ENVIRONMENTAL TEST REPORT N REV. N/C TEST STANDARDS: MIL-STD-202G

Transcription

1 ENVIRONMENTAL TEST REPORT N REV. N/C TEST STANDARDS: MIL-STD-202G For ANALOG DEVICES INC 3 TECHNOLOGY WAY NORWOOD, MA On ELECTRONICS MODULE MODEL NUMBER: NONE ; PART NUMBER: NONE ; SERIAL NUMBER: NONE PERFORMED BY: KEYSTONE COMPLIANCE, LLC. 131 COLUMBUS INNER BELT NEW CASTLE, PA Keystone Compliance, LLC. does hereby certify that all inspections and tests have been performed in accordance with the documents referenced herein with exceptions as noted in this report. The results in this report pertain to the specified equipment tested. This report shall not be reproduced, except in full, without the written authorization of Keystone Compliance, LLC. Prepared By: Date: 1/5/2016 VICTOR CHAVEZ, Technical Writer Approved By: Date: 1/5/2016 TONY MASONE JR., Lab Manager Approved By: Date: 1/5/2016 JOEY SULLIVAN, Quality Manager Testing Services CONTROLLED DATA PAGE 1 OF 36

2 DOCUMENT HISTORY Revision Issue Date Description Of Modifications Revised By Approved By N/C 1/5/2016 Initial release N/A T.M. CONTROLLED DATA PAGE 2 OF 36

3 CLIENT INFORMATION Purchase Order Quote Number EUT Arrival Date Company Name Address City, State Zip Contact Name Phone Fax N 11/30/ Received in good condition Analog Devices Inc 3 Technology Way Norwood, MA Robin Getz N/A robin.getz@analog.com TEST FACILITY INFORMATION Test Laboratory Address City, State, Zip Code Phone Fax Web Site Contact Name Title Address Keystone Compliance, LLC. 131 Columbus Inner Belt New Castle, PA (724) (724) Tony Masone Jr. Lab Manager Tonyjr@keystonecompliance.com TEST PROGRAM INFORMATION Test Personnel Test Title & Test Dates Darren Pierce Environmental Test Technician Sinusoidal Vibration -- November 30, 2015 Random Vibration -- December 1, 2015 Shock -- December 1, 2015 CONTROLLED DATA PAGE 3 OF 36

4 TABLE OF CONTENTS INTRODUCTION... 5 ACRONYMS AND ABBREVIATIONS... 5 EQUIPMENT UNDER TEST(S)... 6 SUMMARY OF TESTS PERFORMED & RESULTS... 7 SECTION 1 TEST CONDITIONS AND EQUIPMENT Ambient Environmental Conditions Instrumentation and Equipment Tolerances... 8 SECTION 2 REFERENCES Applicable Specifications... 9 SECTION 3 TEST LOGS, TEST EQUIPMENT, TEST DATA, & TEST PHOTOGRAPHS TEST LOG TEST EQUIPMENT SINUSOIDAL VIBRATION TEST Sinusoidal Vibration Test Data Sinusoidal Vibration Test Photographs RANDOM VIBRATION TEST Random Vibration Test Data Random Vibration Test Photographs SHOCK TEST Shock Test Data Shock Test Photographs SECTION 4 CONCLUSION LIST OF TABLES Table 1 Test s Performed & Results... 7 Table 2 Tests Performed & Results CONTROLLED DATA PAGE 4 OF 36

5 INTRODUCTION This report documents the results of a series of Environmental tests performed on the Electronics Module, Model Number: ; Part Number: ; Serial Number:, submitted by Analog Devices Inc. The Environmental test program described herein were performed in accordance with the applicable requirements of MIL-STD-202G. All test data is included in Section 3 of this document. All tests were performed at the Keystone Compliance New Castle, PA Environmental test facility. All testing was performed using the test set-ups of the relevant standard for tests performed in laboratory conditions. ACRONYMS AND ABBREVIATIONS C Degrees Celsius cm Centimeter m Meters N/A Not Applicable M/N Model Number P/N Part Number S/N Serial Number CONTROLLED DATA PAGE 5 OF 36

6 EQUIPMENT UNDER TEST(S) EUT Description Electronics Module Manufacturer Analog Devices Inc Model Number Part Number Serial Number CONTROLLED DATA PAGE 6 OF 36

7 SUMMARY OF TESTS PERFORMED & RESULTS TABLE 1 TEST S PERFORMED & RESULTS Report Paragraph Test Description 3.3 Sinusoidal Vibration 3.4 Random Vibration 3.5 Shock Results No obvious signs of damage to Electronics Module, due to Sinusoidal Vibration testing conditions. Final disposition is to be determined by customer. No obvious signs of damage to Electronics Module, due to Random Vibration testing conditions. Final disposition is to be determined by customer. No obvious signs of damage to Electronics Module, due to Shock testing conditions. Final disposition is to be determined by customer. CONTROLLED DATA PAGE 7 OF 36

