AltaSens A5262-4T 4.5 Megapixel CMOS Image Sensor 0.18 µm IBM Process

Size: px
Start display at page:

Download "AltaSens A5262-4T 4.5 Megapixel CMOS Image Sensor 0.18 µm IBM Process"

Transcription

1 AltaSens A5262-4T 4.5 Megapixel CMOS Image Sensor 0.18 µm IBM Process Imager Process Review For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call Sales at Chipworks Richmond Road, Suite 500, Ottawa, ON K2H 5B7, Canada Tel: Fax:

2 Imager Process Review Table of Contents 1 Overview 1.1 List of Figures 1.2 List of Tables 1.3 Company Profile 1.4 Introduction 1.5 Device Summary 1.6 Process Summary 2 Package and Die 2.1 Package 2.2 Die 2.3 Die Features 3 Process 3.1 General Structure 3.2 Organic Layers 3.3 Bond Pads 3.4 Dielectrics 3.5 Metals 3.6 Vias and Contacts 3.7 Peripheral Transistors and Poly 3.8 MIM Capacitors 3.9 Isolation 3.10 Wells, Epi, and Substrate 4 Pixel Array Analysis 4.1 Pixel Schematic 4.2 Pixel Array Plan View Analysis 4.3 Pixel Array Cross-Sectional Analysis 5 Memory Cell Analysis 5.1 Multi-Port SRAM Overview 5.2 Multi-Port SRAM Plan View Analysis 6 Critical Dimensions 6.1 Package and Die 6.2 Vertical Dimensions 6.3 Horizontal Dimensions

3 Imager Process Review 7 References 8 Statement of Measurement Uncertainty and Scope Variation Report Evaluation

4 Overview Overview 1.1 List of Figures 2 Package and Die Hitachi DZ-BD7H HD Camcorder Identification Markings of Hitachi DZ-BD7H HD Camcorder Hitachi DZ-BD7H HD Camcorder Side View Hitachi DZ-BD7H HD Camcorder Front View Inside of Hitachi DZ-BD7H HD Camcorder A5262-4T Image Sensor and Lens Assembly Extracted from the Hitachi DZ-BD7H A5262-4T Package on PCB Top View A5262-4T Package on PCB X-Ray A5262-4T Package on PCB with Copper Plate Intact Bottom View A5262-4T Package on PCB With Copper Plate Removed Bottom View A5262-4T Package on PCB X-Ray Top View Die Photograph Intact Die Photograph Decapsulated Die Markings Die Markings A5262-4T Metal 1 Die Photograph Annotated Die Photograph Die Corner A Die Corner B Die Corner C Die Corner D Die Edge A Die Edge B Die Edge C Die Edge D Minimum Pitch Bond Pads Minimum Pitch Bond Pads Detail Pixel Array Corner A Pixel Array Corner B Pixel Array Corner C Pixel Array Corner D SRAM Block

5 Overview Process Array General Structure Peripheral General Structure Die Edge and Die Seal Die Seal and Organic Layer Edge Blue Filter Edge Organic Lens Boundary Bond Pad Right Bond Pad Edge Left Bond Pad Edge Left Bond Pad Edge Detail Passivation ILD ILD PMD PMD 1 and Pixel AR Layer Minimum Peripheral Metal Minimum Pitch Metal Minimum Metal Metal 2 TEM Minimum Metal Metal 1 TEM Minimum Pitch Via 3s Minimum Pitch Via 2s Minimum Pitch Via 1s Minimum Pitch Contacts to Poly Contact to Poly TEM Minimum Pitch Contacts to Substrate Peripheral NMOS Glass Etch Peripheral NMOS Si Etch Peripheral PMOS Si Etch MIM Capacitor MIM Capacitor in Detail Contact to Lower Plate MIM Capacitor in Detail Contact to Upper Plate Minimum Width STI in Periphery Poly Over STI TEM Minimum Width STI in Pixel Area Peripheral P-Wells at the Die Edge Peripheral P-Wells and N-Wells SCM Peripheral Wells at Die Edge SCM Peripheral Wells at Die Edge Detail SCM Peripheral Wells Detail SRP Periphery P-Well SRP in Periphery Shallow N-Well SRP in Pixel Array

6 Overview Pixel Array Analysis Pixel Schematic Circuit Pixel Array Corner Optical Pixel Array Lenses Pixel Array Lenses Tilt View Pixel Array at Metal Pixel Array at Metal Pixel Array at Metal 2 Detail Pixel Array at Via Pixel Array at Metal Pixel Array at Poly Pixel Array at Poly Detail Pixel Array at Substrate Pixel Array at Substrate SCM Pixel Array at Substrate Detail SCM Pixel at Poly Showing Cross-Sectional Planes Plan View Pixel Array General Structure (S1 Blue-Green Filters) Pixel Array General Structure (S1 Red-Green Filters) Pixel Array Right Edge (S1) Pixel Array Bottom Edge (S2) Lenses and Green Color Filters (S2) TEM Lenses and Red Color Filters (S2) TEM Blue Color Filters (S2) TEM Blue and Green Color Filter Edge (S2) TEM General Structure T1 and T4 Transfer Transistors (S2) General Structure T2 and T3 Transfer Transistors (S2) T2/T3 Transfer Transistors (S2) TEM General Structure T5 Transistor (S1) General Structure T6 and T7 Transistors (S1) T1 Transfer Transistor (S2) Glass Etch T1 Transfer Transistor (S2) Silicon Etch T2 Transfer Transistor (S2) Silicon Etch T3 Transfer Transistor (S2) Silicon Etch T4 Transfer Transistor (S2) Silicon Etch Transfer Transistor and FD Contact TEM Transfer Transistor in Detail TEM Right Edge of Transfer Transistor TEM TEM Transfer Transistor Gate Oxide TEM SCM Pixel Through Transfer Transistors (S2) SCM Pixel Through Transfer Transistors (S2) Detail

