Optimization of Display-Systems
|
|
- Lucinda Houston
- 6 years ago
- Views:
Transcription
1 Optimization of Display-Systems with respect to Glare, Distinctness of Image and Sparkle Michael E. Becker Display-Messtechnik&Systeme - Rottenburg am Neckar display-messtechnik.de
2 Optimization of Displays with an AG-Layer AG no AG glare control ambient light image blur sparkle scattering AG-layer light carrying visual information 2 display-messtechnik.de
3 Optimization Task + reflections gloss glare image distortions image blur + fingerprints - - visual artefacts sparkle the optimum display task: minimize reflections, image blur, sparkle and costs -... expenses costs + 3 display-messtechnik.de
4 Characterization of Reflectance 4 display-messtechnik.de
5 Characterization of Reflectance Konica Minolta CM display-messtechnik.de
6 Characterization of Reflectance Both devices are made for surfaces covered with paint, pigments, etc. They are NOT suited for characterization of transparent samples. 6 display-messtechnik.de
7 Characterization of Reflectance Helmholtz reciprocity specular included TIS (total integrated scatter) specular only high-resolution reflectance distribution function 7 display-messtechnik.de
8 Characterization of Reflectance? with a gloss-meter LMD LMD Gloss-Meter reading 1 Gloss-Meter reading 2<1 Gloss level of 100% given by specular reflection from a polished black glass surface (n = 589 nm). Increasing gloss level decreasing scattering (at same substrate thickness!) 8 display-messtechnik.de
9 Characterization of Reflectance High-Resolution Scatter Analysis of Anti-Glare Layer Reflection Proc. SID 2016 display-messtechnik.de
10 Scatter Analysis: How Directional Scanning dl ( θ, φ ) = B( θ, φ,θ, φ ;λ,p) de( θ φ ) s s s i i s s i, i The scattering properties of surfaces are generally and completely described by the bidirectional scatter distribution function (BSDF) which is a function of the direction of light incidence, the direction of observation, the wavelength of light and its state of polarization. Assessment and evaluation of the reflective properties of surfaces can be realized by mechanical (motorized) scanning of a range of observation directions with photometric or spectro-radiometric receivers for one direction of light incidence. This can be done with complex, and bulky high-precision mechanisms (gonio-photometer or gonio-spectroradiometer). Scanning of the directions of observation without moving parts: optical scanning (conoscopy), analysis of the spreading of a point- or line-source of illumination (PSF - LSF approach), hemispherical projection and imaging ("imaging hemisphere"). 10 display-messtechnik.de
11 Optical Directional Scanning Conoscopic approach collimated beam illumination Imaging approach point-source illumination θ s θ θ φ Basic components of reflection obvious in PSF-image: specular peak (width of the source) haze ("fuzzy ball" in image, bell shaped profile) Lambertian (constant plateau) 11 display-messtechnik.de
12 Optical Directional Scanning Conoscopic approach Imaging approach directional illumination conoscopic lens E(x,y) point-source illumination E(0,0) directions image ilmd objective lens ilmd directional analysis of light from one area element directional analysis of light from an extended area! properties must be uniform! 12 display-messtechnik.de
13 Optical Directional Scanning Conoscopic imaging system Directions image Fourier transformation??? 13 display-messtechnik.de
14 Optical Directional Scanning Conoscopic imaging system - reflective illumination 1 14 display-messtechnik.de
15 Optical Directional Scanning Conoscopic imaging system - reflective illumination 2 external isotropic point source illumination Conoscopic lens system used as fisheye lens 15 display-messtechnik.de
16 16 display-messtechnik.de PSF - LSF Analyis vs. Directional Scanning BRDF = I(θ r θi θ i θ r S = s s y x : S = r r y x R : R x y ( ) = θ s s i y x x arctan x ( ) = θ r r r y x x arctan x PSF = I(θ*(x) ) θ i S x y = s s y x S: = r r y x R : R θ r Method 1 Method 2 θ* > 0 θ* < 0
17 PSF - LSF Analyis vs. Directional Scanning S θ r y R x s = -50 mm, y s = 100 mm x r = 50 mm, y r = 100 mm θ i θ i (x = 0) = 26,56 x BRDF= R sinθr sinθi ( θ ) exp i w Reflectance vs. Theta-r 0,06 0,05 0,04 0,03 0,02 0, Theta-r 80 [ ] display-messtechnik.de
18 PSF - LSF Analyis vs. Directional Scanning S θ r y R x s = -25 mm, y s = 250 mm x r = 25 mm, y r = 250 mm θ i θ i (x = 0) = 5,7 x BRDF= R sinθr sinθi ( θ ) exp i w Reflectance vs. Theta-r 0,06 0,05 0,04 0,03 0,02 0, Theta-r 80 [ ] display-messtechnik.de
19 PSF - LSF Analyis vs. Directional Scanning Difference between the reflectance from PSF and BRDF vs. θ * for two source orientations: θ i (x=0) = 26 and θ i (x=0) = display-messtechnik.de
20 Analyis of Line-Spread Function camera image 2D geometry with narrow linear light source side view intensity profile, i = f(θ * ) 20 display-messtechnik.de
21 Variation with Angle of Incidence Reflectance + Transmittance t (θ i ) r(θ i,θ r ) AG + rear surface In the case of transparent/translucent layers reflection and transmission are closely coupled. Reflectance distribution of an AG layer without (yellow curve) and with rear surface reflection (blue curve); the red curve shows the light source (system signature). 21 display-messtechnik.de
22 Variation with Angle of Incidence Reflectance + Transmittance r(θ i,θ r ) AG + rear surface AG + reduced rear surface Black absorbing layer reduces reflections at the rear surface to ~10% of the original level. Reflectance distribution of an AG layer without (yellow curve) and with rear surface reflection (blue curve); the red curve shows the light source (system signature). 22 display-messtechnik.de
23 Reflectance Distribution Function 23 display-messtechnik.de
24 Reflectance Distribution - Characteristics R s : reflectance in specular direction sample Haze [%] with user selectable windows (width and location) source 24 display-messtechnik.de
25 High-Resolution Scatter Measurement and Evaluation Directional Scanning by PSF / LSF Analysis simple compact measurement setup without moving parts robust apparatus and procedure centered about the specular direction never miss the specular peak! ilmd images directly show "what's going on" very high directional resolution (improvement of ~10) and wide range of directions (cylinder geometry) colorimetric analysis via ilmd or illumination Requirements & Limitations sample must be uniform over area included in the measurement limited range of inclinations centered about specular or wide angular range at reduced resolution (cylinder). Verification by model calculations and other instruments Proc. SID display-messtechnik.de
