial Die Level BI Technical Challenges

More information

Application Note. Pyramid Probe Cards

Application Note. Pyramid Probe Cards Application Note Pyramid Probe Cards Innovating Test Technologies Pyramid Probe Technology Benefits Design for Test Internal pads, bumps, and arrays High signal integrity Rf and DC on same probe card Small

More information

High performance HBM Known Good Stack Testing

High performance HBM Known Good Stack Testing High performance HBM Known Good Stack Testing FormFactor Teradyne Overview High Bandwidth Memory (HBM) Market and Technology Probing challenges Probe solution Power distribution challenges PDN design Simulation

More information

Magnetic probe holders are fully adjustable for more DUT heights and probe styles

Magnetic probe holders are fully adjustable for more DUT heights and probe styles Data Sheet The W4.0 x L6.5 mini probe station is a manual probe station designed for a versatile and comfortable operation on up to 4.0 wafers or 4.0 x 6.5 printed circuit board assemblies. This mini probe

More information

March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive

March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings

More information

AirMax VSe High Speed Backplane Connector System

AirMax VSe High Speed Backplane Connector System AirMax VSe High Speed Backplane Connector System July 2012 FCI Customer Presentation For External Use Where will AirMax VSe connectors be used & Why? More bandwidth density is being demanded from equipment

More information

What We Do. Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces. Fully automate for: Speed, Accuracy, Ease of Use

What We Do. Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces. Fully automate for: Speed, Accuracy, Ease of Use Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces What We Do Fully automate for: Speed, Accuracy, Ease of Use Calibration Validation To give confidence in test results

More information

I N T E R C O N N E C T A P P L I C A T I O N N O T E. STRADA Whisper 4.5mm Connector Enhanced Backplane and Daughtercard Footprint Routing Guide

I N T E R C O N N E C T A P P L I C A T I O N N O T E. STRADA Whisper 4.5mm Connector Enhanced Backplane and Daughtercard Footprint Routing Guide I N T E R C O N N E C T A P P L I C A T I O N N O T E STRADA Whisper 4.5mm Connector Enhanced Backplane and Daughtercard Footprint Routing Guide Report # 32GC001 01/26/2015 Rev 3.0 STRADA Whisper Connector

More information

Application of second-tier VNA calibration. MTT/IMS May 2010

Application of second-tier VNA calibration. MTT/IMS May 2010 Application of second-tier VNA calibration with Cascade Microtech WinCal XE Craig CagKirkpatrick MTT/IMS May 2010 What is Two Tier Calibration? Two Tier Calibration of a Vector Network Analyzer is a technique

More information

Session 2. Burn-in & Test Socket Workshop Socket Design

Session 2. Burn-in & Test Socket Workshop Socket Design Session 2 Burn-in & Test Socket Workshop 2000 Socket Design BURN-IN & TEST SOCKET WORKSHOP COPYRIGHT NOTICE The papers in this publication comprise the proceedings of the 2000 BiTS Workshop. They reflect

More information

Agilent Upgrade Guide for the 8510 Vector Network Analyzer Product Note

Agilent Upgrade Guide for the 8510 Vector Network Analyzer Product Note Agilent Upgrade Guide for the 8510 Vector Network Analyzer Product Note Discontinued Product Information For Support Reference Only Information herein, may refer to products/services no longer supported.

More information

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape Edition April 2017 Semiconductor technology & processing 3D systems-on-chip A clever partitioning of circuits to improve area, cost, power and performance. In recent years, the technology of 3D integration

More information

GT Micro D High Speed Characterization Report For Differential Data Applications. Micro-D High Speed Characterization Report

GT Micro D High Speed Characterization Report For Differential Data Applications. Micro-D High Speed Characterization Report GT-14-19 Micro D For Differential Data Applications GMR7580-9S1BXX PCB Mount MWDM2L-9P-XXX-XX Cable Mount Revision History Rev Date Approved Description A 4/10/2014 C. Parsons/D. Armani Initial Release

More information

Curve Tracing Systems

Curve Tracing Systems Curve Tracing Systems Models Available MultiTrace: The most flexible solution for devices up to 625 pins, capable of any of the applications described here. Comes with a PGA-625 fixture MegaTrace: A larger

