Power management ICs for green energy applications

Size: px
Start display at page:

Download "Power management ICs for green energy applications"

Transcription

1 Power management ICs for green energy applications Close Executive Overview The power management IC (PMIC) has become a critical component in virtually every electronics product today. Much of this demand is being fueled by the global transition to green energy solutions. Highlighted will be a 0.18µm BCDMOS process with 30V LDMOS transistors having an Rsp of 20mohm-mm2, dense 1.8V CMOS logic, well-characterized 5V analog components, and embedded non-volatile memory. Process modularity will be discussed in terms of maximizing designer flexibility, enabling both simpler, low-complexity PMICs as well as the more complex SoC solutions. Lou N. Hutter, Dongbu HiTek, Seoul, S. Korea In today's energy-hungry world, the watchword is green. The drive to minimize our use of energy and prudently harvest it has become pervasive. Semiconductor technology has become increasingly critical for monitoring, optimizing, and controlling electronic system power parameters in real time. At the heart of almost every electronic system is a power management IC (PMIC), so it is not surprising that the push for green energy solutions continues to spur a surge in PMIC applications and prospects for overall market growth (Fig. 1).

2 Figure 1. Power management market forecast. Source: isuppli, Q PMIC perspective As each electronic system interconnects various IC and discrete components to achieve some overall function, each component must satisfy certain operating conditions to work properly. One such operating condition is input voltage, with some components requiring 1.2V, some wanting 3.3V, others needing 5V, and so on. One function of the PMIC is to provide these different bias levels for the other components in the system. Each electronic system typically involves some type of input and output as it samples some parameter, such as temperature, air/fuel mixture, etc., converting it into an electrical signal that then is electronically manipulated and fed into a microprocessor, DSP, microcontroller, or some other type of logic function. The logic function analyzes the data and makes some decision, which then is converted into an output signal to control the original parameter or some other parameter. This process requires power to be supplied to the individual components, as well as to the load. The power supplied to these other chips, or to the load for the system, comes from the PMIC. PMICs can be simple or complex, depending on the application, and also depending upon how the system is partitioned. In some highly integrated systems, the PMIC can be very complex, containing the logic intelligence and analog control circuitry as well as many voltage regulators capable of supplying amps of current. At the other extreme, some PMICs can be very simple, handling just the voltage regulator function for the system. The semiconductor process technology required to address these two divergent applications must, itself, be flexible. Many of today's products are portable, so battery life is very important. This means high-efficiency PMICs are critical. The broadest and strongest market demand is for PMICs that operate in the 5V to 24V range. Accordingly, we will now focus on exploring the process technology needs in this space. PMIC process technology requirements First and foremost, PMICs must deliver power, typically in the form of current, to a load device

3 e.g., an engine valve, or a headphone speaker, or an LED element. To do this efficiently, PMICs must dissipate very little on-chip power, which is typically resistive. A key factor in improving efficiency is to deliver the current with the lowest specific ON-resistance possible. PMICs must also execute both digital logic functions and analog control functions. Power delivery is generally implemented with LDMOS (lateral double-diffused MOS) transistors, while logic functions are best implemented in CMOS. Analog control is typically done with a combination of CMOS, bipolar, and passive components. Hence, a BCDMOS process is well suited for implementing PMICs. Let's now take a closer look at a low-voltage (24V) BCDMOS process in terms of the attributes it provides to implement high-efficiency PMICs. Today's state-of-the-art BCDMOS processes are typically based on 0.18µm lithography, thereby providing a good balance between component density and cost-effectiveness. The centerpiece component in any BCDMOS process is the LDMOS transistor. It typically performs the function of a high-current switch providing nearly zero resistance in the ON-state, and almost infinite resistance in the OFF-state. The cross-sectional view of an n-ldmos transistor (Fig. 2) shows a high-side device style, allowing the source/backgate to be pulled high while the substrate is tied to ground, with punch-through prevented by means of the N+ Buried Layer (NBL) placed between the two P- regions. A low-side device, by comparison, is one where the source/backgate is tied to ground, the same potential as the P-type substrate, so there is no voltage difference between the two regions and, correspondingly, no need for the NBL. Figure 2. Cross-sectional view of a high-side (HS) n-ldmos. While LDMOS performance is important in PMIC designs, there are additional considerations that determine the usefulness of a BCDMOS process. In power designs, there is a lot of analog control circuitry for such things as over-temperature and over-current controls. This can involve sophisticated analog circuits where requirements such as transistor noise, parameter matching, stable reference voltage, the ability to isolate sensitive nodes from substrate noise, and temperature coefficients can become important. Hence, the process developer must focus on these things in

4 parallel with the effort to optimize the power components. Accordingly, an optimal BCDMOS process for implementing PMICs requires the judicious integration of Bipolar, CMOS, and LDMOS technologies with designers expecting high performance in all categories. Modular, flexible low-voltage BCDMOS To better illustrate the technology needed to build today's PMICs, it is useful to show an example. Dongbu HiTek's BD180LV process is a 0.18µm BCDMOS technology rated to 30V operation. It combines 30V n-ldmos with dense 1.8V CMOS logic and well-characterized analog components including 5V analog CMOS, bipolar transistors, and passive components, providing a rich set of components for designers to use. This 24V process strikes the right balance among power performance, reliability, and process complexity parameters. Significantly, the BD180LV was developed by starting with an existing 0.18µm analog CMOS process the AN180 and then by adding the necessary modules to create a robust yet flexible mixed-signal process. As a result, the foundry-compatible 1.8V and 5V logic, as well as the passives, are exactly the same across the two processes, allowing IP portability across the nodes. This enables designers to step up' from an analog CMOS product design to a BCDMOS product design without having to start from scratch. All the necessary and exhaustive characterizations of the analog CMOS process translate directly into the analog in the BCDMOS version. As can be seen in the n-ldmos performance (Fig. 3), the BD180LV process provides best-in-class RSP performance based on reported data. In the figure, it should be noted that two versions of BD180LV are shown with and without Epi/NBL. The non-epi/nbl version is for cost-sensitive applications and can easily run on a conventional CMOS logic line, while the standard Epi/NBL version is for the more conventional and rugged applications and requires some specialized tools that are well-known to analog-savvy chip designers. Figure 3. Comparison of Rsp across various LDMOS transistors. The LDMOS device must operate over a wide temperature range, from -40C to +150C, even up to