26 High-Resolution Scatter Measurement and Evaluation Our model calculations show that the effect of the variation of the Fresnel reflection coefficient and that of the shape asymmetry of the reflectance distribution function with angle of incidence on the results obtained by PSF/LSF analysis is negligible for geometries of practical importance, i.e. when a limited angular range about the specular direction (e.g. up to ±20 ) is evaluated for small angles of light incidence (i.e.< 15 ). We thus conclude that scatter evaluation based on analysis of point-spread and/or line-spread functions (reflective and transmissive case) is well suited for accurate, fast and robust evaluation of the glossy scatter of AG layers. Colorimetric analysis is possible with either monochromatic light sources or with imaging colorimeters in combination with white light sources. PSF and LSF analysis with imaging photometers thus offers a realistic alternative to conventional directional scanning with goniometric or conoscopic instruments due to the reduced instrumental efforts without moving parts or demanding optical systems. This approach offers easy alignment of the setup with adaptation to a wide range of incidence angles and fast measurements in combination with high directional resolution. The required uniformity of the samples across the surface area included in the measurement is required anyway for uniform optical appearance of electronic display devices. 26 display-messtechnik.de
27 Evaluation of Image Blur Image Blur Induced by Scattering Anti-Glare Layers distinctness of image - image clarity - image blur M. E. Becker, T. Fink, U. Krüger: Image Blurring Induced by Scattering Anti-Glare Layers, Proc. SID display-messtechnik.de
28 Image Blur Micro-structured, scattering anti-glare layers reduce mirror images, but they also reduce distinctness of (transmitted) image (DOI), image clarity,.... blurred image increasing distance unblurred image scattering AG-layer distance, d 28 display-messtechnik.de
29 Pixel Crosstalk Display Screen without AG-layer contrast = 500 2D impulse response Display Screen witht AG-layer pixel crosstalk T. Fink - SID2016 x 2D impulse response top view cross section 29 display-messtechnik.de
30 Measurement Setup line of sub-pixels contrast lateral dimension 1D impulse response width contrast 1D impulse response x width top view cross section 30 display-messtechnik.de
31 Image Blur Characterization G R B G G G G pixel crosstalk, PCT line spreading level, S LS L s-1 L s L s+1 averaging L' s-1 L' s L' s+1 PCT = L s 1 + L 2 L s s+ 1 S LS = L' s 1 + L' 2 L' s s display-messtechnik.de
32 Pixel-Crosstalk - Line Spreading Horizontal intensity profiles of activated green subpixels of a non-scattering display screen (0.10 mm pixel pitch, with touch panel) recorded with a microscope objective lens. Red curve: green subpixel column without AG-layer. Yellow curve: green subpixels with AG-layer. Blue curve: a pulse illustrating the ideal subpixel profile. 32 display-messtechnik.de
33 Measurement Setup ilmd W lateral dimension difference angle 2 step responses impulse response M ilmd top view cross section x stationary input MTF 33 display-messtechnik.de
34 Pixel-crosstalk vs. line spreading Pixel-crosstalk, PCT, and line spreading levels, S LS, evaluated for eight AG-samples by the authors in two laboratories (Lab-1, Lab-2) with two different instrumental arrangements plotted vs. reflection gloss from Electronic (specifications Displays of 2010: the manufacturer). Matte - Glossy Displays M. E. Becker, T. Fink, U. Krüger: Image Blurring Induced by Scattering Anti-Glare Layers, Proc. SID display-messtechnik.de
35 Characterization of Image Clarity Slanted edge method - ISO (step analysis) From: 3M AG/AS: A single-film solution to glare and sparkle in HD displays 35 display-messtechnik.de
36 Characterization of Image Clarity Pixel crosstalk 2D impulse response Line spread analysis 1D impulse response distance source - AG-layer introduced by Dr. SID2016 introduced here Transmission distribution function line spread analysis conoscopic imaging Modulation transfer factor or function stationary input (grating) Slanted edge method (step analysis) 36 display-messtechnik.de
37 Line Spreading vs. Distance Transmittance Source 0.5mm 1.5 mm 7mm 30mm AG layer close to pixel matrix: pixel crosstalk increasing distance, d s : transmittance distribution 10 general: line spreading function camera 300 pixel same AG layer, transmittance distribution vs. distance to line source, d s Transmittance line spreading functions Source 0.5mm 1.5 mm 7mm 30mm peak vs. distance pixel crosstalk transmittance distribution ds [mm] line source camera 50 pixel display-messtechnik.de
38 Transmittance Distribution Function camera image Camera 2D geometry with narrow linear light source transmitt. distr. function pixel crosstalk side view intensity profile, i = f(θ * ) 38 display-messtechnik.de
39 Scatter Distribution Functions intensity G-Series 1000 conoscopic imaging G G-Series 100 G130 G110 G source θ * [ ] LSF analysis 100 G70 G110 G source θ * [ ] 5 M. E. Becker, T. Fink, U. Krüger: Image Blurring Induced by Scattering Anti-Glare Layers, Proc. SID2016 luminance 39 display-messtechnik.de
40 Scatter Distribution Functions intensity H-Series conoscopic imaging H H-Series 100 H source θ * [ ] 5 LSF analysis H20 10 luminance H5 source θ * [ ] 5 M. E. Becker, T. Fink, U. Krüger: Image Blurring Induced by Scattering Anti-Glare Layers, Proc. SID display-messtechnik.de
41 Specification of Scatter Specification of scattering by generalized haze formalism: H ( α, δ ) I α 2 I + I α α δ + δ = 0 selection of α important; e.g. 1% level.! α δ! 41 display-messtechnik.de
42 Specification of Scatter Specification of scattering by generalized haze formalism: H ( α, δ ) I α 2 I + I α α δ + δ = 0 α δ 42 display-messtechnik.de
43 Scatter Distribution Functions - Transmittance intensity t: transmittance H-Series in regular direction 1000 H Haze [%] with user selectable windows (width and location) source intensity H G-Series θ * [ ] 5 Transmittance distribution functions 1000 G G130 G110 G90 source θ * [ ] 5 43 display-messtechnik.de