7 Overview Reset Transistor T5 (S1) Source Follower Transistor T6 (S1) Row Select Transistor T7 (S1) Reset Transistor T5 Width (S2) Source Follower Transistor T6 Width (S2) Row Select Transistor T7 Width (S2) 5 Memory Cell Analysis Single Multi-Port SRAM Sub-Block Multi-Port SRAM Metal Multi-Port SRAM Poly Multi-Port SRAM in Detail Poly SRAM Transistor Width TEM SRAM Transistor Gate Oxide ROM Block ROM Poly

8 Overview List of Tables 1 Overview Device Identification Device Summary Summary of Major Findings 2 Package and Die Functional Block Sizes Die and Bond Pad Dimensions 3 Process Dielectric Composition and Thicknesses Metallization Composition and Thicknesses Minimum Metals Horizontal Dimensions Via and Contact Horizontal Dimensions Transistor and Polysilicon Horizontal Dimensions Transistor and Polysilicon Vertical Dimensions Isolation Horizontal Dimensions Wells and Epi Vertical Dimensions 4 Pixel Array Analysis Pixel Horizontal Dimensions Pixel Vertical Dimensions Transistor Dimensions in Pixel Array 6 Critical Dimensions Die and Bond Pad Dimensions Dielectric Composition and Thicknesses Metallization Composition and Thicknesses Transistor and Polysilicon Vertical Dimensions Wells and Epi Vertical Dimensions Pixel Vertical Dimensions Minimum Metals Peripheral Horizontal Dimensions Minimum Metals Pixel Array Horizontal Dimensions Via and Contact Horizontal Dimensions Transistor and Polysilicon Horizontal Dimensions Isolation Horizontal Dimension Pixel Horizontal Dimensions Transistor Dimensions in Pixel Array

9 About Chipworks Chipworks is the recognized leader in reverse engineering and patent infringement analysis of semiconductors and electronic systems. The company s ability to analyze the circuitry and physical composition of these systems makes them a key partner in the success of the world s largest semiconductor and microelectronics companies. Intellectual property groups and their legal counsel trust Chipworks for success in patent licensing and litigation earning hundreds of millions of dollars in patent licenses, and saving as much in royalty payments. Research & Development and Product Management rely on Chipworks for success in new product design and launch, saving hundreds of millions of dollars in design, and earning even more through superior product design and faster launches. Contact Chipworks To find out more information on this report, or any other reports in our library, please contact Chipworks at: Chipworks 3685 Richmond Rd. Suite 500 Ottawa, Ontario K2H 5B7 Canada T: F: Web site: info@chipworks.com Please send any feedback to feedback@chipworks.com

Nokia N90 (Toshiba ET8EA3-AS) 2.0 Megapixel CMOS Image Sensor Process Review

Nokia N90 (Toshiba ET8EA3-AS) 2.0 Megapixel CMOS Image Sensor Process Review November 21, 2005 Nokia N90 (Toshiba ET8EA3-AS) 2.0 Megapixel CMOS Image Sensor Process Review For comments, questions, or more information about this report, or for any additional technical needs concerning

More information

Sharp NC µm Pixel CCD Image Sensor

Sharp NC µm Pixel CCD Image Sensor Sharp NC9610 1.75 µm Pixel CCD Image Sensor Imager Process Review For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology,

More information

Sharp NC Mp, 1.66 µm Pixel Size CCD Image Sensor

Sharp NC Mp, 1.66 µm Pixel Size CCD Image Sensor Sharp NC9670 10.3 Mp, 1.66 µm Pixel Size CCD Image Sensor Imager Process Review For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor

More information

Texas Instruments TMX320TCI6488ZUNV Baseband Processor System on a Chip

Texas Instruments TMX320TCI6488ZUNV Baseband Processor System on a Chip Texas Instruments TMX320TCI6488ZUNV Baseband Processor System on a Chip Structural Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning

More information

Sample Table of Contents

Sample Table of Contents Sample Table of Contents from System-on-Chip (SoC) For any additional technical needs concerning semiconductor and electronics technology, please call Sales at Chipworks. 3685 Richmond Road, Suite 500,

More information

Texas Instruments S W Digital Micromirror Device

Texas Instruments S W Digital Micromirror Device Texas Instruments S1076-6318W MEMS Process Review with Supplementary TEM Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor

More information

Canon Digic II CH Digital Image Processor Structural Analysis

Canon Digic II CH Digital Image Processor Structural Analysis March 3, 2005 Canon Digic II CH4-6270 Digital Image Processor Structural Analysis For questions, comments, or more information about this report, or for any additional technical needs concerning semiconductor

More information

STMicroelectronics STM32F103ZET6 32 Bit MCU. Advanced Functional Analysis

STMicroelectronics STM32F103ZET6 32 Bit MCU. Advanced Functional Analysis Advanced Functional Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call Sales at Chipworks. 3685

More information

Matsushita MN2DS0015 System on a Chip for DVD Players 65 nm CMOS Process Structural Analysis