8 SECTION 1 TEST CONDITIONS AND EQUIPMENT 1.1 AMBIENT ENVIRONMENTAL CONDITIONS Unless otherwise specified herein, all tests were performed at an atmospheric pressure of 28 ±2.5 inches of mercury absolute, a temperature of 75 ±15 F, and a relative humidity of 50 ±30%. 1.2 INSTRUMENTATION AND EQUIPMENT Measuring and test equipment, utilized in the performance of these tests, was calibrated in accordance with ANSI/NCSL Z , by Keystone Compliance, LLC.. or a commercial facility, utilizing reference standards (or interim standards) whose calibrations have been certified as being traceable to the National Institute of Standards & Technology (NIST). All reference standards utilized in the above calibration system are supported by certificates, reports, or data sheets attesting to the date, accuracy, and conditions under which the results furnished were obtained. All subordinate standards, measuring and test equipment are supported by like data, when such information is essential to achieve the accuracy control required by the procedure. Keystone Compliance, LLC.. attests that the commercial sources providing calibration services on the above referenced equipment, other than the NIST Standards are in fact capable of performing the required services to the satisfaction of Keystone Compliance, LLC.. Quality Assurance. Certifications of all calibrations performed are retained on file in the Keystone Compliance, LLC.. Quality Assurance Department, and are available for inspection upon request by customer representatives. The test equipment utilized during this test program is listed on individual Test Equipment Sheets located in Section 3 of this document. 1.3 TOLERANCES All test conditions were maintained within all applicable specified tolerances. CONTROLLED DATA PAGE 8 OF 36

9 SECTION 2 REFERENCES 2.1 APPLICABLE SPECIFICATIONS Reference Specification Title Calibration Information MIL-STD-202G Test Method Standard; Electronic And Electrical Component Parts ANSI/NCSL Z Calibration Laboratories and Measuring Test Equipment - General Requirements CONTROLLED DATA PAGE 9 OF 36

10 SECTION 3 TEST LOGS, TEST EQUIPMENT, TEST DATA, & TEST PHOTOGRAPHS 3.1 TEST LOG Test Log EUT: Electronics Module Job Number: N Customer: Analog Devices Inc Model Number: Date: 11/30/15-12/1/15 Part Number: Test Engineer: D. Pierce Serial Number: Test: All Tests Test Specifications Test Spec: MIL-STD-202G Para./Sec.: See Data Test Log Date Time Axis Description 11/30/ Z Start sinusoidal vibration 12:40 Z End sinusoidal vibration 13:31 Y Start sinusoidal vibration 15:31 Y End sinusoidal vibration 15:42 X Start sinusoidal vibration 17:42 X End sinusoidal vibration 12/01/ :35 X Start random vibration 10:05 X End random vibration 10:27 Y Start random vibration 11:57 Y End random vibration 12:15 Z Start random vibration 13:45 Z End random vibration 13:49 Z Shock test positive 13:52 Z Shock test negative 14:08 X Shock test positive 14:10 X Shock test negative 14:14 Y Shock test positive 14:16 Y Shock test negative End of testing. Final operation check done by customer PAGE: 1 ENGINEER/TECHNICIAN(S): D. Pierce OF: 1 TECHNICAL REVIEWER: T.Masone Jr. CONTROLLED DATA PAGE 10 OF 36

11 3.2 TEST EQUIPMENT Equipment Log EUT: Electronics Module Job Number: N Customer: Analog Devices Inc Model Number: Date: 11/30/15-12/1/15 Part Number: Test Engineer: D. Pierce Serial Number: Test: All Tests Test Specifications Test Spec: MIL-STD-202G Para./Sec.: See Data Test Equipment Asset No. Description Manufacturer Model Serial No. Cal. Due ND002 Electrodynamic Shaker LDS N/A ND013 Vibration Controller Spectral Dynamics /29/2016 SD11000L-S3- ND014 Electrodynamic Shaker Spectral Dynamics 17 S N/A ND020 Vibration Controller Spectral Dynamics D 04/29/ B33/ACS- ND021 Accelerometer PCB 23 LW /14/2016 NS002 Jaguar Software Spectral Dynamics D N/A NS003 Jaguar Software Spectral Dynamics N/A UWCE: Used With Calibrated Equipment REF: Reference Only IPU: Inspect Prior to Use PAGE: 1 ENGINEER/TECHNICIAN(S): D. Pierce OF: 1 QUALITY MANAGER: J.Sullivan CONTROLLED DATA PAGE 11 OF 36