More information

Decoupling Solutions

Decoupling Solutions Decoupling Solutions Michael Randall, Bill Sloka, Mark Laps, Garry Renner, John Prymak, Peter Blais, Aziz Tajuddin KEMET Electronics Corporation, 201 Fairview Street Extension, Fountain Inn, SC 29644 Phone:

More information

100BASE-T1 EMC Test Specification for ESD suppression devices

100BASE-T1 EMC Test Specification for ESD suppression devices IEEE 100BASE-T1 EMC Test Specification for ESD suppression devices Version 1.0 Author & Company Dr. Bernd Körber, FTZ Zwickau Title 100BASE-T1 EMC Test Specification for ESD suppression devices Version

More information

Agilent Technologies S-Parameter and TDR Impedance Measurement Solution Summary

Agilent Technologies S-Parameter and TDR Impedance Measurement Solution Summary Agilent Technologies S-Parameter and TDR Impedance Measurement Solution Summary Built-in S-parameter testing Easy and accurate transmission channel/media characterization Transmission lines for high speed

More information

Packaging Technology for Image-Processing LSI

Packaging Technology for Image-Processing LSI Packaging Technology for Image-Processing LSI Yoshiyuki Yoneda Kouichi Nakamura The main function of a semiconductor package is to reliably transmit electric signals from minute electrode pads formed on

More information

Cabling Infrastructure

Cabling Infrastructure Introduction Ethernet Banking on Structured Cabling Technology Drivers Classification of Cables Fibre-optic cable Cables in building Cabling Infrastructure Cabling systems address the networking requirements

More information

Tale of a Differential Pair Measurement

Tale of a Differential Pair Measurement Tale of a Differential Pair Measurement Gustavo J. Blando, (Oracle Corporation) Eben Kunz (Oracle Corporation), Istvan Novak (Oracle Corporation) 1 SPEAKER Gustavo J. Blando Senior Principal Engineer,

More information

EXAMAX HIGH SPEED BACKPLANE CONNECTOR SYSTEM Innovative pinless connector system delivering superior electrical performance at speeds 25 to 56Gb/s

EXAMAX HIGH SPEED BACKPLANE CONNECTOR SYSTEM Innovative pinless connector system delivering superior electrical performance at speeds 25 to 56Gb/s EXAMAX HIGH SPEED BACKPLANE Innovative pinless connector system delivering superior electrical performance at speeds 5 to 5Gb/s SUPPORTS MANY INDUSTRY STANDARD SPECIFICATIONS; MIGRATION PATH TO HIGHER

More information

N Series Connectors Medium sized connector for high-voltage applications Suited for critical applications and environments Performance to 11 GHz (commercial) and 18 GHz (hi frequency) Intermateable with

More information

Standardizing WSP Wafer Socket Pogo Pin Probe Cards

Standardizing WSP Wafer Socket Pogo Pin Probe Cards John Hite Texas Instruments Standardizing WSP Wafer Socket Pogo Pin Probe Cards June 6 to 9, 2010 San Diego, CA USA Agenda Introduction WLCSP and WSP Probing WSP Standardization Standard Alignment / Mounting

More information

AXIe : AdvancedTCA Extensions for Instrumentation and Test. Autotestcon 2016

AXIe : AdvancedTCA Extensions for Instrumentation and Test. Autotestcon 2016 AXIe : AdvancedTCA Extensions for Instrumentation and Test Autotestcon 2016 Copyright 2016 AXIe Consortium, Inc. * AdvancedTCA is a registered trademark of PICMG. AXIe is a registered trademark of the

More information

56/80 Gb/s PCB transmission lines. and. 56 Gb/s End-launch GPPO connector

56/80 Gb/s PCB transmission lines. and. 56 Gb/s End-launch GPPO connector White paper: WP141-1 56/8 b/s PCB transmission lines and 56 b/s End-launch PPO connector ----- Electrical Interconnection basic technology development ----- Takada RF Labs, Inc. 214/1/2 E-mail: contact@takadarf.com

More information

Agenda TDR Measurements Using Real World Products

Agenda TDR Measurements Using Real World Products Agenda TDR Measurements Using Real World Products The Case for using both TDR and S-parameters Device Package Analysis - Measure Impedance -C-self Characterizing Device Evaluation Test board Measure Differential