44 Idealized Pixel Raster Fast evaluation of DOI-MT vs. pixel density Support of routine evaluations in the laboratory 44 display-messtechnik.de
45 Distinctness of Image - Modulation Transfer glass M 0 avg(max = avg(max i,0 i,0 ) avg(min ) + avg(min i,0 i,0 ) ) M AG = avg(max avg(max i,ag i,ag ) avg(min ) + avg(min i,ag i,ag ) ) DOI-MT = M AG / M 0 45 display-messtechnik.de
46 Modulation vs. Pixel Frequency Modulation Transfer Function 1 0,95 0,9 0,85 85 ppi Modulation vs. pixel frequency AG1 0,8 0,75 AG2 326 ppi 0, cycles 10 / mm Modulation vs. pixel frequency (= 25.4 / pixel density [ppi]) for two low-scatter AG layers. 46 display-messtechnik.de
47 Transmittance in the Regular Direction The transmittance in the regular direction, t, is a sensitive measure for the "clarity" of scattering samples. 0,80 0,75 0,70 t vs. gloss G-Series H-Series 0,65 0,60 0,55 0, gloss 120 [%] 130 Transmittance in the regular direction, t, of eight AG samples vs. gloss level as specified by the manufacturer 100 % ~92 % θ* [ ] Scattering distribution functions close the the regular direction (±0,3 ) ASTM D Standard Test Method for Transparency of Plastic Sheeting A. C. Webber: "Method for the Measurement of Transparency of Sheet Materials", JOSA 47(1957)9, no scattering 100 % <92 % scattering 47 display-messtechnik.de
48 What is Sparkle? Sparkle: disturbing optical effect on direct view displays that are provided with scattering anti-glare (AG) layers. M. E. Becker, J. Neumeier: Optical Characterization of Scattering AG-Layers, Proc. SID'11 48 display-messtechnik.de
49 Visual Perception of Sparkle We do see: statistic intensity (and chromaticity) modulations vs. location on the display, and vs. direction of observation. We do not see: individual pixels of the display screen. AG1 AG2 Sparkle is not restricted to one plane in space. 49 display-messtechnik.de
50 Generation of Sparkle display green Water-droplets sprayed onto an LCD-monitor screen: formation of convex micro-lenses. Refraction explains what we see. display white only green subpixels ON all subpixels ON 50 display-messtechnik.de
51 Sparkle Sparkle: statistic intensity and chromaticity modulations vs. location on the display and vs. direction of observation. surface topography + Generation of sparkle: Superposition of two structured layers, Modulation of transmitted light by refraction, diffraction and scattering. 51 display-messtechnik.de
52 Sparkle Sparkle: statistic intensity modulations vs. location on the display and vs. direction of observation. + Sparkle is distinctly visible with green illumination: Superposition of two structured layers, Modulation of transmitted light by refraction, diffraction and scattering. 52 display-messtechnik.de
53 Sparkle 85 ppi 104 ppi 134 ppi Image of display pixel matrix with sparkle = superposition of regular (pixel matrix) and statistical (sparkle) intensity modulations (with green illumination). 190 ppi 326 ppi 53 display-messtechnik.de
54 Visual Perceptionof Sparkle p d one cycle β [ ] viewing distance, d v Observation condition Adjustment of viewing distance C r = 1,01 to make pixel pattern disappear while sparkle remains visible. f [cycles/ ] = 1/ arctan vis,0 ( p / d ) d v Kathy Mullen: J. Physiol. (1985), 359, pp display-messtechnik.de
55 Periodicities and Frequencies periodicities λ p frequencies Display pixel matrix introduces periodic intensity variations while visual sparkle is caused by statistic intensity modulations (vs. location on the display and vs. direction of observation). Display pixel dimensions range from 0,3 mm (PC desktop monitors for office work) to about 0,07 mm (high resolution display screens for handheld devices). Subpixel dimensions thus are in the range from 0,1 mm to 0,02 mm. Sampling: >5 camera pixels (3.75 µm pixel pitch) per display pixel, up to 1:1 imaging. Surface structures of AG-layer with average wavelengths in the range from 5 µm to 50 µm. 55 display-messtechnik.de
56 Periodicities and Frequencies periodicities λ p frequencies Separation of periodic intensity variations from statistic intensity modulations in order to extract sparkle requires a low-pass filter for the spatial frequencies. 56 display-messtechnik.de
57 Sparkle Evaluation Spatial filtering (convolution) with rational kernel bare pixel matrix without noise filtering Sparkle level = σ / µ σ = 0 pixel matrix with noise filtering Sparkle level = σ / µ σ > 0 57 display-messtechnik.de
58 Sparkle Evaluation Single Image Method (SIM) Difference Image Method (DIM) Record one image of pixel matrix with AG-layer, Record first image of pixel matrix with AG-layer, evaluate pixel ratio (>5). evaluate pixel ratio (>5). Shift AG-layer (some mm). Record second image of pixel matrix with AG-layer. Calculate difference image Apply spatial filtering to remove periodic modulations caused by the pixel matrix of the display.y Evaluate Evaluate Apply spatial filtering to remove periodic modulations caused by the pixel matrix of the display. Sparkle level = σ / m Sparkle level = σ / m 58 display-messtechnik.de
59 Sparkle in the Spatial Domain Pixel matrix of tablet computer, green subpixels only. Pixel pitch = 0.1 mm Pixel matrix of tablet computer, green subpixels only with low-sparkle AG-layer. 59 display-messtechnik.de
60 Sparkle in the Frequency Domain f 0 Result of 2D Fourier transformation of an image of the pixel matrix without AG-layer, Fourier amplitudes (indicated by grey levels with linear scaling) vs. spatial frequencies in x and y-direction with same scaling of frequency axes as below. f 0 amplitudes - linear scaling Result of 2D Fourier transformation of an image of a display with a low sparkle AG-layer, Fourier amplitudes (indicated by grey levels with logarithmic scaling) vs. spatial frequencies in x and y-direction. The length of the arrow represents the spatial frequency at the corresponding azimuth angle, φ. f 0 is the fundamental frequency of the display pixel matrix. amplitudes - log. scaling 60 display-messtechnik.de
61 Sparkle in the Frequency Domain Image 2DFT Filtered Image 2DFT s<1% sparkle offset / bias s = 4.95% s = 6.60% 61 display-messtechnik.de
62 Effect of Filtering in the Frequency Domain 62 display-messtechnik.de
