Holonomic Power Integrity Signoff Methodology of Mobile Baseband Processor. Steven Guo Deputy Director IC-Packaging Codesign Aug 5,2014
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1 Holonomic Power Integrity Signoff Methodology of Mobile Baseband Processor Steven Guo Deputy Director IC-Packaging Codesign Aug 5,2014
2 Spreadtrum and Product Introduction TD- SCDMA GSM WCDMA FDD-LTE TD-LTE GSM/EDGE/TD-SCDMA/WCDMA/TD-LTE/FDD-LTE Feature Phone /Smart Phone/Tablet / Datacard 提供一站式解决方案追求产品差异化缩短上市时间 Cadence Design Systems, Inc. All rights reserved.
3 Mobile Devices, Today & Tomorrow (I) Lifelike Graphics Larger Display Better User Experience Smarter Features High-Speed Connectivity 3G/4G/5G Biometrics/ Health/Medical Computing Everywhere Multi-Core Processing 3D Cadence Design Systems, Inc. All rights reserved.
4 Mobile Devices, Today & Tomorrow (II) Higher graphic resolution Heavier application HD: 1280x720 More density, higher band-width x32 x32 x32 Denisty:16GB/24GB/32GB 2K: 1920x1080 4K: 3840x2160 8K: 7680x4320 Technology Less Power, Always-on & Connected 18/12/8 inch 450/300/200mm Quad Core 28nm/16nm/10nm Thinner and Lighter (mm) Cadence Design Systems, Inc. All rights reserved.
5 Mobile DRAM will Exceed PC DRAM Performance Video/Graphic Computing Wireless Connectivity 25.6GBps (64 IO * 3.2Gbps) Cadence Design Systems, Inc. All rights reserved.
6 Lower Power Design and Power Trend Power /Temperature Leakage Current /Dynamic Power Dynamic Power Static Power Battery-Limit Thermal -Limit (Mobile Devices) Low Power Design Low Vth um 90nm 55nm 40nm 32nm 28nm 20nm 16nm 14nm 10nm 7nm 5G Cadence Design Systems, Inc. All rights reserved.
7 Power Signoff Challenges of Mobile Chips Less Design Margin VDD: 0.9V L * di /dt Lower Vt Larger Leakage Cadence Design Systems, Inc. All rights reserved.
8 Power Integrity Analysis Collaborating Across Team IC Power Analysis Designer Package Electrical Analysis Engineer System Electrical Analysis Engineer PI is not just IC Designer s Job Cadence Design Systems, Inc. All rights reserved.
9 System/IC-Centric PI Co-simulation PMIC/DC-DC PCB/Decap On-Package IR-Drop Source: Ball Sink: Bump Cadence Design Systems, Inc. All rights reserved. On-Chip IR-Drop Source : Bump Sink: Macros /Memory Standard Cell
10 Schematic representation of a Chip/System Co-simulation DC-DC Decap PCB PPM Static: Pure-R pin network Dynamic: RLCK pin network Ball RDL Layer... Mx Layer... Cells/ Poly/Circuit Switching Current Cadence Design Systems, Inc. All rights reserved. Cdie Bump Standard /Memory DPM DC: Die Current /DC AC: Die Current /PWL
11 Flipchip Baseband /Application Processor Case Ball: 492 Bumps: 1537 Power Net: VDDCORE 0.9V (TT) VDDARM 1.0V (TT) Ground Net: VSSCORE Cadence Design Systems, Inc. All rights reserved.
12 System-Centric DC IR-Drop simulation with DPM Cadence Design Systems, Inc. All rights reserved.
13 System-Centric DC IR-Drop simulation with DPM (cont.) On-Die Resistance network Cadence Design Systems, Inc. All rights reserved.
14 Package Bump Pad Current (without and with DPM) Substrate Bump Pin Current Substrate Bump Pin Current Equal Current without DPM Unequal/Distributed Current with DPM Cadence Design Systems, Inc. All rights reserved.
15 Package Bump Pad IR-Drop (without and with DPM) Equal Current without DPM Unequal/Distributed Current with DPM Cadence Design Systems, Inc. All rights reserved.
16 Package Current Density Distribution (without and with DPM) Current Density without DPM Current Density with DPM Cadence Design Systems, Inc. All rights reserved.
17 Chip-centric Static/Dynamic IR-Drop Simulation Cadence Design Systems, Inc. All rights reserved.
18 Link PPM Model with Voltus in IR-Drop Simulation R L C K MCP Net Grouped Total Distributed Cadence Design Systems, Inc. All rights reserved.
19 Chip VSSCORE Static IR-Drop (without and with PPM) Max: 0.016V Max: 0.021V Without PPM With PPM Cadence Design Systems, Inc. All rights reserved.
20 Chip VDDCORE Static IR-Drop (without and with PPM) Min: 0.881V Without PPM Min: 0.879V With PPM Cadence Design Systems, Inc. All rights reserved.
21 Summary The new Co-simulation methodology bridge cross domain (Package and IC) database interchange easily and effectively DPM model enables to predict more accurate current distribution on each bump pad, week design region and optimize the substrate design before chip tape Dynamic IR-Drop with PPM helps to find more real transient voltage and ripple noise, enable IC designer to optimize the on-chip Power Grid design Cadence Design Systems, Inc. All rights reserved.
22 Thank You
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