What s new in IC-CAP 2009?

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1 What s new in IC-CAP 2009? Overview of the new features included in the upcoming release September 2009 Device Modeling Marketing Team Agilent EEsof EDA IC-CAP 2009 Release Page 1 Doc Version 1.4

2 Agenda IC-CAP 2009 New Features at glance The Corner and BSIMSOI4 Extraction Packages Other features in details Page 2

3 Agilent s IC-CAP Recent History Page 3

4 IC-CAP 2009 new features at glance Turn-key add-on products: Agilent 85199M Corner Modeling Extraction Package (new) o Includes library importer, corner tool and automated test suite simulation library verification Agilent 85194N BSIMSOI4 CMOS Extraction Package (new) Agilent 85194P PSP Extraction Package now supports global extraction (upgrade) New environment/platform features: New UI Technology improves usability, efficiency and look and feel. New statements allow more efficient PEL programming: o New Looping statements: FOR/NEXT, REPEAT/UNTIL, LOOP/ENDLOOP o New loop control statements: CONTINUE, BREAK, EXITIF o New conditional statement ELSEIF to enable switch/case type of statements LSYNC inputs now support string based info (e.g. device, wafer name info) Drivers: B1500A driver now supports C-V measurements OS Platforms support: Windows XP LINUX RH4 Solaris 10 Page 4

product SPECTRE-MMSIM HSPICE ELDO SABER Link to 3 rd -party simulators DC AC BSIM3 PSP LRZ/C-V BSIM4 Time Domain Noise Measurement Drivers Target

5 The BIG PICTURE: IC-CAP Architecture IC-CAP Environment Programming Extraction Language (PEL) Graphic Capabilities IC-CAP GUI Studio Switch Matrix and prober drivers IC-CAP Analysis spice3 ADS Optimizers Simulator (spice3 and DC, AC, transient for ADS) Plot Optimizer IC-CAP core product SPECTRE-MMSIM HSPICE ELDO SABER Link to 3 rd -party simulators DC AC BSIM3 PSP LRZ/C-V BSIM4 Time Domain Noise Measurement Drivers Target HiSIM2 Corner AHBT HiSIM_HV Si BJT BSIMSOI4 Agilent Turn-key Extraction Packages MESFET PHEMT Root IC-CAP Modeling Suite Third-party Extractions (BJT) Page 5

IC-CAP is getting a new look IC-CAP 2009 is built on new, state of the art User Interface technology called Qt (by

com/ Although this UI technology change is fairly transparent to users and changes in UI functionality changes are

The new UI drawing engine enables faster drawing of plots and multiplots.

6 IC-CAP is getting a new look IC-CAP 2009 is built on new, state of the art User Interface technology called Qt (by Nokia) Although this UI technology change is fairly transparent to users and changes in UI functionality changes are minimal in 2009, IC-CAP users will experience a new look and feel along with a much faster UI responsiveness. The new UI drawing engine enables faster drawing of plots and multiplots. The CMOS Extraction Packages have new redesigned UI (see next slides). Looking ahead, adopting this new technology will enable Agilent EEsof to deliver significant changes and major improvements to the IC-CAP Platform. IC-CAP 2008 IC-CAP 2009 Page 6

7 85199ML Corner Modeling Extraction Package The Corner Modeling Package allows modeling engineers to use PCM statistics to generate corner models. Unlike the extracted model from measured data, which describes the behavior of a specific set of devices, corner models describe the model behavior when process variation occur. Parameter variations are classified in three classes: Fast, Typical, Slow Measured I-V C-V Data PCM Measured Data Extraction Stat Process Variation Corner Modeling Library With Corners Corner Modeling Package Library Verification Page 7

8 How does Corner Modeling work? Specify targets for NMOS and PMOS Devices Set PCM variation device info Page 8

9 How does Corner Modeling work? (cont.) After selecting the parameters to tune and the simulator, user can start parameter tuning to match corner behavior ADS, HSPICE,ELDO and SPECTRE are supported simulators. After tuning user will save the parameters and generate a final library file. Page 9

10 More Info on the Corner Modeling Package Supported simulators: ADS, HSPICE, ELDO, SPECTRE Final Library Generator Simulator Test Suite: after generating the final library with corners, the library can be tested in a variety of simulator settings (Temperature, W, L, SA, etc.) Automated creation of HTML Report includes device and PCM data as well as output results. More details and information on corner modeling, including a step by step user s guide, can be found here: Page 10

categories: Partially Depleted (PD) Fully Depleted (FD) devices.