Matsushita MN2DS0015 System on a Chip for DVD Players 65 nm CMOS Process Structural Analysis June 12, 2006 Matsushita MN2DS0015 System on a Chip for DVD Players 65 nm CMOS Process Structural Analysis For comments, questions, or more information about this report, or for any additional technical

More information

STMicroelectronics STM32F103ZET6 32 Bit MCU Embedded NOR Flash

STMicroelectronics STM32F103ZET6 32 Bit MCU Embedded NOR Flash 32 Bit MCU Embedded NOR Flash Process Review For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call Sales

More information

Samsung K9GAG08U0M-PCB0 16 Gbit Multi-Level Cell (MLC) 51 nm Process Technology NAND Flash Memory

Samsung K9GAG08U0M-PCB0 16 Gbit Multi-Level Cell (MLC) 51 nm Process Technology NAND Flash Memory Samsung K9GAG08U0M-PCB0 16 Gbit Multi-Level Cell (MLC) 51 nm Process Technology NAND Flash Memory Structural Analysis with Additional Layout Feature Analysis For comments, questions, or more information

More information

NVIDIA Tegra T20-H-A2 Application Processor TSMC 40 nm Low Power CMOS Process

NVIDIA Tegra T20-H-A2 Application Processor TSMC 40 nm Low Power CMOS Process NVIDIA Tegra T20-H-A2 Application Processor TSMC 40 nm Low Power CMOS Process Structural Analysis 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Structural

More information

Nan Ya NT5DS32M8BT-6K 256 Mbit DDR SDRAM Structural Analysis

Nan Ya NT5DS32M8BT-6K 256 Mbit DDR SDRAM Structural Analysis May 26, 2004 Nan Ya NT5DS32M8BT-6K 256 Mbit DDR SDRAM Structural Analysis For questions, comments, or more information about this report, or for any additional technical needs concerning semiconductor

More information

Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor

Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor Substrate Dopant Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning

More information

Numonyx JSPCM128A00B85ES 128 Mbit Phase Change Memory 90 nm BiCMOS PCM Process

Numonyx JSPCM128A00B85ES 128 Mbit Phase Change Memory 90 nm BiCMOS PCM Process Numonyx JSPCM128A00B85ES 90 nm BiCMOS PCM Process Structural Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology,

More information

Sigma Designs SMP8642 Secure Media Processor

Sigma Designs SMP8642 Secure Media Processor Sigma Designs SMP8642 Advanced Functional Analysis 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Advanced Functional Analysis Some of the information in this

More information

QUALCOMM MSM6275 Chipset

QUALCOMM MSM6275 Chipset QUALCOMM MSM6275 Chipset Functional Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call Sales

More information

Memjet ML Printhead from the RapidX1 Color Label Printer

Memjet ML Printhead from the RapidX1 Color Label Printer ML210700 Printhead from the RapidX1 Color Label Printer MEMS Process Review 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com MEMS Process Review Some of the

More information

Luxtera PN Silicon CMOS Photonic Chip Freescale 130 nm SOI CMOS Process

Luxtera PN Silicon CMOS Photonic Chip Freescale 130 nm SOI CMOS Process Luxtera PN1000001 Silicon CMOS Photonic Chip Process Review 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Process Review Some of the information in this

More information

Atmel MXT540E Touch Screen Controller

Atmel MXT540E Touch Screen Controller Atmel MXT540E Basic Functional Analysis 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Basic Functional Analysis Some of the information in this report may

More information

IBM 43E7488 POWER6 Microprocessor from the IBM System 8203-E4A Server

IBM 43E7488 POWER6 Microprocessor from the IBM System 8203-E4A Server 43E7488 from the IBM System 8203-E4A Server Package Analysis For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology, please

More information

Samsung S6E8AA0A01 Display Driver IC (DDI) Extracted from a Samsung Galaxy S III

Samsung S6E8AA0A01 Display Driver IC (DDI) Extracted from a Samsung Galaxy S III Samsung S6E8AA0A01 (DDI) Extracted from a Samsung Galaxy S III Functional Analysis 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Functional Analysis Some

More information

Samsung S5PC210 Exynos 4210 Application Processor

Samsung S5PC210 Exynos 4210 Application Processor Samsung S5PC210 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered by patents, mask, and/or copyright protection.

More information

Texas Instruments OMAP4460BCBS Application Processor

Texas Instruments OMAP4460BCBS Application Processor Texas Instruments OMAP4460BCBS 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered by patents, mask, and/or

More information

Layout Analysis Embedded Memory

Layout Analysis Embedded Memory Sample Report For any additional technical needs concerning semiconductor and electronics technology, please call Sales at Chipworks. 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7, Canada Tel: 613.829.0414

More information

Panasonic Mp, 4.4 µm Pixel Size LiveMOS Image Sensor from Panasonic LUMIX DMC-G1 Micro Four Thirds Digital Interchangeable Lens Camera

Panasonic Mp, 4.4 µm Pixel Size LiveMOS Image Sensor from Panasonic LUMIX DMC-G1 Micro Four Thirds Digital Interchangeable Lens Camera Panasonic 34310 12.1 Mp, 4.4 µm Pixel Size LiveMOS Image Sensor from Panasonic LUMIX DMC-G1 Micro Four Thirds Digital Interchangeable Lens Camera For comments, questions, or more information about this

More information

Broadcom BCM4335 5G Wi-Fi ac Combo Wireless Chip

Broadcom BCM4335 5G Wi-Fi ac Combo Wireless Chip Broadcom BCM4335 5G Wi-Fi 802.11ac Combo Wireless Chip 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered

