R-CAR GEN3: COMPUTING PLATFORM FOR AUTONOMOUS DRIVING ERA
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1 R-CAR GEN3: COMPUTING PLATFORM FOR AUTONOMOUS DRIVING ERA Mitsuhiko Igarashi, Toyokazu Hori, Yoshihiko Hotta, Kazuki Fukuoka and Hirotaka Hara AUTOMOTIVE SOLUTION BIZ. UNIT, RENESAS ELECTRONICS CORPORATION 2017 Renesas Electronics Corporation. All rights reserved. Page 1
2 Outline Renesas Autonomy : ADAS/Autonomous Driving Platform Autonomous Driving Challenges and Feature of R-Car H3 Level 4 Autonomous driving Concept Car Concept of Reliability Management for future auto. driving usage 2017 Renesas Electronics Corporation. All rights reserved. Page 2 BIG IDEAS FOR EVERY SPACE
3 NEW RENESAS CONCEPT FOR AUTONOMOUS DRIVING END TO END SOLUTION FROM CLOUD SERVICE TO SENSING AND VEHICLE CONTROL CONTRIBUTE TO NEXT AUTONOMOUS DRIVING SOCIETY Global No.1 share in vehicle MCU No.1 Promote end to end solution in collaboration with many global partners 2017 Renesas Electronics Corporation. All rights reserved. Page 3 BIG IDEAS FOR EVERY SPACE
4 SENSING &COGNITIVE SOLUTION FOR AUTONOMOUS DRIVING Scalable solution for sensing (Camera/Rader) and Cognitive from Level2/3 to Level 4/ Renesas Electronics Corporation. All rights reserved. Page 4 BIG IDEAS FOR EVERY SPACE
5 Outline Renesas Autonomy : ADAS/Autonomous Driving Platform Autonomous Driving Challenges and Feature of R-Car H3 Level 4 Autonomous driving Concept Car Concept of Reliability Management for future auto. driving usage 2017 Renesas Electronics Corporation. All rights reserved. Page 5 BIG IDEAS FOR EVERY SPACE
6 Autonomous Driving Challenges for LSI Automotive High Reliability Hardware Low power Functional Safety Availability & Fail Operational 2017 Renesas Electronics Corporation. All rights reserved. Page 6 BIG IDEAS FOR EVERY SPACE
7 Solutions for Performance and Low Power by R-Car Performance at Low power Allocate each process to suitable automotive engines/processors Several power management techniques Real time operation : Parallel processing preferred bus network / HW assist virtualization Video processing Image recognition Optimization problem Planning Virtualization Sensor into processing GFX processing OS OS OS Video processing engine Image recognition engine (IMP) FPU Cortex A57 x 4 Cortex A53 x 4 Cortex R7 x 1 GPU/ GPGPU High speed bus network optimized for parallel processing Power management R-Car H Renesas Electronics Corporation. All rights reserved. Page 7 BIG IDEAS FOR EVERY SPACE
8 Several Power Management Techniques for Low Power Power gating : 21 power gated domains control, introduce each cluster shutdown for GPU Dynamic Voltage Frequency Scaling / Adaptive Voltage Scaling to CPU and GPU OS DVFS control AVS control Voltage controller PSW controller CLK controller on/off cpuclk CPU0 L1$ PMIC CPU1 L1$ variable voltage (VDD_DVFS) CPU2 L1$ CortexA57 PD1-5 CPU3 L1$ cl0 #0 #1 cl1 #2 #3 PD6-9 cl2 #4 #5 GPU Fixed voltage PD21 PSW control gpuclk Common L2$ Common Thermal control Delay Monitor Thermal Monitor Delay Monitor Thermal Monitor PSW : Power Switch 2017 Renesas Electronics Corporation. All rights reserved. Page 8 BIG IDEAS FOR EVERY SPACE
9 Power Management for Functional Safety Power management with several on chip monitor for several time scale events Introduce voltage droop prediction and recovery technique with droop monitor [1] Fuse delay_th vup vdown PLL N/32 Div dly ctrl #count cpu_clk Delay Delay Monitor Monitor 11 stop noncpu clk PMIC VDD_DVFS Level Target Vmin Used monitor Control 2 DC operation Delay monitor 1 AC(>1MHz) operation Droop monitor 0 Monitor Vmin Voltage monitor voltage up Clock stop & restart System shutdown clk ctrl stop_clear Droop Monitor Droop Monitor CPU0 clk CPU1 clk 140mV VDD_DVFS Level:2 Level:1 Level:0 Ts=1.6us Ts=667ps voltage reg Voltage Monitor vcpu_mon test 0yr keyon keyoff 15yr Time [1] C. Takahashi et al., ISSCC, Renesas Electronics Corporation. All rights reserved. Page 9 BIG IDEAS FOR EVERY SPACE
10 VCODE Power Management for Functional Safety and Run-time Test Droop prediction technique can prevent the failure caused by voltage droop Wear-out faults detection by run-time test Measurement condition Measurement Result Droop monitor 667ps : GPU running : Run-time test : Voltage monitoring : Collect Min. Vcode and Display 10 5 Large droop Time [sec] Measured w/o prediction predicted w/ prediction 4 cycle prediction 2017 Renesas Electronics Corporation. All rights reserved. Page 10 BIG IDEAS FOR EVERY SPACE
![Voltage Droop Improvement [mv] Reliability Aware Droop Mitigation with MIM Satisfy both voltage droop reduction with MIM and automotive reliability grade by Dedicated ESD protection for MIM (AEC-Q100](/docs-images/79/80096020/images/11-1.jpg "capable) MIM area optimization of CPU and GPU MIM cap Dedicated ESD protection GPU CPU 20.0 18.0 16.0 14.0 12.0 10.0 8.0 6.0 4.0 2.0 0.0 16mV improvement Failure rate limit 0.0 50.0 100.0 150.0 200.")