5 +180C for automotive applications. The statistical variation of parameters, such as BVDSS, the OFF-state breakdown voltage, makes it important to achieve ample breakdown above the desired operating voltage (VOP). Not just BVDSS, but BVON, the ON-state breakdown voltage, must remain above the VOP point to avoid potential destructive behavior in the device. As a result, a VOP-rated device often has a BVDSS 25% to 30% above VOP when measured at room temperature during the end-of-line parametric check in the wafer fab. Referring again to Fig. 3, a 30V-rated n-ldmos in BD180LV has a typical BVDSS of 40V, with a corresponding RSP of 20mΩ mm2. This represents state-of-art performance in a 30V power device. It is very important to understand the margin in these devices for the application at hand. Safe operating area (SOA) testing comprehends the operating region where the device can survive, allowing the designer to push the device to higher performance levels while maintaining safe and reliable operation. Process modularity advantages If there is one constant in the world of semiconductor processing, it is that there can never be enough components in an analog process, even a BCDMOS process with already components. The analog world is fractured, with niche applications abounding, which is one reason why analog is so challenging and yet resilient. Typical components for addition are p-ldmos, for complementary power stages, isolated LDMOS, allowing low-voltage devices to be floated to high potentials, depletion MOS devices, higher levels of non-volatile memory, and a constant pressure to push the voltage bounds of the process. Figure 4. Modularity provides flexibility to enhance analog functionality. This is coupled with the fact that some products demand gate counts in excess of 250K, while other products have almost no logic at all. To maintain IP portability, a key enabler for design, a modular style must be adopted. As shown in the BD180LV modularity build-up chart (Fig. 4), the process starts with an AN180 base, with modules then added. The designer can tailor the process to his/her need. Each module is parametrically identical in any process flavor, so IP portability is possible. In today's world of ever-shortening design cycles, having a modular technology that offers flexibility is

6 a welcome asset. Conclusion PMICs have become critical components in virtually every electronic system today. Demand for low-voltage PMICs continues to surge as electronic system manufacturers across the globe sharpen their focus on green energy solutions. BCDMOS has become the mixed-signal process of choice for implementing PMICs, especially when the process is modular, flexible and enables power-saving features such as the integration of compact LDMOS power transistors that reduce Rsp (specific on resistance). Today's designers of power management ICs are well advised to examine closely BDMOS processes at their disposal to determine which can most effectively combine logic density with analog and power performance. References 1. D. Riccardi, et al., "BCD8 from 7V to 70V: a New 0.18μm Technology Platform to Address the Evolution of Applications towards Smart Power ICs with High Logic Contents," Proc. of the International Symp. on Power Semiconductor Devices, 2007, Jeju, Korea. 2. K.Y. Ko, et al, "BD180LV 0.18µm BCD Technology with Best-in-Class LDMOS from 7V to 30V," Proc. of the Inter. Symp. on Power Semiconductor Devices, 2010, Hiroshima, Japan. 3. P.Hower, et al., "Short and Long-Term Safe Operating Area Considerations in LDMOS Transistors," Proc. of the International Reliability Physics Symp., 2005, San Jose. USA. Biography Lou Hutter holds BS degrees in math and physics from Northern Kentucky U., as well as an MSEE from MIT. He is SVP and GM of the Analog Foundry Business Unit at Dongbu HiTek, Dongbu Financial Center, 32nd Fl., , Daechi-Dong, Gangnam-Gu, Seoul, Korea; ph.: ; l.hutter@dongbu.com. More Solid State Technology Current Issue Articles More Solid State Technology Archives Issue Articles To access this Article, go to:

Semiconductor Market Outlook. Analog Semiconductor Leaders' Forum October 2011

Semiconductor Market Outlook. Analog Semiconductor Leaders' Forum October 2011 Semiconductor Market Outlook Analog Semiconductor Leaders' Forum October 2011 Q3 2011 Update Economic Outlook Semiconductor End Markets Semiconductor Forecast MAP Model Data: Analog, Power Management Foundries

More information

TSBCD025 High Voltage 0.25 mm BCDMOS

TSBCD025 High Voltage 0.25 mm BCDMOS TSBCD025 High Voltage 0.25 mm BCDMOS TSI Semiconductors' 0.25 mm process is a feature rich platform with best in class CMOS, LDMOS, and BiPolar devices. The BCD technology enables logic, Mixed-Signal,

More information

A Review Paper on Reconfigurable Techniques to Improve Critical Parameters of SRAM

A Review Paper on Reconfigurable Techniques to Improve Critical Parameters of SRAM IJSRD - International Journal for Scientific Research & Development Vol. 4, Issue 09, 2016 ISSN (online): 2321-0613 A Review Paper on Reconfigurable Techniques to Improve Critical Parameters of SRAM Yogit

More information

TABLE OF CONTENTS III. Section 1. Executive Summary

TABLE OF CONTENTS III. Section 1. Executive Summary Section 1. Executive Summary... 1-1 Section 2. Global IC Industry Outlook and Cycles... 2-1 IC Insights' Forecast Methodology... 2-1 Overview... 2-1 Worldwide GDP... 2-1 Electronic System Sales... 2-2

More information

Microelettronica. J. M. Rabaey, "Digital integrated circuits: a design perspective" EE141 Microelettronica

Microelettronica. J. M. Rabaey, Digital integrated circuits: a design perspective EE141 Microelettronica Microelettronica J. M. Rabaey, "Digital integrated circuits: a design perspective" Introduction Why is designing digital ICs different today than it was before? Will it change in future? The First Computer

More information

700V Power Management Platform with record logic density : SOC power solutions are finally enabled for 700V.

