OPTIONS. Low Power Data Retention Mode. PIN ASSIGNMENT (Top View) I/O 16 I/O 17 I/O 18 I/O 19 I/O17 I/O18 I/O19. Vss I/O20 I/O21 I/O22 I/O23
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1 512K x 32 SRAM SRAM MEMORY ARRAY AVAILABLE AS MILITARY SPECIFICATIONS SMD & (Military Pinout) MIL-STD-883 FEATURES Operation with single 5V supply Vastly improved Icc Specs High speed: 12, 15, 17, 20, 25, 35, 45 & 55ns Low power CMOS GENERAL DESCRIPTION Built in decoupling caps for low noise Organized as 512Kx32, byte selectable TTL Compatible Inputs and Outputs The and A are 16 Megabit CMOS SRAM Modules organized as 512Kx32 bits. These devices achieve high speed access, low power consumption and high reliability by employing advanced CMOS memory technology. This military temperature grade product is ideally suited for military applications. A0 A1 A2 A3 A4 A5 CS3\ GND CS4\ WE1\ A6 A7 A8 A9 A10 Vcc OPTIONS PIN ASSIGNMENT (Top View) Operating Temp. Ranges Markings Full Military (-55 o C to +125 o C) Q & 883 Military (-55 o C to +125 o C) XT Industrial (-40 o C to +85 o C) IT SRAM & A Timing Markings Timing Markings 12ns ns ns ns ns ns ns ns -55 Package Ceramic Quad Flatpack Pin Grid Array Low Power Data Retention Mode I/O 16 A18 A17 CS4\ CS3\ CS2\ CS1\ Vcc OE\ WE\ A16 A15 A14 I/O 15 Markings Q, Q1, Q2, BQFP P Pinout Markings Military (no indicator) Commercial A* L I/O17 I/O18 I/O19 Vss I/O20 I/O21 I/O22 I/O23 Vcc I/O24 I/O25 I/O26 I/O27 Vss I/O28 I/O29 I/O I/O 14 I/O 13 I/O 12 Vss I/O 11 I/O 10 I/O 9 I/O 8 Vcc I/O 7 I/O 6 I/O 5 I/O 4 Vss I/O 3 I/O 2 I/O 1 68 Lead CQFP Commercial Pinout Option (Q with Pinout A) I/O 31 A6 A5 A4 A3 A2 A1 A0 Vcc A13 A12 A11 A10 A9 A8 A7 I/O 0 *(available with Q package only) 68 Lead CQFP (Q, Q1, Q2) Military SMD Pinout Option I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7 GND I/O 8 I/O 9 I/O 10 I/O 11 I/O 12 I/O 13 I/O 14 I/O I/O 16 I/O 17 I/O 18 I/O 19 I/O 20 I/O 21 I/O 22 I/O 23 GND I/O 24 I/O 25 I/O 26 I/O 27 I/O 28 I/O 29 I/O 30 I/O Vcc A11 A12 A13 A14 A15 A16 CS1\ OE\ CS2\ A17 WE2\ WE3\ WE4\ A Lead CQFP (BQFP) Military SMD Pinout Option I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7 GND I/O 8 I/O 9 I/O 10 I/O 11 I/O 12 I/O 13 I/O 14 I/O I/O 16 I/O 17 I/O 18 I/O 19 I/O 20 I/O 21 I/O 22 I/O 23 GND I/O 24 I/O 25 I/O 26 I/O 27 I/O 28 I/O 29 I/O 30 I/O 31 Vcc A11 A12 A13 A14 A15 A16 CS2\ OE\ CS4\ A17 A A0 A1 A2 A3 A4 A5 CS1\ GND CS3\ WE\ A6 A7 A8 A9 A10 Vcc 66 Lead PGA (P) Military SMD Pinout & A 1
2 & A CS CS CS CS CS4\ CS\4 CS3\ CS\3 CS2\ CS\2 CS1\ CS\1 WE\ OE\ A0 - A18 M0 M1 512K x 8 M2 512K x 8 M3 512K x 8 512K x 8 I/O 24 - I/O 31 I/O 16 - I/O 23 I/O 8 - I/O 15 I/O 0 - I/O 7 MILITARY PINOUT/BLOCK DIAGRAM COMMERCIAL PINOUT/BLOCK DIAGRAM CS & A 2
