512KX8 CMOS S-RAM (Monolithic)
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1 512KX8 CMOS S-RAM (Monolithic) Features Access Times: 55, 70, 85 and 100ns Package Option: 32-Pin Ceramic DIP, JEDEC Approved Pinout 36-Lead Ceramic SOJ JEDEC Approved Revolutionary Pinout 32-Lead Ceramic SOJ Industrial and Military Screening TTL Compatible Input/Output Single 5V (±10%) Power Data Retention Product Description The MES5128 is a Monolithic 4 Megabit Static Ram. The module is organized as 512Kx8 and packed in a multilayer High Temperature cofired ceramic package, designed for better speed performance. These modules are available in 55ns to 100ns versions. Low Power versions are also available. Block Diagram December, 2003 Rev. A 1 OF 13
2 Pin Names Truth Table (H=VIH L=VIL X=Don't Care) Pin Name Pin Function OE# WE# CS# I/O Mode A0 A18 Address Inputs X X H Hi-Z Standby D0 D7 Data Inputs/Outputs L H L DOUT Read CS# Chip Select X L L DIN Write WE# Write Enable H H L Hi-Z Out Disable OE# Output Enable GND Ground Vcc Power (+5V ±10%) NC No Connection Note: # Symbol means Active Low Signal Pin Configurations (Top View) DIP (D) CSOJ (J1) CSOJ (J) 1 A18 Vcc 32 1 A18 Vcc 32 2 A16 A A16 A A14 A A14 A A12 WE# 29 4 A12 WE# 29 5 A7 A A7 A A6 A A6 A A5 A A5 A A4 A A4 A A3 OE# 24 9 A3 OE# A2 A A2 A A1 CS# A1 CS# A0 D A0 D D0 D D0 D D1 D D1 D D2 D D2 D GND D GND D3 17 December, 2003 Rev. A 2 OF 13
3 Absolute Maximum Ratings Item Rating Supply Voltage Relative to GND Voltage on Any Pin Relative to GND Operating Temperature Storage Temperature -0.5V to +7.0V -0.5V to Vcc +0.5V -55 C to +125 C -65 C to +150 C Recommended Operating Conditions Parameter Symbol Min Max Unit Supply Voltage VCC V Input High Voltage VIH 2.2 VCC +0.3 V Input Low Voltage VIL V Operating (Military) TA C Temperature (Industrial) C Capacitance (TA = +25 C, VIN = 0V, f = 1.0 MHz) Description Symbol Limits Unit Min Max Input Capacitance CIN 20 pf Output Capacitance COUT 20 pf These parameters are guaranteed, but not tested. December, 2003 Rev. A 3 OF 13
4 DC Characteristics (Vcc = 5V) Parameter Symbol Min Max Units Input Leakage Current ILI (1) -2 2 µa Output Leakage Current ILO (2) -2 2 µa Output Low Voltage VOL (3) 0.4 V Output High Voltage VOH (4) 2.4 V 55ns 5 Standby Supply Current ISB (5) 70ns 5 ma 85ns 5 100ns 3 55ns 50 Dynamic Operating Current ICC (6) 70ns 50 ma 85ns ns 50 Notes: (1) VCC = Max, VI/O = VCC to GND. (2) VI/O = VCC to GND, CS# VIH, OE# VIH. (3) VCC = Min, IOL = +2.1mA. (4) VCC = Min, IOH = -1.0mA. (5) VCC = Max, CS# = VIH, OE# = VIH, f = 5MHz. (6) VCC = Max, CS# = VIL, OE# = VIH, f = 5MHz. December, 2003 Rev. A 4 OF 13
5 AC Characteristics Write Cycle Parameter Symbol 55ns 70ns 85ns 100ns Limits Units Write Cycle Time TAVAV min ns Address Set-up Time TAVWL min ns Address Valid to End of Write TAVWH min ns Data Valid to End of Write TDVWH min ns Chip Select Low to End of Write TELWH min ns Write Pulse Width TWLWH min ns Address Hold from Write End TWHAX min ns Data Hold Time TWHDX min ns Write Enable Low to High Z TWLQZ* max ns Output Active from End of Write TWHQX* min ns Read Cycle Parameter Symbol 55ns 70ns 85ns 100ns Limits Units Read Cycle Time TAVAV min ns Address Access Time TAVQV max ns Output Hold from Addr. Change TAVQX min ns Chip Select Access Time TELQV max ns Output Enable to Output Valid TGLQV max ns Chip Select to Output in Low Z TELQX* min ns Chip Disable to Output in High Z TEHQZ* max ns Output Enable to Output in Low Z TGLQX* min ns Output Disable to Output in High Z TGHQZ* max ns (*) - Parameter is guaranteed, but not tested. December, 2003 Rev. A 5 OF 13
6 December, 2003 Rev. A 6 OF 13
7 December, 2003 Rev. A 7 OF 13
8 AC Test Conditions Item Conditions Input Pulse Levels GND to 3.0V Input Rise and Fall Times 5ns Input Timing Reference Level 1.5V Output Timing Reference Level 1.5V Output Load: 1 TTL Load, CL=100pF Note: For TWHQX, TWLQZ, TEHQZ, TELQX, TGHQZ and TGLQX CL = 5pF Data Retention Characteristics (Over Operating Temp Range) Test Conditions: GND = 0V, VCC=3V, CS# VCC-0.2V, VIH VCC - 0.2V, VIL 0.2V. Characteristic Symbol Min Typ. Max Unit VCC for Data Retention VDR 2.4 V D.R Quiescent Current ICCDR 100 (1) 400 (1) µa Chip Disable to D.R Time TCDR 0 nsec Operation Recovery Time TR 5 nsec (1) Lower D.R Currents are available upon request Data Retention (CS# - Controlled) December, 2003 Rev. A 8 OF 13
9 Outline Drawing for 32-Pin Ceramic DIP (D) December, 2003 Rev. A 9 OF 13
10 Outline Drawing for 32-Lead Ceramic SOJ (J1) December, 2003 Rev. A 10 OF 13
11 Outline Drawing for 36-Lead Ceramic SOJ (J) December, 2003 Rev. A 11 OF 13
12 Ordering Information (Standard Military Screened Products*) Model Number Speed Package MES5128D55MNL 55ns CDIP32 MES5128D70MNL 70ns CDIP32 MES5128D85MNL 85ns CDIP32 MES5128D100MNL 100ns CDIP32 MES5128J155MNL 55ns CSOJ32 MES5128J170MNL 70ns CSOJ32 MES5128J185MNL 85ns CSOJ32 MES5128J1100MNL 100ns CSOJ32 MES5128J55MNL 55ns CSOJ36 MES5128J70MNL 70ns CSOJ36 MES5128J85MNL 85ns CSOJ36 MES5128J100MNL 100ns CSOJ36 (*) - Contact Elisra for additional designs December, 2003 Rev. A 12 OF 13
13 Part Number Breakdown December, 2003 Rev. A 13 OF 13
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