Measure the Connected World And Everything in It ADVANTEST CORPORATION. All Rights Reserved.

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1 Measure the Connected World And Everything in It

2 Test Challenges for Future Automotive 100M/1Gbps Ethernet PHY ADVANTEST Corporation Takahiro Nakajima

3 Agenda 1. Trends of ADAS and Automotive Ethernet 2. Requirements for Automotive Ethernet PHY 3. Challenges of Wide Band Analog Test Using PAM3 4. Challenges of Wide Temperature for Final Test

4 Advanced Driver Assistance Systems Goal of ADAS is Autonomous Driving Levels of Autonomous Driving Driver Automation Driver only Assisted Partial automation Conditional automation High automation Full automation SAE NHTSA Collision Warning Lane keeping Assist Autonomous Parking Autonomous Driving

5 Data Speed [bps] Technical Trends of Automotive Ethernet 1. Requirements of Data Speed for Communication ADAS : Camera 100Mbps/1Gbps, Rader 100Mbps Infotainment : 100Mbps Backbone : 1Gbps Diagnosis Backbone Body Domain 2. Technical Trends of Automotive Ethernet Open industry and de facto standard network High Speed Data Rate with Scalable Infotainment Display Audio DVD ADAS Camera Rader Camera Powertrain & Chassis 1st Generation Diagnosis ECU Update Fast Ethernet 2 nd Generation Infotainment ADAS BroadR-Reach /100Base-T1 (100Mbps) 3rd Generation Backbone ADAS 1000Base-T1 (1Gbps) Camera Future Automotive Network / Domain structure

6 Market Trends of ADAS & Automotive Ethernet Semiconductor Revenue by ADAS Application The Number of Automotive Ethernet CAGR : 8.5% ( ) CAGR : 75.8% ( ) Source : IHS 2014 Source : Strategy Analytics Oct

7 Agenda 1. Trends of ADAS and Automotive Ethernet 2. Requirements for Automotive Ethernet PHY 3. Challenges of Wide Band Analog Test Using PAM3 4. Challenges of Wide Temperature for Final Test

8 2. Requirements of Automotive Ethernet PHY Industry standards to ensure Car Safety - Regulation, Reliability, Temperatures 1. Unique Test Item with Wide Analog Band ( >1GBW) 1. At speed Test ( PAM3 with 100Mbps, 1Gbps ) 2. Distortion / Return loss Test using PAM3 3. Timing Jitter, Clock Frequency 4. Frequency Response / Gain for each analog circuits 5. Pulse Response (Droop, Tr/Tf) At Speed Test AC Parametric Test Reg Tx Rx DAC ADC DSP PLL Ethernet PHY Device 2. Wide Temperature Test 1. Temperature Range -45degC ~ 125degC / 155degC PAM3 with 100Mbps/1Gbps

9 Agenda 1. Trends of ADAS and Automotive Ethernet 2. Requirements for Automotive Ethernet PHY 3. Challenges of Wide Band Analog Test Using PAM3 4. Challenges of Wide Temperature for Final Test

10 Relative power [db] Amplitude Amplitude Peak Error 3-1. Challenges of Wide Band Analog Test for Tx -1- Distortion Test for Transmitter Source : 11.11MHz/2.7Vpp*, 125MHz/1.8Vpp** differential outputs Capture : PAM3 (66Mbps*, 750Mbps**) with sine-wave *** Calculate MATLAB script -> Error = Measure data Ideal data A. Sinewave Disturbing signal [UI] Symbol Time C. PAM3 with Sinewave B. PAM3 (Test Mode4 ) After HPF and selection of six periods After HPF and selection of six periods Source A Test circuits B Tx Rx DAC ADC Captured data Frequency [MHz] Spectrum Remove disturbing signal Time [us] Time domain Capture Analog Instruments Requirement 1) Source : 11.11MHz / 2.7Vppd*, 125MHz / 1.8Vppd** Sinewave 2) Capture : >1GHz BW (3dB), >2Gsps*, >7.5Gsps** C DIB DUT Digital Time [us] Time Domain *100Mbps, **1Gbps Equivalent sampling is OK *** Test mode 4 100Mbps:66.6Mbps, 1Gbps:750Mbps