11 Voltage Droop Improvement [mv] Reliability Aware Droop Mitigation with MIM Satisfy both voltage droop reduction with MIM and automotive reliability grade by Dedicated ESD protection for MIM (AEC-Q100 capable) MIM area optimization of CPU and GPU MIM cap Dedicated ESD protection GPU CPU mV improvement Failure rate limit MiM Cap [nf] 2017 Renesas Electronics Corporation. All rights reserved. Page 11 BIG IDEAS FOR EVERY SPACE
12 Reliability Aware Droop Mitigation with MIM Introducing MIM IDDQ testing enable early failure rejection of MIM Emphasize only MIM short current MIM cap failure model Global metal VSS VDD MIM Short current Conventional IDDQ test MIM IDDQ test VDD Large leakage VDD Suppress Current Emphasize Current CPU MIM Short current CPU Leakage emphasizer MIM VSS VSS 2017 Renesas Electronics Corporation. All rights reserved. Page 12 BIG IDEAS FOR EVERY SPACE
13 Outline Renesas Autonomy : ADAS/Autonomous Driving Platform Autonomous Driving Challenges and Feature of R-Car H3 Level 4 Autonomous driving Concept Car Concept of Reliability Management for future auto. driving usage 2017 Renesas Electronics Corporation. All rights reserved. Page 13 BIG IDEAS FOR EVERY SPACE
14 Renesas Concept Car for Level 4 Autonomous Driving Level 4 driving with redundancy at 25 Watts Renesas NVIDIA NXP HAD x 2 (H3 x 4 + MCU x 2) Drive PX2 (Parker x 2 + Pascal GPU x 2) BlueBox (QorIQ LS2088A) 25 W 250 W *1 40 W *2 *1 *2 arm-processors/s32-arm-processors-microcontrollers/bluebox-autonomous-driving-platform-s32vls2-rdb:s32vls2-rdb 2017 Renesas Electronics Corporation. All rights reserved. Page 14 BIG IDEAS FOR EVERY SPACE
15 Renesas Concept Car : Fail Operation Fail operation tolerant by ASIL-D MCU (RH850) and triple redundant H3 system Control the car to move to the safety zone when the failure is detected Failure Renesas Electronics Corporation. All rights reserved. Page 15 BIG IDEAS FOR EVERY SPACE
16 Outline Renesas Autonomy : ADAS/Autonomous Driving Platform Autonomous Driving Challenges and Feature of R-Car H3 Level 4 Autonomous driving Concept Car Concept of Reliability Management for future auto. driving usage 2017 Renesas Electronics Corporation. All rights reserved. Page 16 BIG IDEAS FOR EVERY SPACE
17 Big Waves in the Future Automotive Owner Driven Car Owner Driven Car Mobility Service Car Mobility Service Car Level2/3 (Level4) Level4/5 (Driverless) Reduce Car Accident Complete Safety Driving pleasure Service pleasure Convenience for Driver Economic efficiency ( EV Range, Function vs cost ) Mobility convenience Cloud Service model 2017 Renesas Electronics Corporation. All rights reserved. Page 17 BIG IDEAS FOR EVERY SPACE
18 Connected Car Solution with Cloud Service Renesas can link all information to Cloud from control (RH850) to car information (R-Car). One of important Service is Vehicle quality Enhancement for Service Car Service Data 1) 2017 Renesas Electronics Corporation. All rights reserved. Page 18 BIG IDEAS FOR EVERY SPACE
19 Annual mileage Car Usage Challenges in Future Autonomous Driving Era What will happen at fully automated driving era? Increase an annual mileage dramatically Reliability enhancement will be one of key challenge Operation rate ~ 50% Operation rate < 10% *1 Owner car *1 Automotive Electronics Council, "Failure Mechanism Based Stress Test Qualification for Integrated Circuits, AEC-Q100 Rev-H, 2014 Ride sharing etc. Mobility Service Car with level 5 auto. driving + EV 2017 Renesas Electronics Corporation. All rights reserved. Page 19 BIG IDEAS FOR EVERY SPACE
20 Log(BTI lifetime) Operation frequency Log(BTI lifetime) Thermal design power Log(BTI lifetime) Trade-off between Reliability Enhancement and Performance Handling of operation temperature, voltage and aging variation further optimize reliability Low temp. limitation and low volt. operation may restrict the performance Propose concept of reliability management for further LSI reliability enhancement Voltage Temperature Aging variation Frequency down Performance restriction ~30x ~ 2x Lifetime by - 20 mv ~ 3x Lifetime by - 15 deg C Volt. Temp. -3σ 3σ BTI : Bias Temperature Instability 2017 Renesas Electronics Corporation. All rights reserved. Page 20 BIG IDEAS FOR EVERY SPACE