700V Power Management Platform with record logic density : SOC power solutions are finally enabled for 700V. 700V Power Management Platform with record logic density : SOC power solutions are finally enabled for 700V. Dr. Shye Shapira Director of Global Power Management Research and Development TowerJazz April

More information

Technology & Manufacturing. Kevin Ritchie Senior vice president, Technology & Manufacturing

Technology & Manufacturing. Kevin Ritchie Senior vice president, Technology & Manufacturing Technology & Manufacturing Kevin Ritchie Senior vice president, Technology & Manufacturing 27 in review Manufacturing strategy continues to deliver financial results Accelerating analog leadership Increased

More information

EE241 - Spring 2004 Advanced Digital Integrated Circuits

EE241 - Spring 2004 Advanced Digital Integrated Circuits EE24 - Spring 2004 Advanced Digital Integrated Circuits Borivoje Nikolić Lecture 2 Impact of Scaling Class Material Last lecture Class scope, organization Today s lecture Impact of scaling 2 Major Roadblocks.

More information

Chapter 2 On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process

Chapter 2 On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process Chapter 2 On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process 2.1 Introduction Standard CMOS technologies have been increasingly used in RF IC applications mainly

More information

Introduction 1. GENERAL TRENDS. 1. The technology scale down DEEP SUBMICRON CMOS DESIGN

Introduction 1. GENERAL TRENDS. 1. The technology scale down DEEP SUBMICRON CMOS DESIGN 1 Introduction The evolution of integrated circuit (IC) fabrication techniques is a unique fact in the history of modern industry. The improvements in terms of speed, density and cost have kept constant

More information

More Course Information

More Course Information More Course Information Labs and lectures are both important Labs: cover more on hands-on design/tool/flow issues Lectures: important in terms of basic concepts and fundamentals Do well in labs Do well

More information

UNIT 4 INTEGRATED CIRCUIT DESIGN METHODOLOGY E5163

UNIT 4 INTEGRATED CIRCUIT DESIGN METHODOLOGY E5163 UNIT 4 INTEGRATED CIRCUIT DESIGN METHODOLOGY E5163 LEARNING OUTCOMES 4.1 DESIGN METHODOLOGY By the end of this unit, student should be able to: 1. Explain the design methodology for integrated circuit.

More information

EE141- Spring 2004 Introduction to Digital Integrated Circuits. What is this class about?

EE141- Spring 2004 Introduction to Digital Integrated Circuits. What is this class about? - Spring 2004 Introduction to Digital Integrated Circuits Tu-Th am-2:30pm 203 McLaughlin What is this class about? Introduction to digital integrated circuits.» CMOS devices and manufacturing technology.

More information

International Journal of Scientific & Engineering Research, Volume 5, Issue 2, February ISSN

International Journal of Scientific & Engineering Research, Volume 5, Issue 2, February ISSN International Journal of Scientific & Engineering Research, Volume 5, Issue 2, February-2014 938 LOW POWER SRAM ARCHITECTURE AT DEEP SUBMICRON CMOS TECHNOLOGY T.SANKARARAO STUDENT OF GITAS, S.SEKHAR DILEEP

More information

ECE 637 Integrated VLSI Circuits. Introduction. Introduction EE141

ECE 637 Integrated VLSI Circuits. Introduction. Introduction EE141 ECE 637 Integrated VLSI Circuits Introduction EE141 1 Introduction Course Details Instructor Mohab Anis; manis@vlsi.uwaterloo.ca Text Digital Integrated Circuits, Jan Rabaey, Prentice Hall, 2 nd edition

More information

EE586 VLSI Design. Partha Pande School of EECS Washington State University

EE586 VLSI Design. Partha Pande School of EECS Washington State University EE586 VLSI Design Partha Pande School of EECS Washington State University pande@eecs.wsu.edu Lecture 1 (Introduction) Why is designing digital ICs different today than it was before? Will it change in

More information

EE141- Spring 2002 Introduction to Digital Integrated Circuits. What is this class about?

EE141- Spring 2002 Introduction to Digital Integrated Circuits. What is this class about? - Spring 2002 Introduction to Digital Integrated Circuits Tu-Th 9:30-am 203 McLaughlin What is this class about? Introduction to digital integrated circuits.» CMOS devices and manufacturing technology.

More information

What is this class all about?

What is this class all about? -Fall 2004 Digital Integrated Circuits Instructor: Borivoje Nikolić TuTh 3:30-5 247 Cory EECS141 1 What is this class all about? Introduction to digital integrated circuits. CMOS devices and manufacturing

More information

Latch-Up. Parasitic Bipolar Transistors

Latch-Up. Parasitic Bipolar Transistors Latch-Up LATCH-UP CIRCUIT Latch-up is caused by an SCR (Silicon Controlled Rectifier) circuit. Fabrication of CMOS integrated circuits with bulk silicon processing creates a parasitic SCR structure. The

More information

Functional Testing of 0.3mm pitch Wafer Level Packages to Multi- GHz Speed made possible by Innovative Socket Technology

Functional Testing of 0.3mm pitch Wafer Level Packages to Multi- GHz Speed made possible by Innovative Socket Technology Functional Testing of 0.3mm pitch Wafer Level Packages to Multi- GHz Speed made possible by Innovative Socket Technology Ila Pal - Ironwood Electronics Introduction Today s electronic packages have high

More information

EE141- Spring 2007 Introduction to Digital Integrated Circuits

EE141- Spring 2007 Introduction to Digital Integrated Circuits - Spring 2007 Introduction to Digital Integrated Circuits Tu-Th 5pm-6:30pm 150 GSPP 1 What is this class about? Introduction to digital integrated circuits.» CMOS devices and manufacturing technology.