11 Relative power [db] Amplitude Amplitude 3-2. Challenges of Wide Band Analog Test for Tx -2- Rerun Loss Test for Transmitter Source : >66MHz*, >600MHz** differential outputs Capture : PAM3 (66Mbps*, 750Mbps**) with sine-wave *** A. Sinewave Vi Vi DUT Vr Return Loss = 20 log V i V r C. PAM3 with Sinewave After HPF and selection of six periods Frequency [MHz] Spectrum Measure reflection signal After HPF and selection of six periods Time [us] Time domain Vr Source Capture Analog DIB Instruments Requirement 1) Source : >66MHz*, >600MHz** Sinewave 2) Capture : >1GHz BW (3dB), >2Gsps*, >7.5Gsps** A C Test circuits B Tx Rx DUT DAC ADC Digital B. PAM3 (Test Mode4 ) Captured data Time [us] Time Domain *100Mbps, **1Gbps Equivalent sampling is OK *** Test mode 4 100Mbps:66.6Mbps, 1Gbps:750Mbps

12 3-3. Challenges of Wide Band Analog Test for Rx 1. At-speed Test & Emulation Test for Receiver Source : PAM3 >66Mbps*, >750Mbps** with or without 15m cable 2. Frequency Response for Receiver Source : Multi-tone wave >66MHz*, >600MHz** 1) PAM3 Source Instruments Requirement PAM3 >66Mbps*, >750Mbps** Multi-tone wave >66MHz*, >600MHz* *100Mbps, **1Gbps LCR Twist Cable 2) Multi-tone-wave Source Capture Analog Test circuits DIB Tx DAC Rx ADC DUT Digital

13 3-4. Summary of Automotive Ethernet PHY Test Ethernet Test Items 1. At-speed Test 2. Return loss, Distortion Test 3. Timing Jitter, Clock Frequency 4. Frequency Response, Gain 5. Pulse Response AWG/DGT Instruments Test Circuits DIB Tx DAC Rx ADC Ethernet PHY PLL DSP Digital Pattern Generator Module Capture 1. At-Speed Test / AC Parametric Test 2. AWG/DGT Instruments 1) Need Not Only Evaluation but also Mass Production Solution 2) Need Not Only 100Mbps but also Future 1Gbps Solution 1) Need Multi outputs AWG, Multi Inputs DGT 2) Need >1GBW, >1Gsps AWG, >1GBW, >2Gsps*, >7.5Gsps** DGT *100Mbps, **1Gbps, Equivalent sampling is OK

14 Agenda 1. Trends of ADAS and Automotive Ethernet 2. Requirements for Automotive Ethernet PHY 3. Challenges of Wide Band Analog Test Using PAM3 4. Challenges of Wide Temperature for Final Test

15 4-1. Challenges of Wide Band Temperature DIB for Final Package Test when set High Temperature > 125degC AWG/DGT Instruments Test Circuits DIB Tx DAC Rx ADC Ethernet PHY PLL DSP Pattern Digital Generator Module Capture Device Interface Board (Top View ) Connection Diagram DIB Chamber Handler DUT1 DUT2 DUT3 DUT4 125 degc Top Challenge How to manage the effects of temperature to the analog parts on bottom side * Test Circuits (Analog Parts) >100degC Device Interface Board (Side View ) Bottom *General Analog Parts Operation temperature : -25 to 80 degrees C

16 4-2. Chamber VS Active Thermal Method 1. Chamber Method 2. Active Thermal Control Method Ambient Air DUT Top Bottom Sensor Hot Fluid Thermal Tip Device Interface Board (Top View ) *Board information Size=550mm*480mm Thickness = 6.3mm < 80deg at >190mm*150mm Bottom View 25degC Bottom View Simulation Results (DUT/Top Side : 125degreeC) Need Active Thermal method Handler < 80deg at >30mm (Radius of DUT)

17 Summary 1. Automotive Ethernet has been a growing potential market for ADAS Ethernet 2. Customers require ATE vendors to provide an at-speed as well as AC parametric test solution for evaluation & mass production 3. Design of test hardware and software to manage temperature effects on analog parts for test circuits ADVANTEST can provide Automotive a TOTAL Ethernet solution that can solve customer s future issues 1)Wide Band Analog Tests using PAM3 with ATE 2)Wide Band Temperature testing with a Handler

18 Thank You for Your Time