Olivier Vatel. Accelerated innovation through strategic collaboration: a view from an equipment supplier CTO. July 10, 2018 SE L1
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1 1 SE L1 SCREEN Semiconductor Solutions Co., Ltd. Accelerated innovation through strategic collaboration: a view from an equipment supplier Olivier Vatel SCREEN Semiconductor Solutions Co., Ltd. CTO July 10, 2018
2 2 SE L1 SCREEN Semiconductor Solutions Co., Ltd. AGENDA Company outline and Product Line-up LETI collaboration A long History Wet Clean & Litho. Track highlights Focus on Laser anneal collaboration Conclusion
3 3 SE L1 SCREEN Semiconductor Solutions Co., Ltd. Providing leading-edge technology and solutions Company Name: Head Quarter: President: Product Line-up Kyoto, Japan Tadahiro Suhara Track Coat/Develop DT-3000 Market Share No.1 Wet Clean Single Semiconductor Equipment Solutions Metrology RE/VM series SU-3200 Market Share No.1 FC-3100 Wet Clean Batch Market Share No.1 Scrubber Clean Laser Anneal Flash Anneal LA-3000F LT-3100 Source: Gartner, April 2015
4 Product Line-up Ф200mm SS-3100 SU-3200 RF-310A Ф200mm SS-80EX Ф200mm WS-820L/WS-620C SS-3200 Scrubber Wet Station SU-3300 Single Wafer Cleaner Coat/Develop Track Semiconductor Equipment Solutions DT-3000 Direct Imaging System LA-3000-F Annealing System Ф100mm LT-3000/3100 Ф200mm LA-830 Measurement System Frontier Project for 200mm FC-3100 Ф100mm VM-1200/1300 Series Ф50mm VM-1020/1030 Series Ф200mm SU-2000 ZI-2000 Ф200mm DW-3000 Ф200mm Ф200mm FC-821L Ф150mm RE-3100/3300 Series Ф100mm VM-2200/3200 Series Ф200mm CW-1500 DW-3000 for PLP 600mm 4 SE L1 SCREEN Semiconductor Solutions Co., Ltd.
5 Office and Plants Locations Process Technology Center (Hikone Plant) Fab. FC-1 FC-2 (Hikone Plant) Shiga Pref. Japan Headquarter Taga Plant WHITE CANVAS RAKUSAI (Rakusai Site) Source:Google, ZENRIN SE L1 SCREEN Semiconductor Solutions Co., Ltd. Global Training Center (Yasu Plant)
6 6 SE L1 SCREEN Semiconductor Solutions Co., Ltd. LETI Partnerships in Wet, Laser Anneal & Litho Tracks FLX-1200 E-Beam
7 LETI-SCREEN wet technology engagement 2012: SCREEN engagement via JDP s in FDSOI community. (STMicroelectronics, SOITEC, LETI) 2012: Installation of first WET Single Wafer Cleaner SU-3100 for FEOL applications. 2014: Installation of second WET Single Wafer Cleaner SU-3100 for BEOL applications. 2015: SCREEN joined European program WAYTOGOFAST. Single Wafer Cleaner SU-3100 Single Wafer Cleaner SU SE L1 SCREEN Semiconductor Solutions Co., Ltd.
8 8 SE L1 SCREEN Semiconductor Solutions Co., Ltd. Why Lithography Alternatives Are Essential KEY PROJECTS: 1. Leti IDEAL JDA to achieve DSA POR and process yield (CH Via) 2. Leti IMAGINE JDA to achieve E-Beam POR enabling new market 3. Improve Defect /CDU /LWR with new technologies Article in Solid State Technology from Laurent Pain, Raluca Tiron, Ludovic Lattard, Stefan Landis and Cyrille Laviron 4. New process development with chemical venders
9 Conference publication with Leti SPIE Advanced Lithography 2013~2018 The potential of block copolymer s directed self-assembly for contact hole shrink and contact multiplication (2013) 300mm pilot line DSA contact hole process stability (2014) Handling, clamping and alignment evaluation for Multi-beam technology on Matrix1.1 platform (2014) Investigation of coat-develop track system for placement error of contact hole shrink process (2016) DSA process window extension via controlled atmospheric conditions through accurate defectivity and roughness measurements (2017) A track process for solvent annealing of high-χ BCPs (2017) DSA Process Window Expansion by Oxygen Concentration (2018) International Symposium on DSA 2015, 2016, SE L1 SCREEN Semiconductor Solutions Co., Ltd.