More information

Layout Analysis I/O. Analysis from an HD Video/Audio SoC

Layout Analysis I/O. Analysis from an HD Video/Audio SoC Sample Report Analysis from an HD Video/Audio SoC For any additional technical needs concerning semiconductor and electronics technology, please call Sales at Chipworks. 3685 Richmond Road, Suite 500,

More information

Qualcomm APQ8064 Avenger Snapdragon S4 Pro Application Processor

Qualcomm APQ8064 Avenger Snapdragon S4 Pro Application Processor Qualcomm APQ8064 Avenger Snapdragon S4 Pro 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered by patents,

More information

Micron Technology. MT41K512M8RH Gb DDR3 SDRAM. Circuit Analysis DQ, VDDQ, and VREFDQ I/O Pads

Micron Technology. MT41K512M8RH Gb DDR3 SDRAM. Circuit Analysis DQ, VDDQ, and VREFDQ I/O Pads Micron Technology MT41K512M8RH-125 4 Gb DDR3 SDRAM Circuit Analysis DQ, VDDQ, and VREFDQ I/O Pads 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613.829.0414 Fax: 613.829.0515 www.chipworks.com

More information

Motorola Mobility T6VP0XBG-0001 Baseband Processor With FVP0 Die Markings From the Motorola Mobility DROID RAZR and BIONIC Smartphones

Motorola Mobility T6VP0XBG-0001 Baseband Processor With FVP0 Die Markings From the Motorola Mobility DROID RAZR and BIONIC Smartphones Motorola Mobility T6VP0XBG-0001 With FVP0 Die Markings From the Motorola Mobility DROID RAZR and BIONIC Smartphones 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com

More information

Samsung Exynos 5250 Dual ARM Cortex -A15 Application Processor

Samsung Exynos 5250 Dual ARM Cortex -A15 Application Processor Samsung Exynos 5250 Dual ARM Cortex -A15 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered by patents,

More information

SanDisk Flash Memory Controller. Partial Circuit Analysis

SanDisk Flash Memory Controller. Partial Circuit Analysis SanDisk 20-99-00121-1 Flash Memory Controller Partial Circuit Analysis For questions, comments, or more information about this report, or for any additional technical needs concerning semiconductor technology,

More information

Texas Instruments OMAP4430FCBS (with Die Markings F781821F) Application Processor

Texas Instruments OMAP4430FCBS (with Die Markings F781821F) Application Processor Texas Instruments OMAP4430FCBS (with Die Markings F781821F) 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered

More information

Qualcomm WCN3660/WCN3680 Wireless Combo Chips

Qualcomm WCN3660/WCN3680 Wireless Combo Chips Qualcomm WCN3660/WCN3680 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Combo Wireless Chips Some of the information in this report may be covered by patents,

More information

RF Micro Devices RF6260 Power Amplifier Module from the Samsung Galaxy S II Smartphone

RF Micro Devices RF6260 Power Amplifier Module from the Samsung Galaxy S II Smartphone RF Micro Devices RF6260 from the Samsung Galaxy S II Smartphone Package Analysis 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Package Analysis Some of the

More information

G 32 Gb NAND Flash Multichip Package Controller Die Internal Voltage Converter and Oscillator

G 32 Gb NAND Flash Multichip Package Controller Die Internal Voltage Converter and Oscillator SanDisk 03433-004G 32 Gb NAND Flash Multichip Package Controller Die Internal Voltage Converter and Oscillator Partial Circuit Analysis For questions, comments, or more information about this report, or

More information

Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor

Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor Custom Imager Process Review For comments, questions, or more information about this report, or for any additional technical needs

More information

NXP Semiconductors. HTRC110 HITAG Read/Write IC. Full Circuit Analysis

NXP Semiconductors. HTRC110 HITAG Read/Write IC. Full Circuit Analysis NXP Semiconductors HTRC110 HITAG Read/Write IC Full Circuit Analysis 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613.829.0414 Fax: 613.829.0515 www.chipworks.com Some of the information

More information

Marvell. 88SE9123-NAA2 SATA 6 Gb/s RAID Controller. SATA 3.0 Interface Analog Macro Circuit Analysis

Marvell. 88SE9123-NAA2 SATA 6 Gb/s RAID Controller. SATA 3.0 Interface Analog Macro Circuit Analysis Marvell 88SE9123-NAA2 SATA 6 Gb/s RAID Controller SATA 3.0 Interface Analog Macro Circuit Analysis For questions, comments, or more information about this report, or for any additional technical needs

More information

Texas Instruments. XIO2000AI PCI Express to PCI Bus Translation Bridge. PCI Express Interface Circuit Analysis

Texas Instruments. XIO2000AI PCI Express to PCI Bus Translation Bridge. PCI Express Interface Circuit Analysis Texas Instruments XIO2000AI PCI Express to PCI Bus Translation Bridge PCI Express Interface Circuit Analysis For questions, comments, or more information about this report, or for any additional technical

More information

Comparison of Nine SDRAM Devices. Focused Technology Review

Comparison of Nine SDRAM Devices. Focused Technology Review Comparison of Nine SDRAM Devices 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613.829.0414 www.chipworks.com Some of the information in this report may be covered by patents, mask and/or

More information

Texas Instruments. BQ2025 Single Wire Serial Interface for the Apple Lightning Cable. Full Circuit Analysis