12 3.3 SINUSOIDAL VIBRATION TEST a) The Sinusoidal Vibration test requirements for the Electronics Module are specified in MIL-STD-202G. b) The Sinusoidal Vibration test log for the Electronics Module is located in Paragraph 3.1 of this document. c) The Sinusoidal Vibration test equipment used to test the Electronics Module is located in Paragraph 3.2 of this document. d) All recorded test data for the Sinusoidal Vibration test on the Electronics Module is located in Paragraph of this document. e) The Sinusoidal Vibration test photographs for the Electronics Module are located in Paragraph of this document. CONTROLLED DATA PAGE 12 OF 36

13 3.3.1 SINUSOIDAL VIBRATION TEST DATA Sinusoidal Vibration Data Sheet EUT: Electronics Module Job Number: N M/N: P/N: S/N: Customer: Analog Devices Inc Date: 11/30/15 Test Engineer: D. Pierce Test Specifications Test Spec.: MIL-STD-202G Para./Sec.: Method 201A Test Data Lateral Axis Profile (X) Sweep Rate (Octave/Minute): 5 Duration (Time or # of Sweeps): 2 Hours Frequency (Hz) Acceleration (G s) Displacement (Inches Peak to Peak) EUT Test Information Y N N/A Comments Physical Damage Noted: X Longitudinal Axis Profile (Y) Sweep Rate (Octave/Minute): 5 Duration (Time or # of Sweeps): 2 Hours Frequency (Hz) Acceleration (G s) Displacement (Inches Peak to Peak) EUT Test Information Y N N/A Comments Physical Damage Noted: X Vertical Axis Profile (Z) Sweep Rate (Octave/Minute): 5 Duration (Time or # of Sweeps): 2 Hours Frequency (Hz) Acceleration (G s) Displacement (Inches Peak to Peak) EUT Test Information Y N N/A Comments Physical Damage Noted: X PAGE: 1 ENGINEER/TECHNICIAN(S): D. Pierce OF: 1 TECHNICAL REVIEWER: T.Masone Jr. CONTROLLED DATA PAGE 13 OF 36

14 X-Axis CONTROLLED DATA PAGE 14 OF 36

15 Y-Axis CONTROLLED DATA PAGE 15 OF 36

16 Z-Axis CONTROLLED DATA PAGE 16 OF 36

17 3.3.2 SINUSOIDAL VIBRATION TEST PHOTOGRAPHS Sinusoidal Vibration MIL-STD-202G Test Setup X-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 11/30/15 Job #: N Sinusoidal Vibration MIL-STD-202G Test Setup Y-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 11/30/15 Job #: N CONTROLLED DATA PAGE 17 OF 36

18 Sinusoidal Vibration MIL-STD-202G Test Setup Z-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 11/30/15 Job #: N CONTROLLED DATA PAGE 18 OF 36

19 3.4 RANDOM VIBRATION TEST a) The Random Vibration requirement for the Electronics Module is specified in MIL-STD-202G. b) The Random Vibration test log for the Electronics Module is located in Paragraph 3.1 of this document. c) The Random Vibration test equipment used to test the Electronics Module is located in Paragraph 3.2 of this document. d) All recorded test data for the Random Vibration test on the Electronics Module is located in Paragraph of this document. e) The Random Vibration test photographs for the Electronics Module are located in Paragraph of this document. CONTROLLED DATA PAGE 19 OF 36

20 3.4.1 RANDOM VIBRATION TEST DATA Random Vibration Data Sheet EUT: Electronics Module Job Number: N S/N: P/N: M/N: Customer: Analog Devices Inc Date: 12/1/15 Test Engineer: D. Pierce Test Specifications Test Spec: MIL-STD-202G Para./Sec.: Method 214A, Cond.A Test Data EUT Test Information Y N N/A Comments Tested In Shipping Container: X Customer performed operational checks during testing Powered During Test: X V A AC/DC Operating During Test: X Operating Mode: Lateral Axis Profile (X) Duration: 1.5 Hours Frequency (Hz) ASD (G ²/Hz) Slope (db/octave) EUT Test Information Y N N/A Comments Physical Damage Noted: X Longitudinal Axis Profile (Y) Duration: 1.5 Hours Frequency (Hz) ASD (G ²/Hz) Slope (db/octave) EUT Test Information Y N N/A Comments Physical Damage Noted: X Vertical Axis Profile (Z) Duration: 1.5 Hours Frequency (Hz) ASD (G ²/Hz) Slope (db/octave) EUT Test Information Y N N/A Comments Physical Damage Noted: X PAGE: 1 ENGINEER/TECHNICIAN(S): D. Pierce OF: 1 TECHNICAL REVIEWER: T.Masone Jr. CONTROLLED DATA PAGE 20 OF 36