10 10 SE L1 SCREEN Semiconductor Solutions Co., Ltd. TODAY Under Installation E-Beam Exposure niche market development for rapid prototype IC Immersion ArF Lithography NXT:1970Ci CEA-LETI DSA E-Beam FX-1200 E-Beam Exposure Tool track in-line integration track in-line integration
11 11 SE L1 SCREEN Semiconductor Solutions Co., Ltd. LASSE Laser Systems and Solutions of Europe SAS Development and production of Laser Thermal Anneal Establishment:June, 2014 President:Tadahiro Suhara Rue Alexandre, Bldg D F Gennevilliers, France Tel: Main product: Laser Annealer LT-3000/3100 New 2014 SCREEN Group Company: Laser anneal LASSE HQ Factory Ф200mm SCREEN Process Technology Center Leti-LASSE Process Ultra-Iow Thermal Budget Development lab Achieving the highest possible temperature gradient in sub-micro seconds, LT tools are able to anneal fragile substrates without damaging critical device structures. Full Device Exposure Annealing one die, a group of dies or only the desired region in a single shot, the LT makes it all possible by shaping the beam size to meet process and device requirements without stitching. Dopant Activation Control Obtaining unprecedented high line and parametric yield levels are only possible with the LT annealing process. By melt-annealing, the dopants are superactivated and the low resistance layer is defect free.
12 LT-3100 UV ns laser annealing The only production proven Melt Laser Anneal Technology High Energy UV pulsed (160 ns) laser for shallow anneal Step & repeat anneal process up to full field size (no stitching) High productivity and modular platform 12 SE L1 SCREEN Semiconductor Solutions Co., Ltd.
13 Tmax ( C) 13 SE L1 SCREEN Semiconductor Solutions Co., Ltd. Thermal Annealing Technology Portfolio >3000C Laser L. Rebohle et al " Semiconductor Science and Technology (2016): Flash Lamp spike RTP Furnace E-09 1.E-07 1.E-05 1.E-03 1.E-01 1.E+01 1.E+03 1.E+05
14 14 SE L1 SCREEN Semiconductor Solutions Co., Ltd. CoolCube : 3D integration challenges Candidate application for laser annealing From leti CoolCube Program Need for process solution capable of surface localized annealing without affecting buried structure
15 Arsenic junction Increasing laser energy LT-3100 for Monolithic 3D integration Ultra localized annealing on top layer: Crystallization Activation Stress engineering P. Batude et al, VLSI 2011 S. Kerdilès et al. in proceeding IWJT SE L1 SCREEN Semiconductor Solutions Co., Ltd.
16 16 SE L1 SCREEN Semiconductor Solutions Co., Ltd. CoolCube Interconnect robustness to LT-3100 Interconnect not degraded at high temperature in nanosecond timescale C. Fenouillet S3S 2015 (Leti)
17 17 SE L1 SCREEN Semiconductor Solutions Co., Ltd. Cu ULK Cu ULK Cu Cu ULK Cu ULK Cu T ( C) T ( C) Cu Cu T ( C) T ( C) SCREEN Melt laser simulation development Laser integration supported by LASSE Innovation Booster Simulating thermal, phases, diffusion dynamics during laser annealing 50nm SiO2 SiO2 Fully-owned Standalone software Native 3D Collaborating and developing with top academic experts Customer oriented Optimized for LT technology a-si Area with a slightly higher T ULK SiO2 ULK nm SiO a-si SiO2 Dense interconnect ULK ULK SiO2 Relaxed interconnect
18 18 SE L1 SCREEN Semiconductor Solutions Co., Ltd. Conclusion Accelerated Innovation through Strategic Collaboration 1. This is not a nice to have value proposition 2. Build overtime through deep technology exchange 3. Mutually beneficial Need to offer Win-Win 4. Benefits our customers with innovation acceleration
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