63 Sparkle Evaluation R. Adler, et al.: US Patent , 1990 sparkle = "random moiré" D. R. Cairns, P. Evans: "Laser Speckle of Textured Surfaces: Towards High Performance Anti-Glare Surfaces", Proc. SID2007 laser speckle D. K. P. Huckaby, D. R. Cairns: "Quantifying "Sparkle" of Anti-Glare Surfaces", Proc. SID2009 laser speckle M. E. Becker, J. Neumeier: "Optical Characterization of Scattering Anti-Glare Layers", Proc SID2011 J. Gollier, et al.: "Display Sparkle Measurement and Human Response", Proc. SID2013 T.-W. Hsu, et al.: "Novel Evaluation Method of Sparkle for LCDs with Different Anti-Glare Films", Proc IDW2014 M. E. Becker: JSID 2015, Proc. SID display-messtechnik.de
64 Sparkle Evaluation M. E. Becker, J. Neumeier: "Optical Characterization of Scattering Anti-Glare Layers", Proc SID2011 Spatial filtering with rational kernel matched to display pixel matrix. J. Gollier, et al.: "Display Sparkle Measurement and Human Response", Proc. SID2013 phase Pixel power deviation (PPD): Boundaries between adjacent pixels are identified. Total intensity within each pixel is integrated and normalized by dividing by the pixel powers from the bare pixel matrix image. The standard deviation of the distribution of pixel powers is then calculated to give the PPDr value. T.-W. Hsu, et al.: "Novel Evaluation Method of Sparkle for LCDs with Different Anti-Glare Films", Proc IDW2014 Summation of Fourier amplitudes. Spatial filtering with rational kernel (matched to display pixel matrix) offers highest sparkle sensitivity. 64 display-messtechnik.de
65 Effect of Lens Aperture α: angle subtended by the pupil at the target, aperture angle of the pupil. α viewing distance (VD): 250 mm mm α : min arctan (3 mm / 800 mm) = 0,22 (~13'), α : max arctan (9 mm / 250mm) = 2,06. pupil diameter (PD): 3 mm to 9 mm depending on the state of adaptation. Larger aperture of objective lens averages out directional variations reduction of sparkle level. Pronounced increase of sparkle level with F# (= f / D) can be measured. x 3.5 Only measurements with the same aperture angle should be compared. 65 display-messtechnik.de
66 SMS-1000 Features Measurement and Evaluation of Sparkle (2 methods) Distinctness of Image (MTF) Transmittance Distribution Reflectance Distribution optional microscope head, features continuously expanded. 66 display-messtechnik.de
67 Accessories Microscope head The optional microscope head is provided for detailed photometric analysis of small features, i. e. picture elements (pixels) and sub-pixels of display devices, for example, for evaluation of "pixel crosstalk". It comprises a translational stage with fine adjustment (FA), a photometric camera and a variety of objective lenses with an imaging ratio of 1:2 or 1:4. Pixel pattern matrix replacing actual displays FA Slit mask for transmissive illumination (line source) 67 display-messtechnik.de
68 Sparkle Measurement System SMS-1000 Measurement & Evaluation of Sparkle, DOI (MTF) in transmission, Reflectance distribution function, Transmittance distribution function. 68 display-messtechnik.de
APPLICATION NOTE. New approach for directional analysis of scattered light
APPLICATION NOTE \\ Dr. Martin Wolf, Dr. Michael E. Becker New approach for directional analysis of scattered light This application note describes how the bidirectional scattering distribution function
More informationCouncil for Optical Radiation Measurements (CORM) 2016 Annual Technical Conference May 15 18, 2016, Gaithersburg, MD
Council for Optical Radiation Measurements (CORM) 2016 Annual Technical Conference May 15 18, 2016, Gaithersburg, MD Multispectral measurements of emissive and reflective properties of displays: Application
More informationReflective Illumination for DMS 803 / 505
APPLICATION NOTE // Dr. Michael E. Becker Reflective Illumination for DMS 803 / 505 DHS, SDR, VADIS, PID & PLS The instruments of the DMS 803 / 505 series are precision goniometers for directional scanning
More informationImaging Sphere Measurement of Luminous Intensity, View Angle, and Scatter Distribution Functions
Imaging Sphere Measurement of Luminous Intensity, View Angle, and Scatter Distribution Functions Hubert Kostal, Vice President of Sales and Marketing Radiant Imaging, Inc. 22908 NE Alder Crest Drive, Suite
More informationLight Tec Scattering measurements guideline
Light Tec Scattering measurements guideline 1 Our Laboratory Light Tec is equipped with a Photometric Laboratory (a dark room) including: Goniophotometers: REFLET 180S. High specular bench (10 meters),
More informationMu lt i s p e c t r a l
Viewing Angle Analyser Revolutionary system for full spectral and polarization measurement in the entire viewing angle EZContrastMS80 & EZContrastMS88 ADVANCED LIGHT ANALYSIS by Field iris Fourier plane
More informationLight Tec Scattering measurements guideline
Light Tec Scattering measurements guideline 1 Our Laboratory Light Tec is equipped with a Photometric Laboratory (a dark room) including: Goniophotometers: REFLET 180S. High specular bench (10 meters),
More informationOptics Vac Work MT 2008
Optics Vac Work MT 2008 1. Explain what is meant by the Fraunhofer condition for diffraction. [4] An aperture lies in the plane z = 0 and has amplitude transmission function T(y) independent of x. It is
More informationLight Tec Scattering measurements guideline
Light Tec Scattering measurements guideline 1 2 Light Tec Locations REFLET assembling plant, Aix-en-Provence, France Light Tec GmbH, Munich, Germany German office Light Tec Sarl, Hyères, France Main office
More informationLight Tec Scattering measurements guideline
Light Tec Scattering measurements guideline 1 Our Laboratory Light Tec is equipped with a Photometric Laboratory (a dark room) including: Goniophotometers: REFLET180s. High specular bench (10 meters),
More informationPhysics 214 Midterm Fall 2003 Form A
1. A ray of light is incident at the center of the flat circular surface of a hemispherical glass object as shown in the figure. The refracted ray A. emerges from the glass bent at an angle θ 2 with respect
More informationControl of Light. Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 2007
Control of Light Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 007 Spectro-radiometry Spectral Considerations Chromatic dispersion
More informationInspection Technology Europe BV Allied NDT Engineers
What is Gloss? Gloss is an optical phenomenon caused when evaluating the appearance of a surface. The evaluation of gloss describes the capacity of a surface to reflect directed light. Why is gloss measured?