More information

Achieving GHz Speed in Socketed BGA Devices

Achieving GHz Speed in Socketed BGA Devices IC INTERCONNECT TOPIC #102 Technical Information from Ironwood Electronics Achieving GHz Speed in Socketed BGA Devices Ila Pal Director of R&D Ironwood Electronics Background For many products designed

More information

ExaMAX High Speed Backplane Connector System Innovative pinless connector system delivering superior electrical performance at speeds 25Gb/s to 56Gb/s

ExaMAX High Speed Backplane Connector System Innovative pinless connector system delivering superior electrical performance at speeds 25Gb/s to 56Gb/s Innovative pinless connector system delivering superior electrical performance at speeds 5Gb/s to 5Gb/s SUPPORTS MANY INDUSTRY STANDARD SPECIFICATIONS; MIGRATION PATH TO HIGHER BANDWIDTH APPLICATIONS ExaMAX

More information

Agilent PNA Series Microwave Network Analyzers

Agilent PNA Series Microwave Network Analyzers Agilent PNA Series Microwave Network Analyzers Configuration Guide PNA-L N5230A PNA-L N5230A PNA-X N5242A PNA E8362B PNA E8363B PNA E8364B PNA E8361A PNA N5250A 300 khz to 6, 13.5, or 20 GHz 10 MHz to

More information

White Paper. Lightweight Connectors for Demanding Applications. June by Brad Taras Product Manager Cinch Connectivity Solutions

White Paper. Lightweight Connectors for Demanding Applications. June by Brad Taras Product Manager Cinch Connectivity Solutions White Paper Lightweight Connectors for Demanding Applications June 2018 by Brad Taras Product Manager Cinch Connectivity Solutions Phenomenal levels of integration are being achieved in modern electronics

More information

Wafer Probe card solutions

Wafer Probe card solutions Wafer Probe card solutions Innovative Solutions to Test Chips in the Semiconductor Industry Our long term experience in the electronic industry and our strong developing and process teams are inspired

More information

Keysight Technologies PNA Series Microwave Network Analyzers

Keysight Technologies PNA Series Microwave Network Analyzers Keysight Technologies PNA Series Microwave Network Analyzers Configuration Guide PNA-L N5230A PNA-L N5230A PNA-X N5242A PNA E8362B PNA E8363B PNA E8364B PNA E8361A PNA N5250A 300 khz to 6, 13.5, or 20

More information

PXI Versus Industrial Computers

PXI Versus Industrial Computers PXI Versus Industrial Computers Contents What is PXI?... 3 PXI Systems Alliance... 3 PCI... 3 Physical Features... 5 Electrical Features... 6 Integrated, Expandable Systems... 6 What are Industrial PCs?...

More information

SMP connectors. the easy connection. Products overview. Applications

SMP connectors. the easy connection. Products overview. Applications Products overview PCB mount SMD mount plug and Centre pin in SMD, BGA or throughhole configurations Surface mount technology plug and Centre pin in SMD, BGA or throughhole configurations Bulkhead mount

More information

Socket Technologies

Socket Technologies Socket Technologies Toll Free: (800) 404-0204 U.S. Only Tel: (952) 229-8200 Fax: (952) 229-8201 email: info@ironwoodelectronics.com Introduction Company Overview Over 5,000 products High Performance Adapters

More information

Introducing MULTIGIG RT 2-R. Ruggedized Connectors for VPX Applications

Introducing MULTIGIG RT 2-R. Ruggedized Connectors for VPX Applications Introducing for VPX Applications High Speed Copper Cables associated VPX SOLUTIONS MEZALOK Mezzanine (Compliant to VITA 61) Utilizes the proven, reliable MIL-55302 Mini-Box contact interface, with four

More information

Gavin Fisher Cascade Microtech Europe

Gavin Fisher Cascade Microtech Europe Gavin Fisher Cascade Microtech Europe Device measurement at it s simplest requires the following steps Probe and accessory physical Set-up for calibration Calibration instrumentation setting preparation

More information

The Advanced Cantilever Probe Card with High Bandwidth (>3GHz) and Experimental Result

The Advanced Cantilever Probe Card with High Bandwidth (>3GHz) and Experimental Result Morgan Ku, Phil Hsieh, Jason Ho, Sobers Chang, Seenew Lai, Dick Ho MJC Probe Inc. The Advanced Cantilever Probe Card with High Bandwidth (>3GHz) and Experimental Result June 8-11, 8 2008 San Diego, CA