21 X-Axis CONTROLLED DATA PAGE 21 OF 36

22 Y-Axis CONTROLLED DATA PAGE 22 OF 36

23 Z-Axis CONTROLLED DATA PAGE 23 OF 36

24 3.4.2 RANDOM VIBRATION TEST PHOTOGRAPHS Random Vibration MIL-STD-202G Test Setup X-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 12/1/15 Job #: N Random Vibration MIL-STD-202G Test Setup Y-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 12/1/15 Job #: N CONTROLLED DATA PAGE 24 OF 36

25 Random Vibration MIL-STD-202G Test Setup Z-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 12/1/15 Job #: N CONTROLLED DATA PAGE 25 OF 36

26 3.5 SHOCK TEST a) The Shock requirements for the Electronics Module are specified in MIL-STD-202G. b) The Shock test log for the Electronics Module is located in Paragraph 3.1 of this document. c) The Shock test equipment used to test the Electronics Module is located in Paragraph 3.2 of this document. d) All recorded test data for the Shock test on the Electronics Module is located in Paragraph of this document. e) The Shock test photographs for the Electronics Module are located in Paragraph of this document. CONTROLLED DATA PAGE 26 OF 36

27 3.5.1 SHOCK TEST DATA Shock Data Sheet EUT: Electronics Module Job Number: N M/N: P/N: S/N: Customer: Analog Devices Inc Date: 12/1/15 Test Engineer: D. Pierce Test Specifications Test Spec: MIL-STD-202G Para./Sec.: Method 213B, Cond.J Test Data EUT Test Information Y N N/A Comments Tested In Shipping Container: X Customer performed operational checks during testing Powered During Test: X V A AC/DC Operating During Test: X Operating Mode: Lateral Axis Profile (X) Duration (ms) : 11 Level (G s) : 30 Number of Shock Pulses : 3 Positive 3 Negative Control Accel. Location : On fixture EUT Test Information Y N N/A Comments Physical Damage Noted: X Longitudinal Axis Profile (Y) Duration (ms) : 11 Level (G s) : 30 Number of Shock Pulses : 3 Positive 3 Negative Control Accel. Location : On fixture EUT Test Information Y N N/A Comments Physical Damage Noted: X Vertical Axis Profile (Z) Duration (ms) : 11 Level (G s) : 30 Number of Shock Pulses : 3 Positive 3 Negative Control Accel. Location : On fixture EUT Test Information Y N N/A Comments Physical Damage Noted: X PAGE: 1 ENGINEER/TECHNICIAN(S): D. Pierce OF: 1 TECHNICAL REVIEWER: T.Masone Jr. CONTROLLED DATA PAGE 27 OF 36

28 X-Axis Positive CONTROLLED DATA PAGE 28 OF 36

29 X-Axis Negative CONTROLLED DATA PAGE 29 OF 36

30 Y-Axis Positive CONTROLLED DATA PAGE 30 OF 36

31 Y-Axis Negative CONTROLLED DATA PAGE 31 OF 36

32 Z-Axis Positive CONTROLLED DATA PAGE 32 OF 36

33 Z-Axis Negative CONTROLLED DATA PAGE 33 OF 36

34 3.5.2 SHOCK TEST PHOTOGRAPHS Shock MIL-STD-202G Test Setup X-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 12/1/15 Job #: N Shock MIL-STD-202G Test Setup Y-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 12/1/15 Job #: N CONTROLLED DATA PAGE 34 OF 36

35 Shock MIL-STD-202G Test Setup Z-Axis Unit Tested Model Number Part Number Serial Number Electronics Module Analog Devices Inc Date: 12/1/15 Job #: N CONTROLLED DATA PAGE 35 OF 36

36 SECTION 4 CONCLUSION a) The Electronics Module, Model Number: ; Part Number: ; Serial Number: ; was subjected to the following Environmental Tests in accordance with MIL-STD-202G: TABLE 2 TESTS PERFORMED & RESULTS Test Description Sinusoidal Vibration Random Vibration Shock Results No obvious signs of damage to Electronics Module, due to Sinusoidal Vibration testing conditions. Final disposition is to be determined by customer. No obvious signs of damage to Electronics Module, due to Random Vibration testing conditions. Final disposition is to be determined by customer. No obvious signs of damage to Electronics Module, due to Shock testing conditions. Final disposition is to be determined by customer. b) The Electronics Module was returned to Analog Devices Inc after completion of the Environmental Test. CONTROLLED DATA PAGE 36 OF 36