Texas Instruments. BQ2025 Single Wire Serial Interface for the Apple Lightning Cable. Full Circuit Analysis Texas Instruments BQ2025 Single Wire Serial Interface for the Apple Lightning Cable Full Circuit Analysis 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613.829.0414 Fax: 613.829.0515 www.chipworks.com

More information

Broadcom BCM7405 HD Video/Audio System-on-Chip (SoC)

Broadcom BCM7405 HD Video/Audio System-on-Chip (SoC) Broadcom BCM7405 HD Video/Audio System-on-Chip (SoC) For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call

More information

Freescale. MCZ33905D5EK SBC Gen2 with CAN High Speed and LIN Interface. Circuit Analysis of Power Management Unit, CAN Interface, and LIN Block

Freescale. MCZ33905D5EK SBC Gen2 with CAN High Speed and LIN Interface. Circuit Analysis of Power Management Unit, CAN Interface, and LIN Block Freescale MCZ33905D5EK SBC Gen2 with CAN High Speed and LIN Interface Circuit Analysis of Power Management Unit, CAN Interface, and LIN Block 3685 Richmond Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel:

More information

STMicroelectronics L9959T Dual PMOS High-Side H-Bridge

STMicroelectronics L9959T Dual PMOS High-Side H-Bridge STMicroelectronics L9959T 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 www.chipworks.com Some of the information in this report may be covered by patents, mask and/or copyright

More information

LG Electronics LG4945 LCD Display Driver IC

LG Electronics LG4945 LCD Display Driver IC LG Electronics LG4945 Basic Functional Analysis 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 chipworks.com Basic Functional Analysis 2 Some of the information in this report

More information

Goodix BD10239A (ASIC Die from the GT1151) Touch Screen Controller ASIC

Goodix BD10239A (ASIC Die from the GT1151) Touch Screen Controller ASIC Goodix BD10239A (ASIC Die from the GT1151) Layout Analysis of Embedded Memory 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 chipworks.com Layout Analysis of Embedded Memory

More information

Apple iphone 6s Fingerprint Sensor

Apple iphone 6s Fingerprint Sensor Apple iphone 6s Basic Package Analysis 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 chipworks.com Basic Package Analysis 2 Some of the information in this report may be covered

More information

Samsung SGH-I987 Galaxy Tablet 7.0. Teardown Report

Samsung SGH-I987 Galaxy Tablet 7.0. Teardown Report Samsung SGH-I987 Galaxy Tablet 7.0 Teardown Report 2 Some of the information in this report may be covered by patents, mask and/or copyright protection. This report should not be taken as an inducement

More information

Samsung Exynos 5433 Application Processor

Samsung Exynos 5433 Application Processor Samsung Exynos 5433 Digital Library Circuit Analysis of the GPU 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 chipworks.com Digital Library Circuit Analysis of the GPU 2 Some

More information

Qualcomm MSM8974AC Snapdragon 801 Application Processor

Qualcomm MSM8974AC Snapdragon 801 Application Processor Qualcomm MSM8974AC Snapdragon 801 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 chipworks.com Some of the information in this report may be covered by patents, mask and/or

More information

Sony IMX214 Second Generation 13 Mp Exmor RS Stacked BSI CIS with SME-HDR

Sony IMX214 Second Generation 13 Mp Exmor RS Stacked BSI CIS with SME-HDR Sony IMX214 Second Generation 13 Mp Exmor RS Stacked BSI CIS with SME-HDR 1891 Robertson Road, Suite 500, Ottawa, ON K2H 5B7 Canada Tel: 613-829-0414 chipworks.com Some of the information in this report

More information

Xilinx XC4VLX25-FF668AGQ FPGA. IOB Circuit Analysis

Xilinx XC4VLX25-FF668AGQ FPGA. IOB Circuit Analysis Xilinx XC4VLX25-FF668AGQ FPGA IOB Circuit Analysis For questions, comments, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call

More information

Texas Instruments TMS320F2812GHHA DSP Embedded Flash Macro Partial Circuit Analysis

Texas Instruments TMS320F2812GHHA DSP Embedded Flash Macro Partial Circuit Analysis October 17, 2005 Texas Instruments TMS320F2812GHHA DSP Embedded Flash Macro Partial Circuit Analysis Table of Contents Introduction... Page 1 List of Figures... Page 5 Device Summary Sheet... Page 11 Flash

More information

Hewlett-Packard HDCS-2000 CMOS Image Sensor Circuit Analysis

Hewlett-Packard HDCS-2000 CMOS Image Sensor Circuit Analysis October 13, 2006 Hewlett-Packard HDCS-2000 CMOS Image Sensor Circuit Analysis Table of Contents Introduction... Page 1 List of Figures... Page 3 Device Summary Sheet... Page 11 Top Level Diagram...Tab

More information

Chapter 1 Introduction

Chapter 1 Introduction Chapter 1 Introduction 1.1 MOTIVATION 1.1.1 LCD Industry and LTPS Technology [1], [2] The liquid-crystal display (LCD) industry has shown rapid growth in five market areas, namely, notebook computers,

More information

Circuits Multi-Projets

Circuits Multi-Projets Circuits Multi-Projets 0.35µm, 0.18µm MPW services http://mycmp.fr Grenoble - France Available Processes Process Name Process Feature C35B4C3 0.35µm CMOS 3.3V / 5.0V C35B4C2 0.35µm CMOS 3.3V C35B4O1 C35B4OA

More information

IBG Protection for Anti-Fuse OTP Memory Security Breaches

IBG Protection for Anti-Fuse OTP Memory Security Breaches IBG Protection for Anti-Fuse OTP Memory Security Breaches Overview Anti-Fuse Memory IP is considered by some to be the gold standard for secure memory. Once programmed, reverse engineering methods will

More information

28F K (256K x 8) FLASH MEMORY

28F K (256K x 8) FLASH MEMORY 28F020 2048K (256K x 8) FLASH MEMOR SmartDie Product Specification Flash Electrical Chip Erase 2 Second Typical Chip Erase Quick-Pulse Programming Algorithm 10 ms Typical Byte Program 4 Second Chip Program

More information

AT&S Company. Presentation. 3D Component Packaging. in Organic Substrate. Embedded Component. Mark Beesley IPC Apex 2012, San Diego.