More information

HIGH SPEED INPUT/OUTPUT SOLUTIONS QUICK REFERENCE GUIDE

HIGH SPEED INPUT/OUTPUT SOLUTIONS QUICK REFERENCE GUIDE HIGH SPEED INPUT/OUTPUT SOLUTIONS QUICK REFERENCE GUIDE The pluggable I/O interface offers significant advantages as a high speed I/O interconnect. With a standard equipment I/O interface and the flexibility

More information

Configuring a Precision System for On-Wafer Capacitance

Configuring a Precision System for On-Wafer Capacitance Application Note Innovating Test Technologies Configuring a Precision System for On-Wafer Capacitance Development of new aggressively scaled MOS processes and devices depends on high accuracy CV measurements.

More information

Agilent PNA Series Microwave Network Analyzers

Agilent PNA Series Microwave Network Analyzers Agilent PNA Series Microwave Network Analyzers Configuration Guide PNA-L N5230A PNA-L N5230A PNA E8362B PNA E8363B PNA E8364B PNA E8361A PNA N5250A 300 khz to 6, 13.5, or 20 GHz 10 MHz to 20, 40, or 50

More information

Deembedding of SiGe multifinger HBTs to. 110 GHz - problems and solutions. Lab. RF Modeling

Deembedding of SiGe multifinger HBTs to. 110 GHz - problems and solutions. Lab. RF Modeling Deembedding of SiGe multifinger HBTs to 110 GHz - problems and solutions 1 overview - measurement setup - ISS vs on wafer calibration - open - short deembedding - results small transistor - ISS to on wafer

More information

Advances in Measurement Based Transient Simulation

Advances in Measurement Based Transient Simulation Time Domain Simulation in ADS, Slide - 1 Advances in Measurement Based Transient Simulation Presented by GigaTest Labs Gary Otonari and Orlando Bell March, 2008 1 Time Domain Simulation in ADS, Slide -

More information

Test and Measurement Challenges for 3D IC Development. R. Robertazzi IBM Research

Test and Measurement Challenges for 3D IC Development. R. Robertazzi IBM Research Test and Measurement Challenges for 3D IC Development R. Robertazzi IBM Research PFA Bill Price. Pete Sorce. John Ott. David Abraham. Pavan Samudrala Digital Test Kevin Stawaisz. TEL P12 Prober Glen Lansman,

More information

GMS Interconnect Series Product Information

GMS Interconnect Series Product Information GMS Interconnect Series Product Information Microwave Products Product Features: Frequency range: DC up to 23 GHz, Force to engage/disengage: 10 ounces min./2.5 pounds max., Male connectors have full self-centering

More information

June 6 to 9, 2010 San Diego, CA Probe Cards with Modular Integrated Switching Matrices

June 6 to 9, 2010 San Diego, CA Probe Cards with Modular Integrated Switching Matrices June 6 to 9, 2010 San Diego, CA Probe Cards with Modular Integrated Switching Matrices Authors: Evan Grund Jay Thomas Agenda Review of Traditional Scribeline Parametric IV and CV Probe Card Requirements

More information

Wafer Probe card solutions

Wafer Probe card solutions Wafer Probe card solutions Innovative Solutions to Test Chips in the Semiconductor Industry Our long term experience in the electronic industry and our strong developing and process teams are inspired

More information

Models 1417 and 1437 User s Manual. High-Speed Photodetector Modules

Models 1417 and 1437 User s Manual. High-Speed Photodetector Modules Models 1417 and 1437 User s Manual High-Speed Photodetector Modules Handling Precautions The detector is sensitive to electrostatic discharges and could be permanently damaged if subjected even to small

More information

Packaging Technology of the SX-9

Packaging Technology of the SX-9 UMEZAWA Kazuhiko, HAMAGUCHI Hiroyuki, TAKEDA Tsutomu HOSAKA Tadao, NATORI Masaki, NAGATA Tetsuya Abstract This paper is intended to outline the packaging technology used with the SX-9. With the aim of

More information

Brief Background in Fiber Optics

Brief Background in Fiber Optics The Future of Photonics in Upcoming Processors ECE 4750 Fall 08 Brief Background in Fiber Optics Light can travel down an optical fiber if it is completely confined Determined by Snells Law Various modes