More information

Power IC 용 ESD 보호기술. 구용서 ( Yong-Seo Koo ) Electronic Engineering Dankook University, Korea

Power IC 용 ESD 보호기술. 구용서 ( Yong-Seo Koo ) Electronic Engineering Dankook University, Korea Power IC 용 ESD 보호기술 구용서 ( Yong-Seo Koo ) Electronic Engineering Dankook University, Korea yskoo@dankook.ac.kr 031-8005-3625 Outline Introduction Basic Concept of ESD Protection Circuit ESD Technology Issue

More information

Enabling Intelligent Digital Power IC Solutions with Anti-Fuse-Based 1T-OTP

Enabling Intelligent Digital Power IC Solutions with Anti-Fuse-Based 1T-OTP Enabling Intelligent Digital Power IC Solutions with Anti-Fuse-Based 1T-OTP Jim Lipman, Sidense David New, Powervation 1 THE NEED FOR POWER MANAGEMENT SOLUTIONS WITH OTP MEMORY As electronic systems gain

More information

Low Voltage Bandgap References and High PSRR Mechanism

Low Voltage Bandgap References and High PSRR Mechanism Low Voltage Bandgap References and High PSRR Mechanism Vahe Arakelyan 2nd year Master Student Synopsys Armenia Educational Department, State Engineering University of Armenia Moscow March 21-24, 2011 Outline

More information

TEXAS INSTRUMENTS ANALOG UNIVERSITY PROGRAM DESIGN CONTEST MIXED SIGNAL TEST INTERFACE CHRISTOPHER EDMONDS, DANIEL KEESE, RICHARD PRZYBYLA SCHOOL OF

TEXAS INSTRUMENTS ANALOG UNIVERSITY PROGRAM DESIGN CONTEST MIXED SIGNAL TEST INTERFACE CHRISTOPHER EDMONDS, DANIEL KEESE, RICHARD PRZYBYLA SCHOOL OF TEXASINSTRUMENTSANALOGUNIVERSITYPROGRAMDESIGNCONTEST MIXED SIGNALTESTINTERFACE CHRISTOPHEREDMONDS,DANIELKEESE,RICHARDPRZYBYLA SCHOOLOFELECTRICALENGINEERINGANDCOMPUTERSCIENCE OREGONSTATEUNIVERSITY I. PROJECT

More information

Modeling of High Voltage Devices for ESD Event Simulation in SPICE

Modeling of High Voltage Devices for ESD Event Simulation in SPICE The World Leader in High Performance Signal Processing Solutions Modeling of High Voltage Devices for ESD Event Simulation in SPICE Yuanzhong (Paul) Zhou, Javier A. Salcedo Jean-Jacques Hajjar Analog Devices

More information

CAD for VLSI. Debdeep Mukhopadhyay IIT Madras

CAD for VLSI. Debdeep Mukhopadhyay IIT Madras CAD for VLSI Debdeep Mukhopadhyay IIT Madras Tentative Syllabus Overall perspective of VLSI Design MOS switch and CMOS, MOS based logic design, the CMOS logic styles, Pass Transistors Introduction to Verilog

More information

Challenges for Non Volatile Memory (NVM) for Automotive High Temperature Operating Conditions Alexander Muffler

Challenges for Non Volatile Memory (NVM) for Automotive High Temperature Operating Conditions Alexander Muffler Challenges for Non Volatile Memory (NVM) for Automotive High Temperature Operating Conditions Alexander Muffler Product Marketing Manager Automotive, X-FAB Outline Introduction NVM Technology & Design

More information

Lecture #1. Teach you how to make sure your circuit works Do you want your transistor to be the one that screws up a 1 billion transistor chip?

Lecture #1. Teach you how to make sure your circuit works Do you want your transistor to be the one that screws up a 1 billion transistor chip? Instructor: Jan Rabaey EECS141 1 Introduction to digital integrated circuit design engineering Will describe models and key concepts needed to be a good digital IC designer Models allow us to reason about

More information

Parallel connection / operations and current share application note

Parallel connection / operations and current share application note Parallel connection / operations and current share application note Overview This document will examine method for active load sharing, basic criteria and performances of such a function on Glary UH and

More information

Answers to Chapter 2 Review Questions. 2. To convert controller signals into external signals that are used to control the machine or process

Answers to Chapter 2 Review Questions. 2. To convert controller signals into external signals that are used to control the machine or process Answers to Chapter 2 Review Questions 1. To accept signals from the machine or process devices and to convert them into signals that can be used by the controller 2. To convert controller signals into

More information

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering IP-SRAM ARCHITECTURE AT DEEP SUBMICRON CMOS TECHNOLOGY A LOW POWER DESIGN D. Harihara Santosh 1, Lagudu Ramesh Naidu 2 Assistant professor, Dept. of ECE, MVGR College of Engineering, Andhra Pradesh, India

More information

Moore s Law: Alive and Well. Mark Bohr Intel Senior Fellow

Moore s Law: Alive and Well. Mark Bohr Intel Senior Fellow Moore s Law: Alive and Well Mark Bohr Intel Senior Fellow Intel Scaling Trend 10 10000 1 1000 Micron 0.1 100 nm 0.01 22 nm 14 nm 10 nm 10 0.001 1 1970 1980 1990 2000 2010 2020 2030 Intel Scaling Trend

More information

What is this class all about?

What is this class all about? EE141-Fall 2007 Digital Integrated Circuits Instructor: Elad Alon TuTh 3:30-5pm 155 Donner 1 1 What is this class all about? Introduction to digital integrated circuit design engineering Will describe

More information

BUS SWITCHES PROVIDE 5V AND 3V LOGIC CONVERSION WITH ZERO DELAY. Figure 1. 5V & 3V Logic Mixture in PC Design

BUS SWITCHES PROVIDE 5V AND 3V LOGIC CONVERSION WITH ZERO DELAY. Figure 1. 5V & 3V Logic Mixture in PC Design BUS SWITCHES PROVIDE 5V AND 3V LOGIC CONVERSION WITH ZERO DELAY APPLICATION NOTE AN-11A ABSTRACT Battery operated computer systems, such as notebook computers, need support logic with a combination of

More information

Analog ASICs in industrial applications

Analog ASICs in industrial applications Analog ASICs in industrial applications Customised IC solutions for sensor interface applications in industrial electronics the requirements and the possibilities Synopsis Industrial electronics creates

More information

Smart Inrush Current Limiter Enables Higher Efficiency In AC-DC Converters

Smart Inrush Current Limiter Enables Higher Efficiency In AC-DC Converters ISSUE: May 2016 Smart Inrush Current Limiter Enables Higher Efficiency In AC-DC Converters by Benoît Renard, STMicroelectronics, Tours, France Inrush current limiting is required in a wide spectrum of

More information

High-Voltage Structured ASICs for Industrial Applications - A Single Chip Solution