AT&S Company. Presentation. 3D Component Packaging. in Organic Substrate. Embedded Component. Mark Beesley IPC Apex 2012, San Diego. 3D Component Packaging AT&S Company in Organic Substrate Presentation Embedded Component Mark Beesley IPC Apex 2012, San Diego www.ats.net Austria Technologie & Systemtechnik Aktiengesellschaft Fabriksgasse13

More information

How Safe is Anti-Fuse Memory? IBG Protection for Anti-Fuse OTP Memory Security Breaches

How Safe is Anti-Fuse Memory? IBG Protection for Anti-Fuse OTP Memory Security Breaches How Safe is Anti-Fuse Memory? IBG Protection for Anti-Fuse OTP Memory Security Breaches Overview A global problem that impacts the lives of millions daily is digital life security breaches. One of the

More information

Circuits. L3: Fabrication and Layout -1 ( ) B. Mazhari Dept. of EE, IIT Kanpur. B. Mazhari, IITK. G-Number

Circuits. L3: Fabrication and Layout -1 ( ) B. Mazhari Dept. of EE, IIT Kanpur. B. Mazhari, IITK. G-Number EE60: CMOS Analog Circuits L: Fabrication and Layout - (8.8.0) B. Mazhari Dept. of EE, IIT Kanpur Suppose we have a Silicon wafer which is P-type and we wish to create a region within it which is N-type

More information

Mosel Vitelic (IBM-Siemens) V53C181608K60 1Mx16 CMOS EDO DRAM

Mosel Vitelic (IBM-Siemens) V53C181608K60 1Mx16 CMOS EDO DRAM May 19, 1998 Mosel Vitelic (IBM-Siemens) V53C181608K60 1Mx16 CMOS EDO DRAM Abstract: The Mosel Vitelic V53C181608K60 is a 1Mx16 CMOS DRAM featuring EDO Page Mode Operation, self-refresh, hidden refresh

More information

Memory Design I. Array-Structured Memory Architecture. Professor Chris H. Kim. Dept. of ECE.

Memory Design I. Array-Structured Memory Architecture. Professor Chris H. Kim. Dept. of ECE. Memory Design I Professor Chris H. Kim University of Minnesota Dept. of ECE chriskim@ece.umn.edu Array-Structured Memory Architecture 2 1 Semiconductor Memory Classification Read-Write Wi Memory Non-Volatile

More information

Lay ay ut Design g R ules

Lay ay ut Design g R ules HPTER 5: Layout esign Rules Introduction ny circuit physical mask layout must conform to a set of geometric constraints or rules called as Layout esign rules before it can be manufactured using particular

More information

Scanning Acoustic Microscopy For Metrology of 3D Interconnect Bonded Wafers

Scanning Acoustic Microscopy For Metrology of 3D Interconnect Bonded Wafers Scanning Acoustic Microscopy For Metrology of 3D Interconnect Bonded Wafers Jim McKeon, Ph.D. - Sonix, Director of Technology Sriram Gopalan, Ph.D. - Sonix, Technology Engineer 8700 Morrissette Drive 8700

More information

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website : 9 rue Alfred Kastler - BP 10748-44307 Nantes Cedex 3 - France Phone : +33 (0) 240 180 916 - email : info@systemplus.fr - website : www.systemplus.fr August 2011 - Version 1 Written by: Sylvain HALLEREAU

More information

HIGH SPEED TDI EMBEDDED CCD IN CMOS SENSOR

HIGH SPEED TDI EMBEDDED CCD IN CMOS SENSOR HIGH SPEED TDI EMBEDDED CCD IN CMOS SENSOR P. Boulenc 1, J. Robbelein 1, L. Wu 1, L. Haspeslagh 1, P. De Moor 1, J. Borremans 1, M. Rosmeulen 1 1 IMEC, Kapeldreef 75, B-3001 Leuven, Belgium Email: pierre.boulenc@imec.be,

More information

Introduction 1. GENERAL TRENDS. 1. The technology scale down DEEP SUBMICRON CMOS DESIGN

Introduction 1. GENERAL TRENDS. 1. The technology scale down DEEP SUBMICRON CMOS DESIGN 1 Introduction The evolution of integrated circuit (IC) fabrication techniques is a unique fact in the history of modern industry. The improvements in terms of speed, density and cost have kept constant

More information

EECS 598: Integrating Emerging Technologies with Computer Architecture. Lecture 10: Three-Dimensional (3D) Integration

EECS 598: Integrating Emerging Technologies with Computer Architecture. Lecture 10: Three-Dimensional (3D) Integration 1 EECS 598: Integrating Emerging Technologies with Computer Architecture Lecture 10: Three-Dimensional (3D) Integration Instructor: Ron Dreslinski Winter 2016 University of Michigan 1 1 1 Announcements