More information

Lecture 10. Vector Network Analyzers and Signal Flow Graphs

Lecture 10. Vector Network Analyzers and Signal Flow Graphs HP8510 Lecture 10 Vector Network Analyzers and Signal Flow Graphs Sections: 6.7 and 6.11 Homework: From Section 6.13 Exercises: 4, 5, 6, 7, 9, 10, 22 Acknowledgement: Some diagrams and photos are from

More information

Ideal for a wide range of applications such as wafer test or PCB test for mm-wave, Microwave, RF or Automotive applications

Ideal for a wide range of applications such as wafer test or PCB test for mm-wave, Microwave, RF or Automotive applications Data Sheet The W2.5 x L6.5 mini probe station is a manual probe station designed for a versatile and comfortable operation on up to 2.5 wafers or 2.5 x 6.5 printed circuit board assemblies. This mini probe

More information

Preconfigured Optical Setups for the General Purpose Optical Bench for Frontier FT-IR Spectrometers. FT-IR Spectroscopy.

Preconfigured Optical Setups for the General Purpose Optical Bench for Frontier FT-IR Spectrometers. FT-IR Spectroscopy. P r o d u c t N o t e FT-IR Spectroscopy Frontier FT-IR with ATR on sampling compartment, Spotlight 400 (far left) and GPOB with MCT detector (far right). Preconfigured Optical Setups for the General Purpose

More information

Automotive Electronics Council Component Technical Committee

Automotive Electronics Council Component Technical Committee ATTACHMENT 11 CHARGED DEVICE MODEL (CDM) ELECTROSTATIC DISCHARGE TEST Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive

More information

TEST SOLUTIONS FOR ARRAY PERIPHERAL WLCSP

TEST SOLUTIONS FOR ARRAY PERIPHERAL WLCSP TEST SOLUTIONS FOR SEMICONDUCTOR ARRAY PERIPHERAL WLCSP SMITHS CONNECTORS Smiths Connectors is a leading supplier of application-specific, highreliability electrical interconnect solutions from highly

More information

SAS-2 Zero-Length Test Load Characterization (07-013r7) Barry Olawsky Hewlett Packard (8/2/2007)

SAS-2 Zero-Length Test Load Characterization (07-013r7) Barry Olawsky Hewlett Packard (8/2/2007) SAS-2 Zero-Length Test Load Characterization (07-013r7) Barry Olawsky Hewlett Packard (8/2/2007) 07-013r7 SAS-2 Zero-Length Test Load Characterization 1 Zero-Length Test Load Provides ideal connection

More information

Additional Slides for Lecture 17. EE 271 Lecture 17

Additional Slides for Lecture 17. EE 271 Lecture 17 Additional Slides for Lecture 17 Advantages/Disadvantages of Wire Bonding Pros Cost: cheapest packages use wire bonding Allows ready access to front side of die for probing Cons Relatively high inductance

More information

Hybrid Couplers 3dB, 90º Type PC2025A2100AT00

Hybrid Couplers 3dB, 90º Type PC2025A2100AT00 GENERAL DESCRIPTION The PC2025A2100AT00 is a RoHS compliant low profile wideband 3dB hybrid coupler which can support mobile applications, including PCS and DCS applications. The power coupler series of

More information

LQFP. Thermal Resistance. Body Size (mm) Pkg. 32 ld 7 x 7 5 x ld 7 x 7 5 x ld 14 x 14 8 x ld 20 x x 8.5

LQFP. Thermal Resistance. Body Size (mm) Pkg. 32 ld 7 x 7 5 x ld 7 x 7 5 x ld 14 x 14 8 x ld 20 x x 8.5 LQFP Low Profile Quad Flat Pack Packages (LQFP) Amkor offers a broad line of LQFP IC packages designed to provide the same great benefits as MQFP packaging with a 1.4 mm body thickness. These packages

More information

Agilent InfiniiMax III probing system

Agilent InfiniiMax III probing system Agilent InfiniiMax III probing system Data Sheet World s highest speed and highest performing probe system Full 30 GHz bandwidth to the probe tip Industry s lowest probe and scope system noise Industry