High-Voltage Structured ASICs for Industrial Applications - A Single Chip Solution High-Voltage Structured ASICs for Industrial Applications - A Single Chip Solution Yipin Zhang, Cor Scherjon Institut für Mikroelektronik Stuttgart Allmandring 30 a 70569 Stuttgart This paper presents

More information

INTELLIGENT LOAD SWITCHING HELPS IMPLEMENT RELIABLE HOT SWAP SYSTEMS

INTELLIGENT LOAD SWITCHING HELPS IMPLEMENT RELIABLE HOT SWAP SYSTEMS INTELLIGENT LOAD SWITCHING HELPS IMPLEMENT RELIABLE HOT SWAP SYSTEMS March 2010 Lattice Semiconductor 5555 Northeast Moore Ct. Hillsboro, Oregon 97124 USA Telephone: (503) 268-8000 www.latticesemi.com

More information

Three DIMENSIONAL-CHIPS

Three DIMENSIONAL-CHIPS IOSR Journal of Electronics and Communication Engineering (IOSR-JECE) ISSN: 2278-2834, ISBN: 2278-8735. Volume 3, Issue 4 (Sep-Oct. 2012), PP 22-27 Three DIMENSIONAL-CHIPS 1 Kumar.Keshamoni, 2 Mr. M. Harikrishna

More information

Introduction to ICs and Transistor Fundamentals

Introduction to ICs and Transistor Fundamentals Introduction to ICs and Transistor Fundamentals A Brief History 1958: First integrated circuit Flip-flop using two transistors Built by Jack Kilby at Texas Instruments 2003 Intel Pentium 4 mprocessor (55

More information

Technology & Manufacturing

Technology & Manufacturing Technology & Manufacturing Kevin Ritchie Senior Vice President Technology and Manufacturing Group Development & Manufacturing Strategy Process Technology Leadership Flexible Development Options Internal

More information

What is this class all about?

What is this class all about? EE141-Fall 2012 Digital Integrated Circuits Instructor: Elad Alon TuTh 11-12:30pm 247 Cory 1 What is this class all about? Introduction to digital integrated circuit design engineering Will describe models

More information

Introduction. Chapter 1. Logic Non-Volatile Memory. List of Sections. List of Figures

Introduction. Chapter 1. Logic Non-Volatile Memory. List of Sections. List of Figures Logic Non-Volatile Memory by Charles Ching-Hsiang Hsu, Yuan-Tai Lin, Evans Ching-Sung Yang, Rick Shih-Jye Shen Chapter 1 Introduction List of Sections Section 1.1 What Are Logic NVMs 3 Section 1.2 When

More information

Elettronica T moduli I e II

Elettronica T moduli I e II Elettronica T moduli I e II Docenti: Massimo Lanzoni, Igor Loi Massimo.lanzoni@unibo.it igor.loi@unibo.it A.A. 2015/2016 Scheduling MOD 1 (Prof. Loi) Weeks 39,40,41,42, 43,44» MOS transistors» Digital

More information

Super E-Line Applications in Automotive Electronics Replacement of Large Packaged Transistors with an Enhanced TO92 Product David Bradbury

Super E-Line Applications in Automotive Electronics Replacement of Large Packaged Transistors with an Enhanced TO92 Product David Bradbury Super E-Line Applications in Automotive Electronics Replacement of Large Packaged Transistors with an Enhanced TO92 Product David Bradbury Car buyers are now demanding greater and greater sophistication

More information

Addressable Test Chip Technology for IC Design and Manufacturing. Dr. David Ouyang CEO, Semitronix Corporation Professor, Zhejiang University 2014/03

Addressable Test Chip Technology for IC Design and Manufacturing. Dr. David Ouyang CEO, Semitronix Corporation Professor, Zhejiang University 2014/03 Addressable Test Chip Technology for IC Design and Manufacturing Dr. David Ouyang CEO, Semitronix Corporation Professor, Zhejiang University 2014/03 IC Design & Manufacturing Trends Both logic and memory

More information

Soitec ultra-thin SOI substrates enabling FD-SOI technology. July, 2015

Soitec ultra-thin SOI substrates enabling FD-SOI technology. July, 2015 Soitec ultra-thin SOI substrates enabling FD-SOI technology July, 2015 Agenda FD-SOI: Background & Value Proposition C1- Restricted July 8, 2015 2 Today Ultra-mobile & Connected Consumer At Any Time With

More information

Design and verification of low power SRAM system: Backend approach

Design and verification of low power SRAM system: Backend approach Design and verification of low power SRAM system: Backend approach Yasmeen Saundatti, PROF.H.P.Rajani E&C Department, VTU University KLE College of Engineering and Technology, Udhayambag Belgaum -590008,

More information

By Joe Grimm, Business Development Manager, RFIC Switches, California Eastern Laboratories

By Joe Grimm, Business Development Manager, RFIC Switches, California Eastern Laboratories 4590 Patrick Henry Drive Santa Clara, CA 95054-1817 Telephone: (408) 988-3500 Facsimile: (408) 988-0279 CMOS RFIC Switches: Simple and inexpensive, the latest 2.5GHz versions pose a legitimate challenge

More information

Technology & Manufacturing. Laurent Bosson Executive Vice President Front End Technology & Manufacturing

Technology & Manufacturing. Laurent Bosson Executive Vice President Front End Technology & Manufacturing Technology & Manufacturing Laurent Bosson Executive Vice President Front End Technology & Manufacturing Manufacturing and Technology Strategy LEADING EDGE TECHNOLOGY + SHAREHOLDER VALUE TIME TO MARKET

More information

EPROM. Application Note CMOS EPROM. Interfacing Atmel LV/BV EPROMs on a Mixed 3-Volt/5- Volt Data Bus

EPROM. Application Note CMOS EPROM. Interfacing Atmel LV/BV EPROMs on a Mixed 3-Volt/5- Volt Data Bus Interfacing Atmel LV/BV EPROMs on a Mixed 3-volt/5-volt Data Bus Introduction Interfacing Atmel Corporation s low voltage (LV/BV) EPROMs on a common data bus with standard 5-volt devices can be achieved

More information

The second generation of the HITFET family offers low RDS(on) and restart function in the SOT223 and D-Pak with low-input current

