Docking and Interfacing 2014

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Isaac Dennis
6 years ago
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1 Docking and Interfacing 2014

2 TEST HEAD DOCKING SIGNAL TOWER ACCESSORIES Standard Signal Tower TEST HEAD MODEL CorGlide CorGlide CorGlide CoreGlide TSE 2CAM 4CAM LW QCAM TriCore Teradyne MicroFLEX - IntegraFLEX - UltraFLEX - J750 - Catalyst - - Eagletest Nextest Magnum PV Magnum SV Magnum SV LTX Fusion LX - - Fusion MX - - Fusion EX - - Fusion CX - - Credence D Sapphire D ASL ASL Verigy large Small CTH - - MuTest M21S - - Advantest T Manual Test Adaptor CoreGlide docking is available for the Following peripheral equipment :- Package Handlers Multitest 9308, 9918,9928 Multitest 9510 Rasco SO1000, 2000, 3000 Northwave EM1 Synax 141,1701, 1211, 3100 Delta Edge, FLEX, RFS Seiko NS6000, 7000, 8000 MCT, Advantest, Yokogawa Wafer Probers TELP8, TELP12 Accretech UF200/APM90 Accretech UF2000 Accretech UF3000 Electroglas EG2001 Electroglas EG4090 Electroglas EG6000 Semics OPUSII Semics OPUSIII This list is not exhaustive and we have specific solutions for many other test systems including Agilent, Keithley, Focussed Test, National Instruments, Marvin Test and others. Docking and Signal Tower Availability

CoreGlide Test Head Docking Alignment and Hard Docking for interface with Probers and Handlers Rigid Link Design with linear or cylindrical cams. Pre-guide bushing and fine alignment pins.

3 CoreGlide Test Head Docking Alignment and Hard Docking for interface with Probers and Handlers Rigid Link Design with linear or cylindrical cams. Pre-guide bushing and fine alignment pins. Scalable solution for all test head sizes. Fast Installation AND repeatable operation. Low maintenance Compatible with existing docking standards Ask TSE for details on specific test heads Test Head Docking CoreGlide Docking Types 2CAM Standard Solution 4CAM Heavy Duty Solution LW Light Weight Solution (no cams on Test Head) QCAM Custom CAM layout

CoreGlide Handler Docking Single and Multisite

Adjustable Docking Height Suitable for Pick &

Pre-guide pins for protection of equipment Easy

maintenance Compatible with existing docking

4 CoreGlide Handler Docking Single and Multisite solutions for Packaged Device Handlers Fixed OR Adjustable Docking Height Suitable for Pick & Place AND Gravity Feed handler. Pre-guide pins for protection of equipment Easy change from single to multi site centering Low maintenance Compatible with existing docking standards Ask TSE for details on specific handler interfaces Handler Docking

CoreGlide Prober Docking Easy to operate

adapted to ANY prober Robust Pre-guide pins

can be integrated Up to 4kN clamping force

docking standards Ask TSE for details on

5 CoreGlide Prober Docking Easy to operate docking with repeatable alignment Can be adapted to ANY prober Robust Pre-guide pins for equipment protection Loadboard pull down can be integrated Up to 4kN clamping force Low maintenance Compatible with existing docking standards Ask TSE for details on solutions for specific prober models Wafer Prober Docking

Teradyne FLEX ALL configurations from 360 I/O to 1920 I/O.

required. 3GHz or 10GHz Bandwidth. Individual Segments Available Verigy 93000 Up to 8 Segments.

to suit any application Industry standard Signal Towers for Teradyne, Eagle, Verigy, 3 Ring Triad/Triton.