More informationUNIT VI OPTICS ALL THE POSSIBLE FORMULAE
58 UNIT VI OPTICS ALL THE POSSIBLE FORMULAE Relation between focal length and radius of curvature of a mirror/lens, f = R/2 Mirror formula: Magnification produced by a mirror: m = - = - Snell s law: 1
More informationChapter 8: Physical Optics
Chapter 8: Physical Optics Whether light is a particle or a wave had puzzled physicists for centuries. In this chapter, we only analyze light as a wave using basic optical concepts such as interference
More informationChapter 36. Diffraction. Copyright 2014 John Wiley & Sons, Inc. All rights reserved.
Chapter 36 Diffraction Copyright 36-1 Single-Slit Diffraction Learning Objectives 36.01 Describe the diffraction of light waves by a narrow opening and an edge, and also describe the resulting interference
More informationSecond Year Optics 2017 Problem Set 1
Second Year Optics 2017 Problem Set 1 Q1 (Revision of first year material): Two long slits of negligible width, separated by a distance d are illuminated by monochromatic light of wavelength λ from a point
More informationDiffraction. Single-slit diffraction. Diffraction by a circular aperture. Chapter 38. In the forward direction, the intensity is maximal.
Diffraction Chapter 38 Huygens construction may be used to find the wave observed on the downstream side of an aperture of any shape. Diffraction The interference pattern encodes the shape as a Fourier
More informationUnit 5.C Physical Optics Essential Fundamentals of Physical Optics
Unit 5.C Physical Optics Essential Fundamentals of Physical Optics Early Booklet E.C.: + 1 Unit 5.C Hwk. Pts.: / 25 Unit 5.C Lab Pts.: / 20 Late, Incomplete, No Work, No Units Fees? Y / N 1. Light reflects
More informationExperiment 8 Wave Optics
Physics 263 Experiment 8 Wave Optics In this laboratory, we will perform two experiments on wave optics. 1 Double Slit Interference In two-slit interference, light falls on an opaque screen with two closely
More informationValidation of the Gonioreflectometer
Validation of the Gonioreflectometer Hongsong Li Kenneth E. Torrance PCG-03-2 May 21, 2003 i Abstract This report describes a series of experiments conducted in the Light Measurement Laboratory of the
More informationspecular diffuse reflection.
Lesson 8 Light and Optics The Nature of Light Properties of Light: Reflection Refraction Interference Diffraction Polarization Dispersion and Prisms Total Internal Reflection Huygens s Principle The Nature
More informationLocal Reflection Models
Local Reflection Models Illumination Thus Far Simple Illumination Models Ambient + Diffuse + Attenuation + Specular Additions Texture, Shadows, Used in global algs! (Ray tracing) Problem: Different materials
More informationMode-Field Diameter and Spot Size Measurements of Lensed and Tapered Specialty Fibers
Mode-Field Diameter and Spot Size Measurements of Lensed and Tapered Specialty Fibers By Jeffrey L. Guttman, Ph.D., Director of Engineering, Ophir-Spiricon Abstract: The Mode-Field Diameter (MFD) and spot
More informationAP Physics Problems -- Waves and Light
AP Physics Problems -- Waves and Light 1. 1975-4 (Physical Optics) a. Light of a single wavelength is incident on a single slit of width w. (w is a few wavelengths.) Sketch a graph of the intensity as
More informationPhysical Optics. You can observe a lot just by watching. Yogi Berra ( )
Physical Optics You can observe a lot just by watching. Yogi Berra (1925-2015) OBJECTIVES To observe some interference and diffraction phenomena with visible light. THEORY In a previous experiment you
More informationLIGHT SCATTERING THEORY
LIGHT SCATTERING THEORY Laser Diffraction (Static Light Scattering) When a Light beam Strikes a Particle Some of the light is: Diffracted Reflected Refracted Absorbed and Reradiated Reflected Refracted
More informationDMS 803 FEATURES OPTIONS GONIOMETER SYSTEM FOR COMPLETE DISPLAY CHARACTERIZATION
GONIOMETER SYSTEM FOR COMPLETE DISPLAY CHARACTERIZATION Turnkey solution with motorized scanning for detailed electro-optical display characterization for quality control, research and development. FEATURES
More informationChapter 35 &36 Physical Optics
Chapter 35 &36 Physical Optics Physical Optics Phase Difference & Coherence Thin Film Interference 2-Slit Interference Single Slit Interference Diffraction Patterns Diffraction Grating Diffraction & Resolution
More informationChapter 38. Diffraction Patterns and Polarization
Chapter 38 Diffraction Patterns and Polarization Diffraction Light of wavelength comparable to or larger than the width of a slit spreads out in all forward directions upon passing through the slit This
More informationLight Tec. Characterization of ultra-polished surfaces in UV and IR. ICSO October 2016 Biarritz, France
ICSO 2016 17-21 October 2016 Biarritz, France Light Tec Characterization of ultra-polished surfaces in UV and IR Quentin Kuperman, Author, Technical Manager Yan Cornil, Presenter, CEO Workshop 2016, 12/09
More informationTutorial Solutions. 10 Holographic Applications Holographic Zone-Plate
10 Holographic Applications 10.1 Holographic Zone-Plate Tutorial Solutions Show that if the intensity pattern for on on-axis holographic lens is recorded in lithographic film, then a one-plate results.