More information

Revolutionary High Performance Interconnect Which Maximizes Signal Density

Revolutionary High Performance Interconnect Which Maximizes Signal Density Revolutionary High Performance Interconnect Which Maximizes Signal Density Tom Cohen and Gautam Patel Teradyne Connection Systems 44 Simon St. Nashua, New Hampshire 03060 Phone: 603-791-3383, 603-791-3164

More information

Katana RFx: A New Technology for Testing High Speed RF Applications Within TI

Katana RFx: A New Technology for Testing High Speed RF Applications Within TI Katana RFx: A New Technology for Testing High Speed RF Applications Within TI Compan Logo Probe Test Solutions Manager Overview Introduction Objectives Procedures Results Summary Follow-On Work 2 Introduction

More information

DRAM Memory Modules Overview & Future Outlook. Bill Gervasi Vice President, DRAM Technology SimpleTech

DRAM Memory Modules Overview & Future Outlook. Bill Gervasi Vice President, DRAM Technology SimpleTech DRAM Memory Modules Overview & Future Outlook Bill Gervasi Vice President, DRAM Technology SimpleTech bilge@simpletech.com Many Applications, Many Configurations 2 Module Configurations DDR1 DDR2 Registered

More information

Multi-Die Packaging How Ready Are We?

Multi-Die Packaging How Ready Are We? Multi-Die Packaging How Ready Are We? Rich Rice ASE Group April 23 rd, 2015 Agenda ASE Brief Integration Drivers Multi-Chip Packaging 2.5D / 3D / SiP / SiM Design / Co-Design Challenges: an OSAT Perspective

More information

Novel Precision Probe Array for Wafer Level Final Test of WLCSP Jathan Edwards

Novel Precision Probe Array for Wafer Level Final Test of WLCSP Jathan Edwards Novel Precision Probe Array for Wafer Level Final Test of WLCSP Johnstech International Presentation Outline Introduction to IQtouch Micro Final Test Probe Arrays for 300 500 micron pitch WLCSP Compare/contrast

More information

z-quad SMALL FORM-FACTOR PLUGGABLE PLUS (zqsfp+ OR QSFP28/56) INTERCONNECT SYSTEM

z-quad SMALL FORM-FACTOR PLUGGABLE PLUS (zqsfp+ OR QSFP28/56) INTERCONNECT SYSTEM z-quad SMALL FORM-FACTOR PLUGGABLE PLUS (zqsfp+ OR QSFP28/56) INTERCONNECT SYSTEM Quick Reference Guide te.com/products/qsfp Introducing zqsfp+ Interconnect System TE Connectivity s (TE) zqsfp+ interconnects

More information

Board Design Guidelines for PCI Express Architecture

Board Design Guidelines for PCI Express Architecture Board Design Guidelines for PCI Express Architecture Cliff Lee Staff Engineer Intel Corporation Member, PCI Express Electrical and Card WGs The facts, techniques and applications presented by the following

More information

Kee Sup Kim Samsung Electronics. ramework for Massively Parallel esting at Wafer and Package Test

Kee Sup Kim Samsung Electronics. ramework for Massively Parallel esting at Wafer and Package Test Kee Sup Kim Samsung Electronics ramework for Massively Parallel esting at Wafer and Package Test Key Message Massively parallel testing Possible Positive Return DFT Can be exciting 3 Outline Introduction

More information

Agilent. E5071C Network Analyzer 9 khz to 4.5/6.5/8.5 GHz 100 khz to 4.5/6.5/8.5 GHz (with bias tees) 300 khz to 14/20 GHz (with bias tees)

Agilent. E5071C Network Analyzer 9 khz to 4.5/6.5/8.5 GHz 100 khz to 4.5/6.5/8.5 GHz (with bias tees) 300 khz to 14/20 GHz (with bias tees) Agilent E5071C Network Analyzer 9 khz to 4.5/6.5/8.5 GHz 100 khz to 4.5/6.5/8.5 GHz (with bias tees) 300 khz to 14/20 GHz (with bias tees) E5092A Configurable Multiport Test Set Configuration Guide This

More information

3.5mm VNA Calibration Kits

3.5mm VNA Calibration Kits 3.5mm VNA Calibration Kits DATA SHEET / 2Z-059 Models: 8050CK10 Fixed Load Kit 8050CK11 Fixed Load Kit Plus Adapters 8050CK20 Sliding Load Kit - Basic 8050CK21 Sliding Load Kit Plus Adapters 8050CK30 TRL