The second generation of the HITFET family offers low RDS(on) and restart function in the SOT223 and D-Pak with low-input current HL Application Note BSP 76, BSP 77, BSP 78, BTS 118D, BTS 134D, BTS 142 D 1 The second generation of the HITFET family offers low RDS(on) and restart function in the SOT223 and D-Pak with low-input current

More information

Optimizing Wide Vin Designs with LDOs

Optimizing Wide Vin Designs with LDOs Optimizing Wide Vin Designs with LDOs June 2017 Jose Gonzalez Product Marketing Engineer for TI s Linear Regulators & LDOs 1 Agenda Common Design Requirements & Applications Design Challenges TI Solutions

More information

Proposers Day Workshop

Proposers Day Workshop Proposers Day Workshop Monday, January 23, 2017 @srcjump, #JUMPpdw Advanced Devices, Packaging, and Materials Horizontal Research Center Aaron Oki NG Fellow Northrop Grumman Center Motivation Active and

More information

Mixed-Signal Analog. C.S. Lee. Senior Vice President High-Volume Analog & Logic

Mixed-Signal Analog. C.S. Lee. Senior Vice President High-Volume Analog & Logic Mixed-Signal Analog C.S. Lee Senior Vice President High-Volume Analog & Logic Mixed-Signal Analog Market Total Analog TAM 2004 $31.4 Billion Standard $11.9B Vertical Applications $19.5B Market Characteristics

More information

FPGA for Dummies. Introduc)on to Programmable Logic

FPGA for Dummies. Introduc)on to Programmable Logic FPGA for Dummies Introduc)on to Programmable Logic FPGA for Dummies Historical introduc)on, where we come from; FPGA Architecture: Ø basic blocks (Logic, FFs, wires and IOs); Ø addi)onal elements; FPGA

More information

ESD Protection Design for Mixed-Voltage I/O Interfaces -- Overview

ESD Protection Design for Mixed-Voltage I/O Interfaces -- Overview ESD Protection Design for Mixed-Voltage Interfaces -- Overview Ming-Dou Ker and Kun-Hsien Lin Abstract Electrostatic discharge (ESD) protection design for mixed-voltage interfaces has been one of the key

More information

INTERCONNECT TESTING WITH BOUNDARY SCAN

INTERCONNECT TESTING WITH BOUNDARY SCAN INTERCONNECT TESTING WITH BOUNDARY SCAN Paul Wagner Honeywell, Inc. Solid State Electronics Division 12001 State Highway 55 Plymouth, Minnesota 55441 Abstract Boundary scan is a structured design technique

More information

Announcements. Advanced Digital Integrated Circuits. No office hour next Monday. Lecture 2: Scaling Trends

Announcements. Advanced Digital Integrated Circuits. No office hour next Monday. Lecture 2: Scaling Trends EE4 - Spring 008 Advanced Digital Integrated Circuits Lecture : Scaling Trends Announcements No office hour next Monday Extra office hours Tuesday and Thursday -3pm CMOS Scaling Rules Voltage, V / α tox/α

More information

Designing with Siliconix PC Card (PCMCIA) Power Interface Switches

Designing with Siliconix PC Card (PCMCIA) Power Interface Switches Designing with Siliconix PC Card (PCMCIA) Power Interface Switches AN716 Innovation in portable computer design is driven today by the need for smaller, lighter, and more energy-efficient products. This

More information

Miniaturized Wireless Sensing for Process Monitoring

Miniaturized Wireless Sensing for Process Monitoring Miniaturized Wireless Sensing for Process Monitoring Prof. Brian Otis, Prof. Babak Parviz University of Washington Electrical Engineering Department Seattle, WA, USA Outline Motivation: inexpensive, microscale

More information

USING LOW COST, NON-VOLATILE PLDs IN SYSTEM APPLICATIONS

USING LOW COST, NON-VOLATILE PLDs IN SYSTEM APPLICATIONS USING LOW COST, NON-VOLATILE PLDs IN SYSTEM APPLICATIONS November 2010 Lattice Semiconductor 5555 Northeast Moore Ct. Hillsboro, Oregon 97124 USA Telephone: (503) 268-8000 www.latticesemi.com 1 Using Low

More information

MICROCONTROLLER BASED SMART FAN SYSTEM

MICROCONTROLLER BASED SMART FAN SYSTEM MUHAMMAD KHAIRI BACHELOR OF ELECTRICAL ENGINEERING (HONS.) (ELECTRONICS) 2007 UMP MICROCONTROLLER BASED SMART FAN SYSTEM MUHAMMAD KHAIRI BIN ABD. GHANI UNIVERSITI MALAYSIA PAHANG v ABSTRACT This project

More information

Analysis of 8T SRAM with Read and Write Assist Schemes (UDVS) In 45nm CMOS Technology

Analysis of 8T SRAM with Read and Write Assist Schemes (UDVS) In 45nm CMOS Technology Analysis of 8T SRAM with Read and Write Assist Schemes (UDVS) In 45nm CMOS Technology Srikanth Lade 1, Pradeep Kumar Urity 2 Abstract : UDVS techniques are presented in this paper to minimize the power

More information

How Safe is Anti-Fuse Memory? IBG Protection for Anti-Fuse OTP Memory Security Breaches

How Safe is Anti-Fuse Memory? IBG Protection for Anti-Fuse OTP Memory Security Breaches How Safe is Anti-Fuse Memory? IBG Protection for Anti-Fuse OTP Memory Security Breaches Overview A global problem that impacts the lives of millions daily is digital life security breaches. One of the

More information

Mixed-Signal. From ICs to Systems. Mixed-Signal solutions from Aeroflex Colorado Springs. Standard products. Custom ASICs. Mixed-Signal modules

Mixed-Signal. From ICs to Systems. Mixed-Signal solutions from Aeroflex Colorado Springs. Standard products. Custom ASICs. Mixed-Signal modules A passion for performance. Mixed-Signal solutions from Aeroflex Colorado Springs Standard products Custom ASICs Mixed-Signal modules Circuit card assemblies Mixed-Signal From ICs to Systems RadHard ASICs