More informationWHITE PAPER. Application of Imaging Sphere for BSDF Measurements of Arbitrary Materials
Application of Imaging Sphere for BSDF Measurements of Arbitrary Materials Application of Imaging Sphere for BSDF Measurements of Arbitrary Materials Abstract BSDF measurements are broadly applicable to
More informationAll forms of EM waves travel at the speed of light in a vacuum = 3.00 x 10 8 m/s This speed is constant in air as well
Pre AP Physics Light & Optics Chapters 14-16 Light is an electromagnetic wave Electromagnetic waves: Oscillating electric and magnetic fields that are perpendicular to the direction the wave moves Difference
More informationCS 5625 Lec 2: Shading Models
CS 5625 Lec 2: Shading Models Kavita Bala Spring 2013 Shading Models Chapter 7 Next few weeks Textures Graphics Pipeline Light Emission To compute images What are the light sources? Light Propagation Fog/Clear?
More informationAP* Optics Free Response Questions
AP* Optics Free Response Questions 1978 Q5 MIRRORS An object 6 centimeters high is placed 30 centimeters from a concave mirror of focal length 10 centimeters as shown above. (a) On the diagram above, locate
More informationApplication Note. Measuring the Geometric Attributes of Your Products AN
Application Note AN 1007.01 Measuring the Geometric Attributes of Your Products Abstract Consumers have a choice and when all other factors are equal, they buy what looks best. All industries are concerned
More informationOptimized Design of 3D Laser Triangulation Systems
The Scan Principle of 3D Laser Triangulation Triangulation Geometry Example of Setup Z Y X Target as seen from the Camera Sensor Image of Laser Line The Scan Principle of 3D Laser Triangulation Detektion
More informationScattering measurements. Guidelines for measurements service
Scattering measurements Guidelines for measurements service 1 Content Introduction Light Tec Presentation Instruments availalable. Scattering measurements Refelctors Diffusers Colors issuses Volume Scattering
More information13. Brewster angle measurement
13. Brewster angle measurement Brewster angle measurement Objective: 1. Verification of Malus law 2. Measurement of reflection coefficient of a glass plate for p- and s- polarizations 3. Determination
More informationOPTI-521 Graduate Report 2 Matthew Risi Tutorial: Introduction to imaging, and estimate of image quality degradation from optical surfaces
OPTI-521 Graduate Report 2 Matthew Risi Tutorial: Introduction to imaging, and estimate of image quality degradation from optical surfaces Abstract The purpose of this tutorial is to introduce the concept
More informationHigh spatial resolution measurement of volume holographic gratings
High spatial resolution measurement of volume holographic gratings Gregory J. Steckman, Frank Havermeyer Ondax, Inc., 8 E. Duarte Rd., Monrovia, CA, USA 9116 ABSTRACT The conventional approach for measuring
More informationSupplementary Figure 1 Optimum transmissive mask design for shaping an incident light to a desired
Supplementary Figure 1 Optimum transmissive mask design for shaping an incident light to a desired tangential form. (a) The light from the sources and scatterers in the half space (1) passes through the
More informationTwo slit interference - Prelab questions
Two slit interference - Prelab questions 1. Show that the intensity distribution given in equation 3 leads to bright and dark fringes at y = mλd/a and y = (m + 1/2) λd/a respectively, where m is an integer.
More informationChapter 82 Example and Supplementary Problems
Chapter 82 Example and Supplementary Problems Nature of Polarized Light: 1) A partially polarized beam is composed of 2.5W/m 2 of polarized and 4.0W/m 2 of unpolarized light. Determine the degree of polarization
More informationCompact Multilayer Film Structure for Angle Insensitive. Color Filtering
1 Compact Multilayer Film Structure for Angle Insensitive Color Filtering Chenying Yang, Weidong Shen*, Yueguang Zhang, Kan Li, Xu Fang, Xing Zhang, and Xu Liu * E-mail: adongszju@hotmail.com
More informationFormulas of possible interest
Name: PHYS 3410/6750: Modern Optics Final Exam Thursday 15 December 2011 Prof. Bolton No books, calculators, notes, etc. Formulas of possible interest I = ɛ 0 c E 2 T = 1 2 ɛ 0cE 2 0 E γ = hν γ n = c/v
More informationRay Optics I. Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex
Phys 531 Lecture 8 20 September 2005 Ray Optics I Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex Today shift gears, start applying
More informationDownloaded from UNIT 06 Optics
1 Mark UNIT 06 Optics Q1: A partially plane polarised beam of light is passed through a polaroid. Show graphically the variation of the transmitted light intensity with angle of rotation of the Polaroid.
More informationSimple Spectrograph. grating. slit. camera lens. collimator. primary
Simple Spectrograph slit grating camera lens collimator primary Notes: 1) For ease of sketching, this shows a transmissive system (refracting telescope, transmission grating). Most telescopes use a reflecting
More informationTextbook Reference: Physics (Wilson, Buffa, Lou): Chapter 24
AP Physics-B Physical Optics Introduction: We have seen that the reflection and refraction of light can be understood in terms of both rays and wave fronts of light. Light rays are quite compatible with
More informationMag.x system 125 A new high end modular microscope. Dr. Ralf Großkloß QIOPTIQ
Mag.x system 125 A new high end modular microscope Dr. Ralf Großkloß QIOPTIQ Mag.x system 125 A new high end modular microscope Dr. Ralf Großkloß QIOPTIQ Resolution Speed Sensitivity Qioptiq 2011 3 Optical
More informationWave Phenomena Physics 15c. Lecture 19 Diffraction
Wave Phenomena Physics 15c Lecture 19 Diffraction What We Did Last Time Studied interference > waves overlap Amplitudes add up Intensity = (amplitude) does not add up Thin-film interference Reflectivity
More informationChapter 37. Interference of Light Waves
Chapter 37 Interference of Light Waves Wave Optics Wave optics is a study concerned with phenomena that cannot be adequately explained by geometric (ray) optics These phenomena include: Interference Diffraction
More informationIntermediate Physics PHYS102
Intermediate Physics PHYS102 Dr Richard H. Cyburt Assistant Professor of Physics My office: 402c in the Science Building My phone: (304) 384-6006 My email: rcyburt@concord.edu My webpage: www.concord.edu/rcyburt
More informationReflection and Refraction of Light
PC1222 Fundamentals of Physics II Reflection and Refraction of Light 1 Objectives Investigate for reflection of rays from a plane surface, the dependence of the angle of reflection on the angle of incidence.