21 Reliability Management Concept ~ Static AVGS One of key reliability item is BTI/HCI degradation Lifetime odometer (LTO) monitors BTI/HCI degradation per chip Delay monitor and LTO detect Process variation and Aging variation at testing Static Adaptive Voltage Guardband Scaling (AVGS) Chip CPU GPU Delay Monitor Lifetime Odometer Fuse Fuse F_fresh ΔF_aged P-code A-code Tester P-code (Process) Burn-in A-code (Aging) After Burn-in Before Burn-in BTI : Bias Temperature Instability HCI : Hot Carrier Injection 2017 Renesas Electronics Corporation. All rights reserved. Page 21 BIG IDEAS FOR EVERY SPACE
22 Reliability Management Concept ~ Static AVGS Static AVGS optimize Voltage Guardband (VGB) chip by chip with reflecting Operation Voltage difference (by P-code) Aging variation difference (by A-code) 20 mv lower operation extend lifetime at SS chip with negligible yield loss by LTO Voltage 0 Static AVGS setting Conv. AVS setting Optimized by P-code Vmin w/o aging Adjusted by A-code Aging Guardband SS TT FF SS/TT/FF : Slow/Typical/Fast Chip 2017 Renesas Electronics Corporation. All rights reserved. Page 22 BIG IDEAS FOR EVERY SPACE
23 Dynamic AVGS ΔVDD Reliability Management Concept ~ Dynamic AVGS Dynamic voltage control based on P&A-code and lifetime prediction extend lifetime of chip with initial low volt. (TT~FF chip) Dynamic-AVGS and Adaptive Thermal Control Lifetime odometer Thermal Sensor Thermal Sensor System controller ΔF Volt. Tj PG, DVFS Lifetime prediction Log Adaptive Thermal Control Deep learning VGB ΔVDD for aging Lifetime extension with dynamic-avgs FF Chip VGB threshold Lifetime extended +30mV P-code (Fuse) A-code (Fuse) Process code Aging code 1.2K 12K 120K Effective stress time T [hrs] External flash 2017 Renesas Electronics Corporation. All rights reserved. Page 23 BIG IDEAS FOR EVERY SPACE
24 Reliability Management Concept ~ Dynamic AVGS Adaptive thermal control based on P-code extend lifetime of chip with low leakage (SS~TT) Dynamic-AVGS and Adaptive Thermal Control Lifetime odometer Thermal Sensor Thermal Sensor System controller ΔF Volt. Tj PG, DVFS Lifetime prediction Log Adaptive Thermal Control Deep learning VGB ΔVDD for aging Tj relaxation of low leakage chip P-code (Fuse) A-code (Fuse) Process code Aging code External flash 2017 Renesas Electronics Corporation. All rights reserved. Page 24 BIG IDEAS FOR EVERY SPACE
![Frequency degradation [%] Reliability Management Concept ~ Result 5.](/docs-images/79/80096020/images/25-1.jpg "6x lifetime in total without performance degradation realize ~ 50% operation rate Measured result of Lifetime Odometer Total lifetime extension 12K hrs (AEC-Q100) 67.")
25 Frequency degradation [%] Reliability Management Concept ~ Result 5.6x lifetime in total without performance degradation realize ~ 50% operation rate Measured result of Lifetime Odometer Total lifetime extension 12K hrs (AEC-Q100) 67.2K hrs NBTI sensitive osc Burn-in stress -20mV -20mV &-15C 2x 5.6x 2.6x INV based osc [hrs] Power on time Field lifetime Duty ratio 12 K hrs 15 years 9.1% 67.2 K hrs 15 years 51.1% 2017 Renesas Electronics Corporation. All rights reserved. Page 25 BIG IDEAS FOR EVERY SPACE
26 Summary Renesas Autonomy : Total solution for auto. driving computing platform R-Car H3 satisfy all of Performance, Low power, Functional safety and Reliability Demonstrate Renesas concept car for level 4 autonomous driving 25 W with triple redundant H3 and ASIL-D MCU system Introduce concept of reliability management for future auto. driving usage 2017 Renesas Electronics Corporation. All rights reserved. Page 26 BIG IDEAS FOR EVERY SPACE
27 BACKUP 2017 Renesas Electronics Corporation. All rights reserved. Page 27 BIG IDEAS FOR EVERY SPACE
28 Definition of Levels of Driving Automation by SAE International Source : SAE International J3016, Sep Renesas Electronics Corporation. All rights reserved. Page 28 BIG IDEAS FOR EVERY SPACE
29 BIG IDEAS FOR EVERY SPACE Renesas.com 2017 Renesas Electronics Corporation. All rights reserved. Page 29
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