More information

2.92mm VNA Calibration Kits

2.92mm VNA Calibration Kits 2.92mm VNA Calibration Kits DATA SHEET / 2Z-058B Models: 8770CK10 Fixed Load Kit 8770CK11 Fixed Load Kit Plus Adapters 8770CK20 Sliding Load Kit 8770CK21 Sliding Load Kit Plus Adapters 8770CK30 TRL Kit

More information

Prisma II Platform. Optoelectronics

Prisma II Platform. Optoelectronics Optoelectronics Prisma II Platform Description In optical transmission systems, the network platform forms the foundation of the product family. The Prisma II platform provides network operators with the

More information

Keysight Technologies On-Wafer Testing of Opto-Electronic Components Using the Lightwave Component Analyzers. Application Note

Keysight Technologies On-Wafer Testing of Opto-Electronic Components Using the Lightwave Component Analyzers. Application Note Keysight Technologies On-Wafer Testing of Opto-Electronic Components Using the Lightwave Component Analyzers Application Note Introduction When measurements of optoelectronic components are performed on

More information

Understanding 3M Ultra Hard Metric (UHM) Connectors

Understanding 3M Ultra Hard Metric (UHM) Connectors 3M Electronic Solutions Division 3MUHMWEBID_100809 Understanding 3M Ultra Hard Metric (UHM) Connectors Enabling performance of next generation 2 mm Hard Metric systems 3M Electronic Solutions Division

More information

Baluns and 90 Degree Hybrid Couplers. Directional Couplers. Attenuators, Resistors and Terminations. Combiners/Dividers

Baluns and 90 Degree Hybrid Couplers. Directional Couplers. Attenuators, Resistors and Terminations. Combiners/Dividers Baluns and 90 Degree Hybrid Couplers Directional Couplers Combiners/Dividers Attenuators, Resistors and Terminations RF and Microwave Passive Components for Military, Medical, Industrial and Wireless Applications

More information

Calibration kit coefficients -the saga continues

Calibration kit coefficients -the saga continues Calibration kit coefficients -the saga continues 22nd ANAMET Meeting 9 th September 2004 Jürg Rüfenacht Swiss Federal Office of Metrology and Accreditation metas Lindenweg 50, CH-3003 Bern-Wabern, Switzerland

More information

Package (1C) Young Won Lim 3/20/13

Package (1C) Young Won Lim 3/20/13 Copyright (c) 2011-2013 Young W. Lim. Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published

More information

RF Characterization Report

RF Characterization Report RF058 Series Cable Assemblies RF058-01BJ1-01BJ1-0150 RF058-01SB1-01SB1-0150 RF058-01SP1-01SP1-0150 Description: RF Cable Assembly, 50Ohm, RG058 Coaxial Cable Samtec Inc. WWW.SAMTEC.COM Phone: 812-944-6733

More information

# 6. Choosing the Right Laser Diode Mount for Your Application

# 6. Choosing the Right Laser Diode Mount for Your Application # 6 Choosing the Right Laser Diode Mount for Your Application Introduction The multitude of laser diode packages available today make selecting the correct mount for laboratory, development, or production

More information

Open NAND Flash Interface Specification: NAND Connector

Open NAND Flash Interface Specification: NAND Connector Open NAND Flash Interface Specification: NAND Connector Connector Revision 1.0 23-April-2008 Hynix Semiconductor Intel Corporation Micron Technology, Inc. Phison Electronics Corp. Sony Corporation Spansion

More information

Microprobing with the Fine-Pitch Active Probe

Microprobing with the Fine-Pitch Active Probe Microprobing with the Fine-Pitch Active Probe A guide to using the Fine-Pitch Active Probe and the Fine-Pitch Dual Positioner for applications where handheld probes are not suitable. This application note

More information

Parametric test systems

Parametric test systems Semiconductor industry s most cost-effective fully automatic parametric testers Optimized for use in environments with a broad mix of products, where high flexibility and system speed are critical Choice

More information

Package (1C) Young Won Lim 3/13/13

Package (1C) Young Won Lim 3/13/13 Copyright (c) 2011-2013 Young W. Lim. Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published

More information