6 Teradyne FLEX ALL configurations from 360 I/O to 1920 I/O. Individual Pin Segments Available TriCore Modular by TSE Up to 24 Segments (160 probes each) configured as required. 3GHz or 10GHz Bandwidth. Individual Segments Available Verigy Up to 8 Segments. Small, Large or Compact Test Head Individual Segments Available Electrical Interfaces Standard or Custom to suit any application Industry standard Signal Towers for Teradyne, Eagle, Verigy, 3 Ring Triad/Triton. Test Head Adaptors translate from test head pin array to another. Eg V93000 to Teradyne FLEX Custom test head interface design Signal Towers Teradyne J750 Eagletest E364

7 Manual Test Adaptor for FLEX, Catalyst Signal Tower Clamshell For top load probers V93000, FLEX, TriCore Manual Test lock Ring for TriCore Verigy Adjustable Docking Pins Prober Docking Plates Handler Docking Plates Teradyne FLEX Load board Pull down for Prober OR Handler Interfacing Accessories

TriCore SIGNAL TOWER The leading interface product from TSE is the TriCore modular signal tower system that can be adapted to a wide ranging combination of test heads, wafer probers and hand test

8 TriCore SIGNAL TOWER The leading interface product from TSE is the TriCore modular signal tower system that can be adapted to a wide ranging combination of test heads, wafer probers and hand test equipment. PRODUCT OVERVIEW Fully Configurable with up to 24 segments in radial pattern For use with probe cards from 190mm to 280mm diameter Standard configuration of 160 pins per segment Segments designed as general purpose or 50 Ohm controlled impedance Configure only the segments you need Technical Information GENERAL PURPOSE (GP) SEGMENT Bandwidth 3GHz, -1dB Current rating per pin 7A Max Number Spring probes per segment 160 Pin spring force per segment (160 probes) 30lbs/135N HIGH BANDWIDTH (HB) MODULE Characteristic impedance 50 Ohm +/- 5% Bandwidth 10GHz, -3dB Current rating per pin 7A Segments are available in general purpose (GP) or controlled impedance high performance (HB) configurations. The flexibility of the system design allows us to provide tailor made segments to meet your requirements such as the use of RF connectors or a specific type of probe and pin spacing. By selecting the largest tower frame the interface can be upgraded at any time by adding more segments as your test requirements grow. Electrical performance and characterisation data is available on request from TSE. Max Number Spring probes per segment 160 Pin spring force per segment (160 probes) 30lbs/135N Featured Product - TriCore

9 Signal Tower Clamshell For wafer probers not equipped with automatic probe card loaders TSE offers an adaptable clamshell solution for top loading probe card interfaces. Signal towers are safely supported in a hinge assembly to allow easy changeover of probe card. FEATURES : Designed to fit 200mm and 300mm wafer probers De-coupled lift and rotate motion 12mm vertical lift compatible with thicker probe card stiffeners Folding locking handle Probe card tray and signal tower carrier can be adapted to any signal tower from 150mm to 300mm AVAILABILITY Teradyne FLEX Teradyne Catalyst Teradyne J750 Teradyne E364 Verigy 12 WPI Verigy 9.5 WPI TSE Tri-Core TSE E364 Advantest T2000 Featured Product Prober Clamshell

10 CoreGlide Telescopic Handler Docking Designed for use with packaged device test handlers the CoreGlide linear variable height docking is the ultimate solution to replace docking plate spacers to accommodate multiple socket height interfaces. Features For use with horizontal (eg Seiko Epson as shown) or vertical (eg Multitest) plane handlers. By varying the height of docking bars the test head load board can be positioned at varying distances from handler back plane to accommodate multiple socket types and docking heights. 4 Point synchronised docking bars can be adjusted 32mm in Z-Axis. Suitable for fixed (eg Teradyne) and floating (eg Advantest) test head DUT interfaces. Linear telescopic adjustment with +/- 0.10mm Z-Axis and +/- 0.02mm X and Y Axis positioning accuracy. Options Linear scale or digital readout Manual or motorised adjustment Pre-mounted Handler Interface Board Featured Product Telescopic Handler Docking

Verigy a Premier Semiconductor Test Company

Verigy a Premier Semiconductor Test Company Safe Harbor Statement This webcast or presentation contains certain forward-looking statements within the meaning of the Safe Harbor provisions of the Private