More information

Circuits Multi-Projets

Circuits Multi-Projets Circuits Multi-Projets Technology Processes & Runs in 2017 MPW Service Center for ICs, Photonics, & MEMS Prototyping & Low Volume Production http://mycmp.fr Grenoble - France Available Processes Process

More information

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape Edition April 2017 Semiconductor technology & processing 3D systems-on-chip A clever partitioning of circuits to improve area, cost, power and performance. In recent years, the technology of 3D integration

More information

Magnetic core memory (1951) cm 2 ( bit)

Magnetic core memory (1951) cm 2 ( bit) Magnetic core memory (1951) 16 16 cm 2 (128 128 bit) Semiconductor Memory Classification Read-Write Memory Non-Volatile Read-Write Memory Read-Only Memory Random Access Non-Random Access EPROM E 2 PROM

More information

Process Technologies for SOCs

Process Technologies for SOCs UDC 621.3.049.771.14.006.1 Process Technologies for SOCs VTaiji Ema (Manuscript received November 30, 1999) This paper introduces a family of process technologies for fabriating high-performance SOCs.

More information

Micron MT54V512H18EF-10 9Mb QDR SRAM Circuit Analysis

Micron MT54V512H18EF-10 9Mb QDR SRAM Circuit Analysis May 14, 2002 Micron MT54V512H18EF-10 9Mb QDR SRAM Circuit Analysis Table of Contents Introduction... Page 1 List of Figures... Page 4 Device Summary Sheet... Page 12 Top Level Diagram...Tab 1 Data Path...Tab

More information

Monolithic 3D Integration using Standard Fab & Standard Transistors. Zvi Or-Bach CEO MonolithIC 3D Inc.

Monolithic 3D Integration using Standard Fab & Standard Transistors. Zvi Or-Bach CEO MonolithIC 3D Inc. Monolithic 3D Integration using Standard Fab & Standard Transistors Zvi Or-Bach CEO MonolithIC 3D Inc. 3D Integration Through Silicon Via ( TSV ), Monolithic Increase integration Reduce interconnect total

More information

Lecture 4a. CMOS Fabrication, Layout and Simulation. R. Saleh Dept. of ECE University of British Columbia

Lecture 4a. CMOS Fabrication, Layout and Simulation. R. Saleh Dept. of ECE University of British Columbia Lecture 4a CMOS Fabrication, Layout and Simulation R. Saleh Dept. of ECE University of British Columbia res@ece.ubc.ca 1 Fabrication Fabrication is the process used to create devices and wires. Transistors

More information

Digital Integrated Circuits (83-313) Lecture 2: Technology and Standard Cell Layout

Digital Integrated Circuits (83-313) Lecture 2: Technology and Standard Cell Layout Digital Integrated Circuits (83-313) Lecture 2: Technology and Standard Cell Layout Semester B, 2016-17 Lecturer: Dr. Adam Teman TAs: Itamar Levi, Robert Giterman 26 March 2017 Disclaimer: This course

More information

Packaging of Selected Advanced Logic in 2x and 1x nodes. 1 I TechInsights

Packaging of Selected Advanced Logic in 2x and 1x nodes. 1 I TechInsights Packaging of Selected Advanced Logic in 2x and 1x nodes 1 I TechInsights Logic: LOGIC: Packaging of Selected Advanced Devices in 2x and 1x nodes Xilinx-Kintex 7XC 7 XC7K325T TSMC 28 nm HPL HKMG planar

More information

Memory Design I. Semiconductor Memory Classification. Read-Write Memories (RWM) Memory Scaling Trend. Memory Scaling Trend

Memory Design I. Semiconductor Memory Classification. Read-Write Memories (RWM) Memory Scaling Trend. Memory Scaling Trend Array-Structured Memory Architecture Memory Design I Professor hris H. Kim University of Minnesota Dept. of EE chriskim@ece.umn.edu 2 Semiconductor Memory lassification Read-Write Memory Non-Volatile Read-Write

More information

Mixed-Signal&RF -0.18μm. 0.18um Process Feature. 0.18um Process Device Feature. 0.18um Process Key Design Rule. Isolation

Mixed-Signal&RF -0.18μm. 0.18um Process Feature. 0.18um Process Device Feature. 0.18um Process Key Design Rule. Isolation Mixed-Signal/RF-0.18μm CSMC 0.18 micron process is process-matched to other foundry. CSMC logic process provide generic and low power process. 0.18 micron process provide 1.8V operation voltage core device,

More information

Solving Integration Challenges for Printed and Flexible Hybrid Electronics

Solving Integration Challenges for Printed and Flexible Hybrid Electronics Solving Integration Challenges for Printed and Flexible Hybrid Electronics SEMICON West 16 July 2015 Proprietary Information www.americansemi.com What are Flexible Hybrid Electronics 2 Flexible Hybrid

More information

CMOS TECHNOLOGY- Chapter 2 in the Text

CMOS TECHNOLOGY- Chapter 2 in the Text CMOS TECHOLOGY- Chapter 2 in the Text CMOS Technology- Chapter 2 We will describe a modern CMOS process flow. In the simplest CMOS technologies, we need to realize simply MOS and MOS transistors for circuits