3 & A ABSOLUTE MAXIMUM RATINGS* Voltage of Vcc Supply Relative to Vss...-.5V to +7V Storage Temperature C to +150 C Short Circuit Output Current(per I/O)...20mA Voltage on Any Pin Relative to Vss...-.5V to Vcc+1V Maximum Junction Temperature** C *Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation on the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. **Junction temperature depends upon package type, cycle time, loading, ambient temperature and airflow. See the Application Information section at the end of this datasheet for more information. ELECTRICAL CHARACTERISTICS AND RECOMMENDED DC OPERATING CONDITIONS (-55 o C < T A < 125 o C and -40 o C to +85 o C; Vcc = 5V +10%) (-55 C < T A < 125 C and -40 C to +85 C; Vcc = 5V +10%) DESCRIPTION CONDITIONS SYMBOL MIN MAX UNITS NOTES Input High (logic 1) Voltage V IH 2.2 V CC +.5 V 1 Input Low (logic 1) Voltage V IL V 1,2 Input Leakage Current ADD,OE I LI µa 0V<V IN <V CC Input Leakage Current WE, CE I LI µa Output(s) Disabled Output Leakage Current I/O ILO µa 0V<V OUT <V CC Output High Voltage I OH = 4.0mA V OH 2.4 V 1 Output Low Voltage I OL = 8.0mA V OL 0.4 V 1 Supply Voltage V CC V 1 MAX DESCRIPTION CONDITIONS SYMBOL UNITS NOTES Power Supply Current: Operating CS\<VIL; VCC = MAX f = MAX = 1/ trc (MIN) Outputs Open Icc ma 3,13 Power Supply Current: Standby CS\>VIH; VCC = MAX f = MAX = 1/ trc (MIN) Outputs Open I SBT ma 3, 13 VIN = VCC - 0.2V, or CMOS Standby VSS +0.2V I SBT ma VCC=Max; f = 0Hz & A 3
4 & A CAPACITAE (V IN = 0V, f = 1MHz, T A = 25 o C )1 SYMBOL PARAMETER MAX UNITS C ADD A0 - A18 Capacitance 50 pf C OE OE\ Capacitance 50 pf C WE, C CS WE\ and CS\ Capacitance 20 pf C IO I/O 0- I/O 31 Capacitance 20 pf C WE ("A" version) WE\ Capacitance 50 pf NOTE: 1. This parameter is sampled. AC TEST CONDITIONS Test Specifications Input pulse levels...vss to 3V Input rise and fall times...5ns Input timing reference levels...1.5v Output reference levels...1.5v Output load...see Figure 1 Device Under Test Ceff = 50pf Current Source I OL Vz = 1.5V (Bipolar Supply) Current Source I OH Figure 1 NOTES: Vz is programmable from -2V to + 7V. I OL and I OH programmable from 0 to 16 ma. Vz is typically the midpoint of V OH and V OL. I OL and I OH are adjusted to simulate a typical resistive load circuit. Figure 1 & A 4
5 & A ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS (NOTE 5) (-55 o C<T A < 125 o C and -40 o C to +85 o C; V CC = 5V +10%) DESCRIPTION READ CYCLE READ cycle time Address access time Chip select access time Output hold from address change Chip select to output in Low-Z Chip select to output in High-Z Output enable access time Output enable to output in Low-Z Output disable to output in High-Z WRITE CYCLE WRITE cycle time Chip select to end of write Address valid to end of write Address setup time Address hold from end of write WRITE pulse width WRITE pulse width Data setup time Data hold time Write disable to output in Low-z Write enable to output in High-Z SYMBOL UNITS MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX NOTES t RC ns t AA ns t ACS ns t OH ns t LZCS ns 4,6,7 t HZCS ns 4,6,7 t AOE ns t LZOE ns 4,6 t HZOE ns 4,6 t WC ns t CW ns t AW ns t AS ns t AH ns t WP ns t WP ns t DS ns t DH ns t LZWE ns 4,6,7 t HZWE ns 4,6,7 & A 5