11 84194NL BSIMSOI4 Extraction Package BSIMSOI4 Measurement and Extraction packages support both DC and RF Support for the following SOI device categories: Partially Depleted (PD) Fully Depleted (FD) devices. Model Version: BSIMSOI4.0 Supported Simulators: ADS, HSPICE and SPECTRE Page 11

12 84194NL BSIMSOI4 Extraction Package (cont.) New and redesigned Extract page enables extraction of global and Float devices Each step can be executed in interactive (or step by step) mode Main Extraction Step Extraction sub-steps E/O/T Predefined library functions Interactive Mode Window Page 12

13 PSP Global Extraction (new) New global PSP extraction flow is added to existing examples (global/local) and binning Model Version support: Page 13

New PEL Programming Features (conditional) New statements enable more efficient implementation of choice

SWITCH/CASE statements but rather the ELSEIF statement: IC-CAP 2008: nested if then/else/endif are

The code is hard to read and it is easy to make mistakes Case 1 Case 2 Case 3 Default IC-CAP 2009: Use

14 New PEL Programming Features (conditional) New statements enable more efficient implementation of choice statements (such as in C/C++ switch/case) Since PEL variables can be strings or numbers, we do not use SWITCH/CASE statements but rather the ELSEIF statement: IC-CAP 2008: nested if then/else/endif are necessary to implement switch case. The code is hard to read and it is easy to make mistakes Case 1 Case 2 Case 3 Default IC-CAP 2009: Use if then- elseif then- endif make the code easy to write and more readable Use as many elseif < cond> then as needed Implement the default case by using a last else (optional) Page 14

New PEL Programming Features (loop statements) IC-CAP 2008 was limited to WHILE

<bool_expr> LOOP statement1 ENDLOOP (infinite loop, must use EXITIF or BREAK to exit)

within any loop (including the WHILE loop) REPEAT example LOOP example FOR example

15 New PEL Programming Features (loop statements) IC-CAP 2008 was limited to WHILE <bool_expr> ENDWHILE looping IC-CAP 2009 adds support for: REPEAT statement1 UNTIL <bool_expr> LOOP statement1 ENDLOOP (infinite loop, must use EXITIF or BREAK to exit) FOR i=init TO term [STEP dstep] statement1 NEXT i CONTINUE/BREAK/EXITIF can be used within any loop (including the WHILE loop) REPEAT example LOOP example FOR example BREAK/CONTINUE/EXITIF example exit the loop conditional exit continue to next iteration Page 15

16 LSYNC String Support What is LSYNC? LSYNC is an important feature already available in IC-CAP 2008 Add On 2 It allows row by row simulation of several device with different instance parameters (typically different sizes, e.g. W/L) in the same setup It also allows creating MDM Database files (data can selectively be retrieved) N devices results in N I-V simulations i.e. row by row Page 16

LSYNC String Support (2009) 2009 Adds support for strings in LSYNC inputs Two new sweep types for Parameters inputs are available: TLIST (Text List) used for list of text type (maybe a master list)

17 LSYNC String Support (2009) 2009 Adds support for strings in LSYNC inputs Two new sweep types for Parameters inputs are available: TLIST (Text List) used for list of text type (maybe a master list) TLSYNC (Synchronized Text List) used for Text Lists synchronized to other lists (numeric or text) New icdb functions support creation of MDM files with text list and text sync sweeps DeviceName text value are saved in the MDM file and can be use as key to retrieve data Page 17

This external box connects the capacitance module B1520A to two adjacent SMUs outputs and enables C-V and I-V measurements.

18 B1500A DC-CV Analyzer driver now supports CV New options have been added to the B1500A option table to support C-V measurements through the instrument B1520A module (MFCMU) The driver also support the N1301A-100 SCUU (SMU/CMU Unify Capacitance Measurement Unit). This external box connects the capacitance module B1520A to two adjacent SMUs outputs and enables C-V and I-V measurements. The frequency can be set as constant in the option table or swept using an IC-CAP input of type Frequency. The driver supports open/short and load calibration. Page 18

19 Other Significant Enhancements: New Features in Plots: o Major speed improvements in the graphical drawing engine. o More trace types are available and each trace can declare a distinct line type. See Plot Options dialog for details o Fast Image Saving: plots can now be saved to.jpg/.gif/.png/.bmp without having to be opened using iccap_func(plotname, Save Image ) o Fast Image creation: Plots can now be saved to.jpg/.gif/.png/.bmp at print quality (300dpi, 4 x6 for example) for inclusion in hardcopy doc using iccap_func(plot, Create Image, pixelwidth, pixelheight, dpi) Fast Variable Array Handling: dramatic speed improvements when modifying/creating/deleting long ICCAP_ARRAY in Variable Tables. Other PEL Enhancements: o Set Table Field Value with iccap_func now supports setting program text into Macros/Functions and circuit text (e.g. model card or subcircuit) into the Circuit page o New PEL function dimension_array allows fast allocation and resize of ICCAP_ARRAY variables Efficient HB simulation Data Handling: When running HB simulations with ADS, the # of harmonics for the simulation may be different from the # of harmonic read back into IC-CAP datasets. New documentation is easier to navigate (available online and on local installation). Page 19

What s new in IC-CAP 2009 Update 1

What s new in IC-CAP 2009 Update 1 Overview of the new features included in this release March 2010 Device Modeling Marketing Team Agilent EEsof EDA IC-CAP 2009 Update 1 Release Page 1 Doc Version 1.0