More informationMICHELSON S INTERFEROMETER
MICHELSON S INTERFEROMETER Objectives: 1. Alignment of Michelson s Interferometer using He-Ne laser to observe concentric circular fringes 2. Measurement of the wavelength of He-Ne Laser and Na lamp using
More information: Imaging Systems Laboratory II. Laboratory 2: Snell s Law, Dispersion and the Prism March 19 & 21, n 1 n 2
05-3: Imaging Systems Laboratory II Laboratory : Snell s Law, Dispersion and the Prism March 9 &, 00 Abstract. This laboratory exercise will demonstrate two basic properties of the way light interacts
More information10.4 Interference in Thin Films
0. Interference in Thin Films You have probably noticed the swirling colours of the spectrum that result when gasoline or oil is spilled on water. And you have also seen the colours of the spectrum shining
More informationReview Session 1. Dr. Flera Rizatdinova
Review Session 1 Dr. Flera Rizatdinova Summary of Chapter 23 Index of refraction: Angle of reflection equals angle of incidence Plane mirror: image is virtual, upright, and the same size as the object
More informationModeling Custom Surface Roughness with LucidShape 2D Scatter Curve BSDF Material
WHITE PAPER Modeling Custom Surface Roughness with LucidShape 2D Scatter Curve BSDF Material Author Andreas Bielawny, Ph.D. CAE Synopsys, Inc. Abstract LucidShape accurately simulates how light interacts
More informationChapter 37. Wave Optics
Chapter 37 Wave Optics Wave Optics Wave optics is a study concerned with phenomena that cannot be adequately explained by geometric (ray) optics. Sometimes called physical optics These phenomena include:
More informationSimulating Gloss of Curved Paper by Using the Point Spread Function of Specular Reflection
Simulating Gloss of Curved Paper by Using the Point Spread Function of Specular Reflection Norimichi Tsumura*, Kaori Baba*, and Shinichi Inoue** *Department of Information and Image Sciences, Chiba University,
More informationCSE 167: Lecture #7: Color and Shading. Jürgen P. Schulze, Ph.D. University of California, San Diego Fall Quarter 2011
CSE 167: Introduction to Computer Graphics Lecture #7: Color and Shading Jürgen P. Schulze, Ph.D. University of California, San Diego Fall Quarter 2011 Announcements Homework project #3 due this Friday,
More informationLab 5: Diffraction and Interference
Lab 5: Diffraction and Interference Light is a wave, an electromagnetic wave, and under the proper circumstances, it exhibits wave phenomena, such as constructive and destructive interference. The wavelength
More informationChapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena
Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics
More informationChapter 36. Diffraction. Dr. Armen Kocharian
Chapter 36 Diffraction Dr. Armen Kocharian Diffraction Light of wavelength comparable to or larger than the width of a slit spreads out in all forward directions upon passing through the slit This phenomena
More informationIntroduction. Part I: Measuring the Wavelength of Light. Experiment 8: Wave Optics. Physics 11B
Physics 11B Experiment 8: Wave Optics Introduction Equipment: In Part I you use a machinist rule, a laser, and a lab clamp on a stand to hold the laser at a grazing angle to the bench top. In Part II you
More informationSpectrographs. C. A. Griffith, Class Notes, PTYS 521, 2016 Not for distribution.
Spectrographs C A Griffith, Class Notes, PTYS 521, 2016 Not for distribution 1 Spectrographs and their characteristics A spectrograph is an instrument that disperses light into a frequency spectrum, which
More informationScience of Appearance
Science of Appearance Color Gloss Haze Opacity ppt00 1 1 Three Key Elements Object Observer Light Source ppt00 2 2 1 What happens when light interacts with an Object? Reflection Refraction Absorption Transmission
More informationFRESNEL LENS DIMENSIONS USING 3D PROFILOMETRY
FRESNEL LENS DIMENSIONS USING 3D PROFILOMETRY Prepared by Duanjie Li & Benjamin Mell 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials.
More informationPHYS 3410/6750: Modern Optics Midterm #2
Name: PHYS 3410/6750: Modern Optics Midterm #2 Wednesday 16 November 2011 Prof. Bolton Only pen or pencil are allowed. No calculators or additional materials. PHYS 3410/6750 Fall 2011 Midterm #2 2 Problem
More informationReprint. from the Journal. of the SID
A 23-in. full-panel-resolution autostereoscopic LCD with a novel directional backlight system Akinori Hayashi (SID Member) Tomohiro Kometani Akira Sakai (SID Member) Hiroshi Ito Abstract An autostereoscopic
More informationLecture 4 Recap of PHYS110-1 lecture Physical Optics - 4 lectures EM spectrum and colour Light sources Interference and diffraction Polarization
Lecture 4 Recap of PHYS110-1 lecture Physical Optics - 4 lectures EM spectrum and colour Light sources Interference and diffraction Polarization Lens Aberrations - 3 lectures Spherical aberrations Coma,
More informationOPTICS MIRRORS AND LENSES
Downloaded from OPTICS MIRRORS AND LENSES 1. An object AB is kept in front of a concave mirror as shown in the figure. (i)complete the ray diagram showing the image formation of the object. (ii) How will
More informationRay Optics. Lecture 23. Chapter 23. Physics II. Course website:
Lecture 23 Chapter 23 Physics II Ray Optics Course website: http://faculty.uml.edu/andriy_danylov/teaching/physicsii Let s finish talking about a diffraction grating Diffraction Grating Let s improve (more
More informationWaves & Oscillations
Physics 42200 Waves & Oscillations Lecture 37 Interference Spring 2016 Semester Matthew Jones Multiple Beam Interference In many situations, a coherent beam can interfere with itself multiple times Consider
More informationINTERFERENCE. where, m = 0, 1, 2,... (1.2) otherwise, if it is half integral multiple of wavelength, the interference would be destructive.