More information

FABRICATION OF CMOS INTEGRATED CIRCUITS. Dr. Mohammed M. Farag

FABRICATION OF CMOS INTEGRATED CIRCUITS. Dr. Mohammed M. Farag FABRICATION OF CMOS INTEGRATED CIRCUITS Dr. Mohammed M. Farag Outline Overview of CMOS Fabrication Processes The CMOS Fabrication Process Flow Design Rules EE 432 VLSI Modeling and Design 2 CMOS Fabrication

More information

FPGA Programming Technology

FPGA Programming Technology FPGA Programming Technology Static RAM: This Xilinx SRAM configuration cell is constructed from two cross-coupled inverters and uses a standard CMOS process. The configuration cell drives the gates of

More information

TFT-LCD Technology Introduction

TFT-LCD Technology Introduction TFT-LCD Technology Introduction Thin film transistor liquid crystal display (TFT-LCD) is a flat panel display one of the most important fields, because of its many advantages, is the only display technology

More information

Addressable Test Chip Technology for IC Design and Manufacturing. Dr. David Ouyang CEO, Semitronix Corporation Professor, Zhejiang University 2014/03

Addressable Test Chip Technology for IC Design and Manufacturing. Dr. David Ouyang CEO, Semitronix Corporation Professor, Zhejiang University 2014/03 Addressable Test Chip Technology for IC Design and Manufacturing Dr. David Ouyang CEO, Semitronix Corporation Professor, Zhejiang University 2014/03 IC Design & Manufacturing Trends Both logic and memory

More information

Investigation on seal-ring rules for IC product reliability in m CMOS technology

Investigation on seal-ring rules for IC product reliability in m CMOS technology Microelectronics Reliability 45 (2005) 1311 1316 www.elsevier.com/locate/microrel Investigation on seal-ring rules for IC product reliability in 0.25- m CMOS technology Shih-Hung Chen a * and Ming-Dou

More information

Literacy for Integrated Circuit Reverse Engineering

Literacy for Integrated Circuit Reverse Engineering Literacy for Integrated Circuit Reverse Engineering Alex Radocea 1 Now bringing pain to the adversary at worked security at a large tech company worked security at matasano learned c and unix from swedish

More information

Applications, Processing and Integration Options for High Dielectric Constant Multi-Layer Thin-Film Barium Strontium Titanate (BST) Capacitors

Applications, Processing and Integration Options for High Dielectric Constant Multi-Layer Thin-Film Barium Strontium Titanate (BST) Capacitors Applications, Processing and Integration Options for High Dielectric Constant Multi-Layer Thin-Film Barium Strontium Titanate (BST) Capacitors Agenda Introduction What is BST? Unique Characteristics of

More information

Digital Integrated CircuitDesign

Digital Integrated CircuitDesign Digital Integrated CircuitDesign Lecture 8 Design Rules Adib Abrishamifar EE Department IUST Contents Design Rules CMOS Process Layers Intra-Layer Design Rules Via s and Contacts Select Layer Example Cell

More information

Moore s s Law, 40 years and Counting

Moore s s Law, 40 years and Counting Moore s s Law, 40 years and Counting Future Directions of Silicon and Packaging Bill Holt General Manager Technology and Manufacturing Group Intel Corporation InterPACK 05 2005 Heat Transfer Conference

More information

Methodology on Extracting Compact Layout Rules for Latchup Prevention in Deep-Submicron Bulk CMOS Technology

Methodology on Extracting Compact Layout Rules for Latchup Prevention in Deep-Submicron Bulk CMOS Technology IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 16, NO. 2, MAY 2003 319 Methodology on Extracting Compact Layout Rules for Latchup Prevention in Deep-Submicron Bulk CMOS Technology Ming-Dou Ker,

More information

Spiral 2-8. Cell Layout

Spiral 2-8. Cell Layout 2-8.1 Spiral 2-8 Cell Layout 2-8.2 Learning Outcomes I understand how a digital circuit is composed of layers of materials forming transistors and wires I understand how each layer is expressed as geometric

More information

AN Design guidelines for COG modules with NXP monochrome LCD drivers. Document information

AN Design guidelines for COG modules with NXP monochrome LCD drivers. Document information Design guidelines for COG modules with NXP monochrome LCD drivers Rev. 03 11 June 2009 Application note Document information Info Content Keywords ITO layout, LCD driver Abstract This application note

More information

Detector R&D at the LCFI Collaboration

Detector R&D at the LCFI Collaboration LCFI Overview Detector R&D at the LCFI Collaboration (Bristol U, Oxford U, Lancaster U, Liverpool U, RAL) Konstantin Stefanov on behalf of the LCFI collaboration LCWS2005, Stanford, 18-22 March 2005 Introduction

More information

Physical Implementation

Physical Implementation CS250 VLSI Systems Design Fall 2009 John Wawrzynek, Krste Asanovic, with John Lazzaro Physical Implementation Outline Standard cell back-end place and route tools make layout mostly automatic. However,

More information

CS310 Embedded Computer Systems. Maeng

CS310 Embedded Computer Systems. Maeng 1 INTRODUCTION (PART II) Maeng Three key embedded system technologies 2 Technology A manner of accomplishing a task, especially using technical processes, methods, or knowledge Three key technologies for

More information

Lecture 20: CAMs, ROMs, PLAs

Lecture 20: CAMs, ROMs, PLAs Lecture 2: CAMs, ROMs, PLAs Outline Content-Addressable Memories Read-Only Memories Programmable Logic Arrays 2: CAMs, ROMs, and PLAs CMOS VLSI Design 4th Ed. 2 CAMs Extension of ordinary memory (e.g.

More information