6 & A READ CYCLE NO. 1 t RC ADDRESS t OH t AA DATA I/O PREVIOUS DATA VALID DATA VALID READ CYCLE NO. 2 ADDRESS t RC CS\ OE\ DATA I/O t AA t ACS tlzcs t t AOE LZOE HIGH IMPEDAE t HZCS t HZOE DATA VALID & A 6
7 & A WRITE CYCLE NO. 1 (Chip Select Controlled) t WC ADDRESS CS\ t AW tcw t AH t AS t WP1 1 WE\ DATA I/O t HZWE t LZWE t DS t DH DATA VALID WRITE CYCLE NO. 2 (Write Enable Controlled) t WC ADDRESS t AW CS\ t AS t CW t AH WE\ t WP2 1 DATA I/O t DS t DH DATA VALID & A 7
8 NOTES 1. All voltages referenced to V SS (GND) V for pulse width <20ns. 3. ICC is dependent on output loading and cycle rates. The specified value applies with the outputs 1 unloaded, and f= HZ. t RC(MIN) 4. This parameter guaranteed but not tested. 5. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted. 6. t HZCS, t HZOE and t HZWE are specified with C L = 5pF as in Fig. 2. Transition is measured +/- 200 mv typical from steady state voltage, allowing for actual tester RC time constant. 7. At any given temperature and voltage condition, SRAM & A t HZCS, is less than t LZCS, and t HZWE is less than t LZWE. 8. WE\ is HIGH for READ cycle. 9. Device is continuously selected. Chip selects and output enable are held in their active state. 10. Address valid prior to or coincident with latest occurring chip enable. 11. t RC = READ cycle time. 12. Chip enable (CS\) and write enable (WE\) can initiate and terminate a WRITE cycle. 13. I CC is for 32 bit mode. LOW POWER CHARACTERISTICS (L Version Only) DESCRIPTION CONDITIONS SYMBOL MIN MAX UNITS NOTES V CC for Retention Data V DR 2 V Data Retention Current All Vcc + 0.2V V CC = 2V I CCDR 10 ma or Vss + 0.2V, CS\ = Vcc + 0.2V V CC = 3V I CCDR 12 ma Chip Deselect to Data Retention Time t CDR 0 ns 4 Operation Recovery Time t R t RC ns 4, 11 LOW V CC DATA RETENTION WAVEFORM DATA RETENTION MODE V CC 4.5V 4.5V V DR >2V t CDR t R CS\ 1-4 V DR & A 8
9 & A MECHANICAL DEFINITIONS* Micross Case #702 (Package Designator Q) SMD , Case Outline M 4 x D2 4 x D1 D DETAIL A R b 1 o - 7 o L1 B e SEE DETAIL A A1 A A2 E SMD SPECIFICATIONS SYMBOL MIN MAX A A A B REF b D BSC D D E e BSC R L *All measurements are in inches. & A 9
10 & A MECHANICAL DEFINITIONS* Micross Package Designator Q2 D2 D1 D 1 b e D3 PACKAGE SPECIFICATION Symbol PACKAGE MinSPECIFICATION Max Symbol A Min.200 Max A1 A B A b b REF.017 D B.800 BSC.010 REF D1 D BSC D2 D e D2 R D BSC TYP L1 e bsc Dimensions R are in inches..010 TYP L Dimensions in inches R L1 B A1 A *All measurements are in inches. & A 10
11 & A MECHANICAL DEFINITIONS* Micross Case #904 (Package Designator P ) SMD , Case Outline T Pin 56 4 x D D1 D2 A A1 Pin 1 (identified by square pad) φb1 E1 e φb Pin 66 e Pin 11 L SMD SPECIFICATIONS SYMBOL MIN MAX A A φb φb D D1/E1 D2 e TYP TYP TYP L *All measurements are in inches. & A 11
12 MECHANICAL DEFINITIONS* Micross Case (Package Designator Q1) SMD , Case Outline A SRAM & A SMD SPECIFICATIONS SYMBOL MIN MAX A A b B TYP c D/E D1/E D2/E2 e BSC BSC L R TYP *All measurements are in inches. & A 12