More information

Battery Stack Management Makes another Leap Forward

Battery Stack Management Makes another Leap Forward Battery Stack Management Makes another Leap Forward By Greg Zimmer Sr. Product Marketing Engineer, Signal Conditioning Products Linear Technology Corp. Any doubts about the viability of electric vehicles

More information

Renesas New Generation of R8C/Tiny Series MCUs Adds 1.8V Support and Coprocessing With Background Operation to Enable Low-cost Innovative Designs

Renesas New Generation of R8C/Tiny Series MCUs Adds 1.8V Support and Coprocessing With Background Operation to Enable Low-cost Innovative Designs PRESS CONTACT: Akiko Ishiyama Renesas Technology America, Inc. (408) 382-7407 akiko.ishiyama@renesas.com Renesas New Generation of R8C/Tiny Series MCUs Adds 1.8V Support and Coprocessing With Background

More information

Design and Simulation of Low Power 6TSRAM and Control its Leakage Current Using Sleepy Keeper Approach in different Topology

Design and Simulation of Low Power 6TSRAM and Control its Leakage Current Using Sleepy Keeper Approach in different Topology Vol. 3, Issue. 3, May.-June. 2013 pp-1475-1481 ISSN: 2249-6645 Design and Simulation of Low Power 6TSRAM and Control its Leakage Current Using Sleepy Keeper Approach in different Topology Bikash Khandal,

More information

Burn-in & Test Socket Workshop

Burn-in & Test Socket Workshop Burn-in & Test Socket Workshop IEEE March 4-7, 2001 Hilton Mesa Pavilion Hotel Mesa, Arizona IEEE COMPUTER SOCIETY Sponsored By The IEEE Computer Society Test Technology Technical Council COPYRIGHT NOTICE

More information

IBG Protection for Anti-Fuse OTP Memory Security Breaches

IBG Protection for Anti-Fuse OTP Memory Security Breaches IBG Protection for Anti-Fuse OTP Memory Security Breaches Overview Anti-Fuse Memory IP is considered by some to be the gold standard for secure memory. Once programmed, reverse engineering methods will

More information

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape Edition April 2017 Semiconductor technology & processing 3D systems-on-chip A clever partitioning of circuits to improve area, cost, power and performance. In recent years, the technology of 3D integration

More information

2. TOPOLOGICAL PATTERN ANALYSIS

2. TOPOLOGICAL PATTERN ANALYSIS Methodology for analyzing and quantifying design style changes and complexity using topological patterns Jason P. Cain a, Ya-Chieh Lai b, Frank Gennari b, Jason Sweis b a Advanced Micro Devices, 7171 Southwest

More information

Chapter 1 Introduction

Chapter 1 Introduction Chapter 1 Introduction 1.1 MOTIVATION 1.1.1 LCD Industry and LTPS Technology [1], [2] The liquid-crystal display (LCD) industry has shown rapid growth in five market areas, namely, notebook computers,

More information

ECE484 VLSI Digital Circuits Fall Lecture 01: Introduction

ECE484 VLSI Digital Circuits Fall Lecture 01: Introduction ECE484 VLSI Digital Circuits Fall 2017 Lecture 01: Introduction Adapted from slides provided by Mary Jane Irwin. [Adapted from Rabaey s Digital Integrated Circuits, 2002, J. Rabaey et al.] CSE477 L01 Introduction.1

More information

VLSI Design Automation

VLSI Design Automation VLSI Design Automation IC Products Processors CPU, DSP, Controllers Memory chips RAM, ROM, EEPROM Analog Mobile communication, audio/video processing Programmable PLA, FPGA Embedded systems Used in cars,

More information

HOME :: FPGA ENCYCLOPEDIA :: ARCHIVES :: MEDIA KIT :: SUBSCRIBE

HOME :: FPGA ENCYCLOPEDIA :: ARCHIVES :: MEDIA KIT :: SUBSCRIBE Page 1 of 8 HOME :: FPGA ENCYCLOPEDIA :: ARCHIVES :: MEDIA KIT :: SUBSCRIBE FPGA I/O When To Go Serial by Brock J. LaMeres, Agilent Technologies Ads by Google Physical Synthesis Tools Learn How to Solve

More information

ESD Protection Device Simulation and Design

ESD Protection Device Simulation and Design ESD Protection Device Simulation and Design Introduction Electrostatic Discharge (ESD) is one of the major reliability issues in Integrated Circuits today ESD is a high current (1A) short duration (1ns

More information

250nm Technology Based Low Power SRAM Memory

250nm Technology Based Low Power SRAM Memory IOSR Journal of VLSI and Signal Processing (IOSR-JVSP) Volume 5, Issue 1, Ver. I (Jan - Feb. 2015), PP 01-10 e-issn: 2319 4200, p-issn No. : 2319 4197 www.iosrjournals.org 250nm Technology Based Low Power

More information

6T- SRAM for Low Power Consumption. Professor, Dept. of ExTC, PRMIT &R, Badnera, Amravati, Maharashtra, India 1

6T- SRAM for Low Power Consumption. Professor, Dept. of ExTC, PRMIT &R, Badnera, Amravati, Maharashtra, India 1 6T- SRAM for Low Power Consumption Mrs. J.N.Ingole 1, Ms.P.A.Mirge 2 Professor, Dept. of ExTC, PRMIT &R, Badnera, Amravati, Maharashtra, India 1 PG Student [Digital Electronics], Dept. of ExTC, PRMIT&R,

More information

Diodes Incorporated Corporate Direction

Diodes Incorporated Corporate Direction Diodes Incorporated Corporate Direction Vision: Create Shareholder Value Goal 1: $1B Market Cap 2010 Goal 2: $1B Annual Revenue 2017* Goal 3: $1B Gross Profit Goal 4: $1B Profit Before Tax $1B PBT $1B

More information

VLSI Test Technology and Reliability (ET4076)

VLSI Test Technology and Reliability (ET4076) VLSI Test Technology and Reliability (ET4076) Lecture 8(2) I DDQ Current Testing (Chapter 13) Said Hamdioui Computer Engineering Lab Delft University of Technology 2009-2010 1 Learning aims Describe the