1.1 INTERFERENCE When two (or more than two) waves of the same frequency travel almost in the same direction and have a phase difference that remains constant with time, the resultant intensity of light
More informationSimulating Gloss of Curved Paper by Using the Point Spread Function of Specular Reflection
25 Bull. Soc. Photogr. Imag. Japan. (2015) Vol. 25 No. 2: 25 30 Original Paper Simulating Gloss of Curved Paper by Using the Point Spread Function of Specular Reflection Norimichi Tsumura*, Kaori Baba*,
More informationNeurophysical Model by Barten and Its Development
Chapter 14 Neurophysical Model by Barten and Its Development According to the Barten model, the perceived foveal image is corrupted by internal noise caused by statistical fluctuations, both in the number
More informationRendering Light Reflection Models
Rendering Light Reflection Models Visual Imaging in the Electronic Age Donald P. Greenberg October 3, 2017 Lecture #13 Program of Computer Graphics, Cornell University General Electric - 167 Cornell in
More informationProtocol for Lab. Fundamentals
Protocol for Lab Fundamentals Content 1. Beam propagation, law of reflection, and Snellius law... 3 1.1. Air-metal and air-plexiglass transition... 3 1.2. Air-water... 3 1.3. Plexiglass-water... 3 1.4.
More informationCOLOR HELPS TO SELL VEHICLES
COLOR HELPS TO SELL VEHICLES Like/Dislike decisions made in seconds 40% of buyers will choose a different vehicle if their color choice is not available. Emotional connection with owner 1 VEHICLE DESIGN
More informationPoint Spread Function of Specular Reflection and Gonio-Reflectance Distribution 1
Journal of Imaging Science and Technology R 59(1): 010501-1 010501-10, 2015. c Society for Imaging Science and Technology 2015 Point Spread Function of Specular Reflection and Gonio-Reflectance Distribution
More informationDIFFRACTION 4.1 DIFFRACTION Difference between Interference and Diffraction Classification Of Diffraction Phenomena
4.1 DIFFRACTION Suppose a light wave incident on a slit AB of sufficient width b, as shown in Figure 1. According to concept of rectilinear propagation of light the region A B on the screen should be uniformly
More informationThe Rendering Equation. Computer Graphics CMU /15-662
The Rendering Equation Computer Graphics CMU 15-462/15-662 Review: What is radiance? Radiance at point p in direction N is radiant energy ( #hits ) per unit time, per solid angle, per unit area perpendicular
More informationRodenstock Products Photo Optics / Digital Imaging
Go to: Apo-Sironar digital Apo-Macro-Sironar digital Apo-Sironar digital HR Lenses for Digital Professional Photography Digital photography may be superior to conventional photography if the end-product
More informationDraft SPOTS Standard Part III (7)
SPOTS Good Practice Guide to Electronic Speckle Pattern Interferometry for Displacement / Strain Analysis Draft SPOTS Standard Part III (7) CALIBRATION AND ASSESSMENT OF OPTICAL STRAIN MEASUREMENTS Good
More informationGeometrical Optics INTRODUCTION. Wave Fronts and Rays
Geometrical Optics INTRODUCTION In this experiment, the optical characteristics of mirrors, lenses, and prisms will be studied based on using the following physics definitions and relationships plus simple
More informationPolarization of light
Polarization of light TWO WEIGHTS RECOMENDED READINGS 1) G. King: Vibrations and Waves, Ch.5, pp. 109-11. Wiley, 009. ) E. Hecht: Optics, Ch.4 and Ch.8. Addison Wesley, 00. 3) PASCO Instruction Manual
More informationSURFACE BOUNDARY MEASUREMENT USING 3D PROFILOMETRY
SURFACE BOUNDARY MEASUREMENT USING 3D PROFILOMETRY Prepared by Craig Leising 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2013
More information2/26/2016. Chapter 23 Ray Optics. Chapter 23 Preview. Chapter 23 Preview
Chapter 23 Ray Optics Chapter Goal: To understand and apply the ray model of light. Slide 23-2 Chapter 23 Preview Slide 23-3 Chapter 23 Preview Slide 23-4 1 Chapter 23 Preview Slide 23-5 Chapter 23 Preview
More informationHOLOEYE Photonics. HOLOEYE Photonics AG. HOLOEYE Corporation
HOLOEYE Photonics Products and services in the field of diffractive micro-optics Spatial Light Modulator (SLM) for the industrial research R&D in the field of diffractive optics Micro-display technologies
More informationClass 11 Introduction to Surface BRDF and Atmospheric Scattering. Class 12/13 - Measurements of Surface BRDF and Atmospheric Scattering
University of Maryland Baltimore County - UMBC Phys650 - Special Topics in Experimental Atmospheric Physics (Spring 2009) J. V. Martins and M. H. Tabacniks http://userpages.umbc.edu/~martins/phys650/ Class
More informationDMS 201 FEATURES LOW-COST MANUAL GONIOMETER SYSTEM
light measurement DMS 201 LOW-COST MANUAL GONIOMETER SYSTEM Turnkey solution for electrooptical display characterization for quality control, research and development. FEATURES Measurement and evaluation
More informationDMS 903 FEATURES GONIOMETER SYSTEM FOR COMPLETE DISPLAY CHARACTERIZATION
light measurement DMS 903 GONIOMETER SYSTEM FOR COMPLETE DISPLAY CHARACTERIZATION Turnkey solution with motorized scanning for detailed electrooptical display characterization of large-area displays for
More informationImproving the 3D Scan Precision of Laser Triangulation
Improving the 3D Scan Precision of Laser Triangulation The Principle of Laser Triangulation Triangulation Geometry Example Z Y X Image of Target Object Sensor Image of Laser Line 3D Laser Triangulation
More informationCoupling of surface roughness to the performance of computer-generated holograms
Coupling of surface roughness to the performance of computer-generated holograms Ping Zhou* and Jim Burge College of Optical Sciences, University of Arizona, Tucson, Arizona 85721, USA *Corresponding author:
More informationPolarization of Light
Polarization of Light Introduction Light, viewed classically, is a transverse electromagnetic wave. Namely, the underlying oscillation (in this case oscillating electric and magnetic fields) is along directions
More informationGeometrical modeling of light scattering from paper substrates
Geometrical modeling of light scattering from paper substrates Peter Hansson Department of Engineering ciences The Ångström Laboratory, Uppsala University Box 534, E-75 Uppsala, weden Abstract A light
More information