13 & A MECHANICAL DEFINITIONS* Micross Case (Package Designator BQFP) SMD , Case Outline N Symbol Millimeters Inches Min Max Min Max A A A b C D/E D1/E D2/E e e j k L S & A 13
14 ORDERING INFORMATION SRAM & A Device Number Package Type Speed (ns) Power Option Process Q, Q1, Q2, P or BQFP 12, 15, 17, 20, 25, 35, 45 or 55 L (Low Power) Blank (Std power) /* Examples: Q 15/Q P 17L/Q P 25/XT Q1 55/IT BQFP 55/883C *Available Processes IT = Industrial Temperature Range XT = Military Temperature Range Q & 883C = Full Military Processing 40 0 C to C 55 0 C to C 55 0 C to C & A 14
15 & A MICROSS TO DSCC PART NUMBER CROSS REFEREE Package Designator Q Package Designator Q1 Package Designator P Micross Part# SMD Part# Micross Part# SMD Part# Micross Part# SMD Part# Q 12/Q HMA Q1 12/883C HAA P 12/Q HTA Q 12/Q HMC Q1 12/883C HAC P 12/Q HTC Q 12L/Q HMA Q1 12L/ HAA P 12L/Q HTA Q 12L/Q HMC Q1 12L/ HAC P 12L/Q HTC Q 15/Q HMA Q1 15/883C HAA P 15/Q HTA Q 15/Q HMC Q1 15/883C HAC P 15/Q HTC Q 15L/Q HMA Q1 15L/ HAA P 15L/Q HTA Q 15L/Q HMC Q1 15L/ HAC P 15L/Q HTC Q 17/Q HMA Q1 17/883C HAA P 17/Q HTA Q 17/Q HMC Q1 17/883C HAC P 17/Q HTC Q 17L/Q HMA Q1 17L/ HAA P 17L/Q HTA Q 17L/Q HMC Q1 17L/ HAC P 17L/Q HTC Q 20/Q HMA Q1 20/883C HAA P 20/Q HTA Q 20/Q HMC Q1 20/883C HAC P 20/Q HTC Q 20L/Q HMA Q1 20L/ HAA P 20L/Q HTA Q 20L/Q HMC Q1 20L/ HAC P 20L/Q HTC Q 25/Q HMA Q1 25/883C HAA P 25/Q HTA Q 25/Q HMC Q1 25/883C HAC P 25/Q HTC Q 25L/Q HMA Q1 25L/ HAA P 25L/Q HTA Q 25L/Q HMC Q1 25L/ HAC P 25L/Q HTC Q 35/Q HMA Q1 35/883C HAA P 35/Q HTA Q 35/Q HMC Q1 35/883C HAC P 35/Q HTC Q 35L/Q HMA Q1 35L/ HAA P 35L/Q HTA Q 35L/Q HMC Q1 35L/ HAC P 35L/Q HTC Q 45/Q HMA HMA Q1 45/883C HAA HAA P 45/Q HTA HTA Q 45/Q HMC Q1 45/883C HAC P 45/Q HTC Q 45L/Q HMA Q1 45L/ HAA P 45L/Q HTA Q 45L/Q HMC Q1 45L/ HAC P 45L/Q HTC Q 55/Q HMA Q1 55/883C HAA P 55/Q HTA Q 55/Q HMC Q1 55/883C HAC P 55/Q HTC Q 55L/Q HMA Q1 55L/ HAA P 55L/Q HTA Q 55L/Q HMC Q1 55L/ HAC P 55L/Q HTC Package Designator BQFP Micross Part# BQFP 20/883C BQFP 25/883C BQFP 25/883C BQFP 35/883C BQFP 35/883C BQFP 45/883C BQFP 45/883C BQFP 55/883C SMD Part# H H H H H H H H & A 15
16 DOCUMENT TITLE 512K x 32 SRAM MEMORY ARRAY SRAM & A Rev # History Release Date Status 6.5 Updated Features, Temp Range & April 2010 Release General Description - Page 1, Updated Order Chart - Page 13, Removed Space Processing - Page Updated Ordering Table, Page 14 June 2010 Release Updated DSCC Cross Reference, Page 15 Added SMD , Page 1 Added BQFP Package, Page 1 and added BQFP drawing on page 13 (BQFP package is listed on SMD ) 6.7 Updated Q2 Spec, Page 10 July 2010 Release 6.8 Page 3 Changes: June 2011 Release From To I CC (ma) I SBT1 (ma) I SBT2 (ma) V I CCDR (ma) V I CCDR (ma) Removed note from page 8 "-12 &-15 have a 32mA limit". & A 16
17 & A Rev # History Release Date Status 6.9 Added 68 Lead CQFP (BQFP) August 2013 Release Military SMD Pinout Option & A 17
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