More information

CHAPTER 3 SIMULATION TOOLS AND

CHAPTER 3 SIMULATION TOOLS AND CHAPTER 3 SIMULATION TOOLS AND Simulation tools used in this simulation project come mainly from Integrated Systems Engineering (ISE) and SYNOPSYS and are employed in different areas of study in the simulation

More information

Samsung emcp. WLI DDP Package. Samsung Multi-Chip Packages can help reduce the time to market for handheld devices BROCHURE

Samsung emcp. WLI DDP Package. Samsung Multi-Chip Packages can help reduce the time to market for handheld devices BROCHURE Samsung emcp Samsung Multi-Chip Packages can help reduce the time to market for handheld devices WLI DDP Package Deliver innovative portable devices more quickly. Offer higher performance for a rapidly

More information

Efficient Design of Power Module Using Semiconductor Device Model and Current Pathway Model

Efficient Design of Power Module Using Semiconductor Device Model and Current Pathway Model Keihin Technical Review Vol.7 (2018) Technical Digest Efficient Design of Power Module Using Semiconductor Device Model and Current Pathway Model Shiho ARIMOTO *1 Takayoshi KIHARA *1 1. Introduction 2.

More information

Investigation on seal-ring rules for IC product reliability in m CMOS technology

Investigation on seal-ring rules for IC product reliability in m CMOS technology Microelectronics Reliability 45 (2005) 1311 1316 www.elsevier.com/locate/microrel Investigation on seal-ring rules for IC product reliability in 0.25- m CMOS technology Shih-Hung Chen a * and Ming-Dou

More information

Deliver Value and Customer Satisfaction! CONTENTS

Deliver Value and Customer Satisfaction! CONTENTS CONTENTS Introduction Company Profile Organization Product Scope Product Road map Application Technology IC Design Quality Policy & System Key Advantages Key Customers Vision Cooperation Worldwide INTRODUCTION

More information

APR9301 APLUS INTEGRATED CIRCUITS INC. Single-Chip Voice Recording & Playback Device for Single 20 to 30 Second Message. Features

APR9301 APLUS INTEGRATED CIRCUITS INC. Single-Chip Voice Recording & Playback Device for Single 20 to 30 Second Message. Features INTEGRATED CIRCUITS I. Features Single-Chip Voice Recording & Playback Device for Single 20 to 30 Second Message Single-chip, high quality voice recording & playback solution - No external ICs required

More information

A Low Power 32 Bit CMOS ROM Using a Novel ATD Circuit

A Low Power 32 Bit CMOS ROM Using a Novel ATD Circuit International Journal of Electrical and Computer Engineering (IJECE) Vol. 3, No. 4, August 2013, pp. 509~515 ISSN: 2088-8708 509 A Low Power 32 Bit CMOS ROM Using a Novel ATD Circuit Sidhant Kukrety*,

More information

PAPER MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process

PAPER MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process IEICE TRANS. ELECTRON., VOL.E88 C, NO.3 MARCH 2005 429 PAPER MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process Ming-Dou KER a), Kun-Hsien LIN, and Che-Hao CHUANG, Nonmembers

More information

ECE 261: Full Custom VLSI Design

ECE 261: Full Custom VLSI Design ECE 261: Full Custom VLSI Design Prof. James Morizio Dept. Electrical and Computer Engineering Hudson Hall Ph: 201-7759 E-mail: jmorizio@ee.duke.edu URL: http://www.ee.duke.edu/~jmorizio Course URL: http://www.ee.duke.edu/~jmorizio/ece261/261.html

More information

Low-Power Technology for Image-Processing LSIs

Low-Power Technology for Image-Processing LSIs Low- Technology for Image-Processing LSIs Yoshimi Asada The conventional LSI design assumed power would be supplied uniformly to all parts of an LSI. For a design with multiple supply voltages and a power

More information

EE5780 Advanced VLSI CAD

EE5780 Advanced VLSI CAD EE5780 Advanced VLSI CAD Lecture 1 Introduction Zhuo Feng 1.1 Prof. Zhuo Feng Office: EERC 513 Phone: 487-3116 Email: zhuofeng@mtu.edu Class Website http://www.ece.mtu.edu/~zhuofeng/ee5780fall2013.html

More information

SCR Device With Double-Triggered Technique for On-Chip ESD Protection in Sub-Quarter-Micron Silicided CMOS Processes

SCR Device With Double-Triggered Technique for On-Chip ESD Protection in Sub-Quarter-Micron Silicided CMOS Processes 58 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 3, NO. 3, SEPTEMBER 2003 SCR Device With Double-Triggered Technique for On-Chip ESD Protection in Sub-Quarter-Micron Silicided CMOS Processes

More information

Design of local ESD clamp for cross-power-domain interface circuits

Design of local ESD clamp for cross-power-domain interface circuits This article has been accepted and published on J-STAGE in advance of copyediting. Content is final as presented. IEICE Electronics Express, Vol.* No.*,*-* Design of local ESD clamp for cross-power-domain

More information

Golam R Chowdhury Will Rogers Lane phone: cell Austin, TX 78727

Golam R Chowdhury Will Rogers Lane phone: cell Austin, TX 78727 Golam R Chowdhury 13501 Will Rogers Lane phone: 512 587 9237 cell golamc@gmail.com Austin, TX 78727 Objective: Seeking an Adjunct Faculty Position in Electrical Engineering. Profile With a combined experience

More information

INEL-6080 VLSI Systems Design

INEL-6080 VLSI Systems Design INEL-6080 VLSI Systems Design ooooooo Prof. Manuel Jiménez Lecture 1 Introduction Computational Devices The idea of developing computing devices is certainly not new A few chronological examples show the

More information

SLC vs. MLC: An Analysis of Flash Memory

SLC vs. MLC: An Analysis of Flash Memory SLC vs. MLC: An Analysis of Flash Memory Examining the Quality of Memory: Understanding the Differences between Flash Grades Table of Contents Abstract... 3 Introduction... 4 Flash Memory Explained...

More information

Volterra Semiconductor

Volterra Semiconductor Silicon Power Solutions Volterra Semiconductor Jefferies 2013 Conference May 7, 2013 Mike Burns, CFO Nasdaq: VLTR Safe Harbor Statements This presentation contains forward-looking statements based on current

More information